| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Bond pad cratering study by reliability tests
|
C. W. Tan
|
|
2002
|
13 |
5 |
p. 309-314
6 p.
|
artikel
|
| 2 |
Bond pad cratering study by reliability tests
|
Tan, C. W.
|
|
2002
|
13 |
5 |
p. 309-314
|
artikel
|
| 3 |
Effects of deionized water pressure and purified nitrogen gas on the chemical mechanical polishing process
|
Sang-Yong Kim
|
|
2002
|
13 |
5 |
p. 299-302
4 p.
|
artikel
|
| 4 |
Effects of deionized water pressure and purified nitrogen gas on the chemical mechanical polishing process
|
Kim, Sang-Yong
|
|
2002
|
13 |
5 |
p. 299-302
|
artikel
|
| 5 |
Electrical properties of r.f. magnetron sputtered BaxSr1−xTiO3 films on multi-layered bottom electrodes for high-density memory application
|
B. Panda
|
|
2002
|
13 |
5 |
p. 263-268
6 p.
|
artikel
|
| 6 |
Electrical properties of r.f. magnetron sputtered BaxSr1−xTiO3 films on multi-layered bottom electrodes for high-density memory application
|
Panda, B.
|
|
2002
|
13 |
5 |
p. 263-268
|
artikel
|
| 7 |
Estimation of liquidus temperature of Sn-based alloys and its application to the design of Pb-free solder
|
H. Ezaki
|
|
2002
|
13 |
5 |
p. 269-272
4 p.
|
artikel
|
| 8 |
Estimation of liquidus temperature of Sn-based alloys and its application to the design of Pb-free solder
|
Ezaki, H.
|
|
2002
|
13 |
5 |
p. 269-272
|
artikel
|
| 9 |
Evolution of microstructure during annealing of low-dose SIMOX wafers implanted at 65 keV
|
B. Johnson
|
|
2002
|
13 |
5 |
p. 303-308
6 p.
|
artikel
|
| 10 |
Evolution of microstructure during annealing of low-dose SIMOX wafers implanted at 65 keV
|
Johnson, B.
|
|
2002
|
13 |
5 |
p. 303-308
|
artikel
|
| 11 |
Formation of ZnSe1−x Sx quantum dots under VolmerWeber mode
|
C. X. Shan
|
|
2002
|
13 |
5 |
p. 295-298
4 p.
|
artikel
|
| 12 |
Formation of ZnSe1−x Sx quantum dots under Volmer–Weber mode
|
Shan, C. X.
|
|
2002
|
13 |
5 |
p. 295-298
|
artikel
|
| 13 |
Magnetic hysteresis and domain states in Li1 substituted NiZn ferrites
|
S. R. Sawant
|
|
2002
|
13 |
5 |
p. 277-283
7 p.
|
artikel
|
| 14 |
Magnetic hysteresis and domain states in Li1+ substituted Ni–Zn ferrites
|
Sawant, S. R.
|
|
2002
|
13 |
5 |
p. 277-283
|
artikel
|
| 15 |
Preparation and characterization of manganous manganic oxide (Mn3O4)
|
R. Ramachandran
|
|
2002
|
13 |
5 |
p. 257-262
6 p.
|
artikel
|
| 16 |
Preparation and characterization of manganous manganic oxide (Mn3O4)
|
Ramachandran, R.
|
|
2002
|
13 |
5 |
p. 257-262
|
artikel
|
| 17 |
Study of the effect of trap levels on steady-state dark IV characteristics in Safranine-T-based solid-state thin film photoelectrochemical cell
|
Sisir Kumar Dey
|
|
2002
|
13 |
5 |
p. 249-252
4 p.
|
artikel
|
| 18 |
Study of the effect of trap levels on steady-state dark I–V characteristics in Safranine-T-based solid-state thin film photoelectrochemical cell
|
Dey, Sisir Kumar
|
|
2002
|
13 |
5 |
p. 249-252
|
artikel
|
| 19 |
Texture and hillocking in sputter-deposited copper thin films
|
R. Jakkaraju
|
|
2002
|
13 |
5 |
p. 285-294
10 p.
|
artikel
|
| 20 |
Texture and hillocking in sputter-deposited copper thin films
|
Jakkaraju, R.
|
|
2002
|
13 |
5 |
p. 285-294
|
artikel
|
| 21 |
Thermal stability of AuPt/\n−-GaAs Schottky contacts
|
P. Machá
|
|
2002
|
13 |
5 |
p. 273-275
3 p.
|
artikel
|
| 22 |
Thermal stability of AuPt/n−-GaAs Schottky contacts
|
Macháč, P.
|
|
2002
|
13 |
5 |
p. 273-275
|
artikel
|
| 23 |
Varistor behavior of the system SnO2CoOTa2O5Cr2O3
|
G. F. Menegotto
|
|
2002
|
13 |
5 |
p. 253-256
4 p.
|
artikel
|
| 24 |
Varistor behavior of the system SnO2ċCoOċTa2O5ċCr2O3
|
Menegotto, G. F.
|
|
2002
|
13 |
5 |
p. 253-256
|
artikel
|
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