| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Annealing effects on electrical characteristics of 100 MeV 28Si implantation in GaAs
|
Narsale, A. M.
|
|
2000
|
11 |
5 |
p. 439-443
|
artikel
|
| 2 |
Chemical solution method for fabrication of nanocrystalline iron(III) oxide thin films
|
Pejova, Biljana
|
|
2000
|
11 |
5 |
p. 405-409
|
artikel
|
| 3 |
Composition and electronic properties of a-SiGe:H alloys produced from ultrathin layers of a-Si:H/a-Ge:H
|
Abo Ghazala, M.S.
|
|
2000
|
11 |
5 |
p. 429-432
|
artikel
|
| 4 |
Conductive and transparent ZnO:Al thin films obtained by chemical spray
|
Olvera, M. de la L.
|
|
2000
|
11 |
5 |
p. 383-387
|
artikel
|
| 5 |
Dielectric properties of sintered materials prepared from glass-ZrO2-SrTiO3 mixtures
|
Tsuzuku, Koichiro
|
|
2000
|
11 |
5 |
p. 419-424
|
artikel
|
| 6 |
Direct silver bonding – an alternative for substrates in power semiconductor packaging
|
Schu¨ler, C. Chr.
|
|
2000
|
11 |
5 |
p. 389-396
|
artikel
|
| 7 |
Electrical and optical characterization of regrown PHEMT layer structures on etched GaAs surfaces
|
Sathya, B.
|
|
2000
|
11 |
5 |
p. 379-382
|
artikel
|
| 8 |
EPR and magnetic susceptibility studies on V2 O5-P2O5-PbO glasses
|
Ardelean, I.
|
|
2000
|
11 |
5 |
p. 401-404
|
artikel
|
| 9 |
Influence of poling conditions on the piezoelectric properties of PZT ceramics
|
Takahiro, Yamakawa
|
|
2000
|
11 |
5 |
p. 425-428
|
artikel
|
| 10 |
Microstructure and electrical properties of the SnO2 glass composite containing Cu particles precipitated by reducing copper oxides – Effect of particle size of reducing agent
|
Shiomi, Haruhisa
|
|
2000
|
11 |
5 |
p. 445-452
|
artikel
|
| 11 |
Monitoring the effects of storage on the rheological properties of solder paste
|
Nguty, T. A.
|
|
2000
|
11 |
5 |
p. 433-437
|
artikel
|
| 12 |
Porosity development of RuO2 filled glass thick films on aluminum nitride substrates at elevated temperatures
|
Tseng, Wenjea J.
|
|
2000
|
11 |
5 |
p. 411-417
|
artikel
|
| 13 |
Thermal and optical properties of Ge5Bi18Se77 films
|
Rajagopalan, T.
|
|
2000
|
11 |
5 |
p. 397-400
|
artikel
|
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