| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Analysis of coatings which inhibit epoxy bleeding in electronic packaging
|
N. X TAN
|
|
1997
|
8 |
2 |
p. 73-77
5 p.
|
artikel
|
| 2 |
Analysis of coatings which inhibit epoxy bleeding in electronic packaging
|
TAN, N. X
|
|
1997
|
8 |
2 |
p. 73-77
|
artikel
|
| 3 |
Effect of the structural and electronic changes induced in poly(3-methylthiophene), PMeT, by the monomer concentration on the characteristics of sprayed CdS(Al)PMeT based photovoltaic junctions
|
C SENE
|
|
1997
|
8 |
2 |
p. 85-89
5 p.
|
artikel
|
| 4 |
Effect of the structural and electronic changes induced in poly(3-methylthiophene), PMeT, by the monomer concentration on the characteristics of sprayed CdS(Al)–PMeT based photovoltaic junctions
|
SENE, C
|
|
1997
|
8 |
2 |
p. 85-89
|
artikel
|
| 5 |
Effects of spinel phase formation in the calcination process on the characteristics of ZnOglass varistors
|
YIH-SHING LEE
|
|
1997
|
8 |
2 |
p. 115-123
9 p.
|
artikel
|
| 6 |
Effects of spinel phase formation in the calcination process on the characteristics of ZnO–glass varistors
|
LEE, YIH-SHING
|
|
1997
|
8 |
2 |
p. 115-123
|
artikel
|
| 7 |
Effects of the integrity of silicon thin films on the electrical characteristics of thin dielectric ONO film
|
DONG-WON KIM
|
|
1997
|
8 |
2 |
p. 91-94
4 p.
|
artikel
|
| 8 |
Effects of the integrity of silicon thin films on the electrical characteristics of thin dielectric ONO film
|
KIM, DONG-WON
|
|
1997
|
8 |
2 |
p. 91-94
|
artikel
|
| 9 |
Electropolishing of silicon using hydrazine
|
K. B SUNDARAM
|
|
1997
|
8 |
2 |
p. 99-101
3 p.
|
artikel
|
| 10 |
Electropolishing of silicon using hydrazine
|
SUNDARAM, K. B
|
|
1997
|
8 |
2 |
p. 99-101
|
artikel
|
| 11 |
Formation and microwave dielectric properties of Sr(Ga0.5Ta0.5)O3-based complex perovskites
|
TAKAHASHI, J
|
|
|
8 |
2 |
p. 79-84
|
artikel
|
| 12 |
Formation and microwave dielectric properties of Sr(Ga0.5Ta0.5)O3-based complex perovskites
|
J TAKAHASHI
|
|
1997
|
8 |
2 |
p. 79-84
6 p.
|
artikel
|
| 13 |
Formation and microwave dielectric properties of Sr(Ga0.5Ta0.5)O3-based complex perovskites
|
TAKAHASHI, J
|
|
1997
|
8 |
2 |
p. 79-84
|
artikel
|
| 14 |
Laser-annealed deep contacts for layered structures
|
M VRNATA
|
|
1997
|
8 |
2 |
p. 95-98
4 p.
|
artikel
|
| 15 |
Laser-annealed deep contacts for layered structures
|
VRŇATA, M.
|
|
1997
|
8 |
2 |
p. 95-98
|
artikel
|
| 16 |
Observation of macro-terraces in cadmium telluride thin films
|
M AGUILAR
|
|
1997
|
8 |
2 |
p. 103-107
5 p.
|
artikel
|
| 17 |
Observation of macro-terraces in cadmium telluride thin films
|
AGUILAR, M.
|
|
1997
|
8 |
2 |
p. 103-107
|
artikel
|
| 18 |
{7 6 6} Oriented V-groove surfaces on Br2CH3OH etched (1 0 0) GaAs wafers
|
S. W WILSON
|
|
1997
|
8 |
2 |
p. 109-113
5 p.
|
artikel
|
| 19 |
{7 6 6} Oriented V-groove surfaces on Br2–CH3OH etched (1 0 0) GaAs wafers
|
WILSON, S. W.
|
|
1997
|
8 |
2 |
p. 109-113
|
artikel
|
| 20 |
Performance of PdGe based ohmic contacts to n-type GaAs
|
D. G IVEY
|
|
1997
|
8 |
2 |
p. 63-68
6 p.
|
artikel
|
| 21 |
Performance of Pd–Ge based ohmic contacts to n-type GaAs
|
IVEY, D. G
|
|
1997
|
8 |
2 |
p. 63-68
|
artikel
|
| 22 |
Synthetic single-crystal, homoepitaxially grown, CVD diamond capacitor
|
R RAMESHAM
|
|
1997
|
8 |
2 |
p. 69-72
4 p.
|
artikel
|
| 23 |
Synthetic single-crystal, homoepitaxially grown, CVD diamond capacitor
|
RAMESHAM, R
|
|
1997
|
8 |
2 |
p. 69-72
|
artikel
|
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