| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing
|
Copetti, T. S.
|
|
|
40 |
2 |
p. 245-257
|
artikel
|
| 2 |
An Analytical Model for Deposited Charge of Single Event Transient (SET) in FinFET
|
Liu, Baojun
|
|
|
40 |
2 |
p. 159-169
|
artikel
|
| 3 |
A Survey and Recent Advances: Machine Intelligence in Electronic Testing
|
Roy, Soham
|
|
|
40 |
2 |
p. 139-158
|
artikel
|
| 4 |
Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal Transmission
|
Cao, Rongxing
|
|
|
40 |
2 |
p. 185-197
|
artikel
|
| 5 |
Editorial
|
Agrawal, Vishwani D.
|
|
|
40 |
2 |
p. 137-138
|
artikel
|
| 6 |
Instant Test and Repair for TSVs using Differential Signaling
|
Wen, Ching-Yi
|
|
|
40 |
2 |
p. 275-287
|
artikel
|
| 7 |
Investigating and Reducing the Architectural Impact of Transient Faults in Special Function Units for GPUs
|
Rodriguez Condia, Josie E.
|
|
|
40 |
2 |
p. 215-228
|
artikel
|
| 8 |
Radiation Hardened by Design-based Voltage Controlled Oscillator for Low Power Phase Locked Loop Application
|
Ahirwar, Rachana
|
|
|
40 |
2 |
p. 171-184
|
artikel
|
| 9 |
Sahand: A Software Fault-Prediction Method Using Autoencoder Neural Network and K-Means Algorithm
|
Arasteh, Bahman
|
|
|
40 |
2 |
p. 229-243
|
artikel
|
| 10 |
Simulation-based Analysis of RPL Routing Attacks and Their Impact on IoT Network Performance
|
Bokka, Raveendranadh
|
|
|
40 |
2 |
p. 259-273
|
artikel
|
| 11 |
Syntactic and Semantic Analysis of Temporal Assertions to Support the Approximation of RTL Designs
|
Bosio, Alberto
|
|
|
40 |
2 |
p. 199-214
|
artikel
|
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