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11 results found

no	title	author	magazine	year	volume	issue	page(s)	type
1	A Low-cost BIST Design Supporting Offline and Online Tests	Menbari, Ahmad			38	1	p. 107-123	article
2	A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design	Lu, Yingchun			38	1	p. 63-76	article
3	A New Neural Network Based on CNN for EMIS Identification	Xiao, Ying-chun			38	1	p. 77-89	article
4	Design of Power Gated SRAM Cell for Reducing the NBTI Effect and Leakage Power Dissipation During the Hold Operation	Bhattacharjee, Abhishek			38	1	p. 91-105	article
5	Editorial	Agrawal, Vishwani D.			38	1	p. 1-2	article
6	Hardware Obfuscation for IP Protection of DSP Applications	R, Naveenkumar			38	1	p. 9-20	article
7	New Editors – 2022				38	1	p. 3-4	article
8	2021 Reviewers				38	1	p. 5-6	article
9	Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies	Zhao, Yujie			38	1	p. 21-38	article
10	Synthesis of Reversible Circuits with Reduced Nearest-Neighbor Cost Using Kronecker Functional Decision Diagrams	Bu, Dengli			38	1	p. 39-62	article
11	Test Technology Newsletter				38	1	p. 7-8	article

11 results found

Koninklijke Bibliotheek - National Library of the Netherlands