nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A Fast Statistical Soft Error Rate Estimation Method for Nano-scale Combinational Circuits
|
Raji, Mohsen |
|
2016 |
32 |
3 |
p. 291-305 |
artikel |
2 |
A New Capacitance-to-Frequency Converter for On-Chip Capacitance Measurement and Calibration in CMOS Technology
|
Zhu, Dongdi |
|
2016 |
32 |
3 |
p. 393-397 |
artikel |
3 |
An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology
|
Chen, Qingyu |
|
2016 |
32 |
3 |
p. 385-391 |
artikel |
4 |
Automatic Feature Selection of Hardware Layout: A Step toward Robust Hardware Trojan Detection
|
Nasr, Abdurrahman A. |
|
2016 |
32 |
3 |
p. 357-367 |
artikel |
5 |
Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing
|
Ishida, Masahiro |
|
2016 |
32 |
3 |
p. 257-271 |
artikel |
6 |
Editorial
|
Agrawal, Vishwani D. |
|
2016 |
32 |
3 |
p. 241-242 |
artikel |
7 |
High Performance Significance Approximation Error Tolerance Adder for Image Processing Applications
|
Jothin, R. |
|
2016 |
32 |
3 |
p. 377-383 |
artikel |
8 |
Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits
|
Jenihhin, Maksim |
|
2016 |
32 |
3 |
p. 273-289 |
artikel |
9 |
Impact of Fin-Height on SRAM Soft Error Sensitivity and Cell Stability
|
Villacorta, Hector |
|
2016 |
32 |
3 |
p. 307-314 |
artikel |
10 |
NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits’ Life Time
|
Copetti, T. |
|
2016 |
32 |
3 |
p. 315-328 |
artikel |
11 |
Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan Architectures
|
Aleksejev, Igor |
|
2016 |
32 |
3 |
p. 245-255 |
artikel |
12 |
Real-Time Adaptive Test Algorithm Including Test Escape Estimation Method
|
Streitwieser, Christian |
|
2016 |
32 |
3 |
p. 369-375 |
artikel |
13 |
Security Path: An Emerging Design Methodology to Protect the FPGA IPs Against Passive/Active Design Tampering
|
Zamanzadeh, Sharareh |
|
2016 |
32 |
3 |
p. 329-343 |
artikel |
14 |
Side-Channel Information Characterisation Based on Cascade-Forward Back-Propagation Neural Network
|
Saeedi, Ehsan |
|
2016 |
32 |
3 |
p. 345-356 |
artikel |
15 |
Test Technology Newsletter
|
|
|
2016 |
32 |
3 |
p. 243-244 |
artikel |