| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Built-in Single Event Upsets Detector for Sequential Cells
|
Li, Yuanqing
|
|
2015
|
32 |
1 |
p. 11-20
|
artikel
|
| 2 |
A Power Efficient Test Data Compression Method for SoC using Alternating Statistical Run-Length Coding
|
Yuan, Haiying
|
|
2016
|
32 |
1 |
p. 59-68
|
artikel
|
| 3 |
Editorial
|
Agrawal, Vishwani D.
|
|
2016
|
32 |
1 |
p. 1-2
|
artikel
|
| 4 |
Erratum to: Speeding Up Logic Locking via Fault Emulation and Dynamic Multiple Fault Injection
|
Gören, Sezer
|
|
2015
|
32 |
1 |
p. 105-106
|
artikel
|
| 5 |
2015 JETTA Reviewers
|
|
|
2016
|
32 |
1 |
p. 7-8
|
artikel
|
| 6 |
Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits
|
Wang, Haibin
|
|
2015
|
32 |
1 |
p. 97-103
|
artikel
|
| 7 |
New Editors – 2016
|
|
|
2016
|
32 |
1 |
p. 3-5
|
artikel
|
| 8 |
Optimization of a Particles Detection Chain Based on a VCO Structure
|
Coulié-Castellani, K.
|
|
2016
|
32 |
1 |
p. 21-30
|
artikel
|
| 9 |
Practical Analog Circuit Diagnosis Based on Fault Features with Minimum Ambiguities
|
Tang, Xiaofeng
|
|
2016
|
32 |
1 |
p. 83-95
|
artikel
|
| 10 |
Simulation-based Fault Injection with QEMU for Speeding-up Dependability Analysis of Embedded Software
|
Ferraretto, Davide
|
|
2015
|
32 |
1 |
p. 43-57
|
artikel
|
| 11 |
SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE
|
Azaïs, Florence
|
|
2015
|
32 |
1 |
p. 69-82
|
artikel
|
| 12 |
Test Scheduling for Network-on-Chip Using XY-Direction Connected Subgraph Partition and Multiple Test Clocks
|
Hu, Cong
|
|
2016
|
32 |
1 |
p. 31-42
|
artikel
|
| 13 |
Test Technology Newsletter
|
|
|
2016
|
32 |
1 |
p. 9-10
|
artikel
|
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