| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Analog Circuits Fault Detection Using Cross-Entropy Approach
|
Li, Xifeng
|
|
2013
|
29 |
1 |
p. 115-120
|
artikel
|
| 2 |
A New Analog Circuit Fault Diagnosis Method Based on Improved Mahalanobis Distance
|
Han, Han
|
|
2012
|
29 |
1 |
p. 95-102
|
artikel
|
| 3 |
Applying Petri Nets to Modeling of Many-Core Processor Self-Testing when Tests are Performed Randomly
|
Mashkov, Viktor
|
|
2013
|
29 |
1 |
p. 25-34
|
artikel
|
| 4 |
Editorial
|
Agrawal, Vishwani D.
|
|
2013
|
29 |
1 |
p. 1-2
|
artikel
|
| 5 |
Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults
|
Bao, Fang
|
|
2013
|
29 |
1 |
p. 35-48
|
artikel
|
| 6 |
Eliminating the Timing Penalty of Scan
|
Sinanoglu, Ozgur
|
|
2013
|
29 |
1 |
p. 103-114
|
artikel
|
| 7 |
Evaluating Different Strategies for Testing Software Product Lines
|
Colanzi, Thelma Elita
|
|
2013
|
29 |
1 |
p. 9-24
|
artikel
|
| 8 |
2012 JETTA Reviewers
|
|
|
2013
|
29 |
1 |
p. 5-6
|
artikel
|
| 9 |
New Editors, 2013
|
|
|
2013
|
29 |
1 |
p. 3
|
artikel
|
| 10 |
Reconfigurable Concurrent Error Detection Adaptive to Dynamicity of Power Constraints
|
Almukhaizim, Sobeeh
|
|
2013
|
29 |
1 |
p. 73-86
|
artikel
|
| 11 |
SEU Fault-Injection in VHDL-Based Processors: A Case Study
|
Mansour, Wassim
|
|
2013
|
29 |
1 |
p. 87-94
|
artikel
|
| 12 |
Testing of Synchronizers in Asynchronous FIFO
|
Kim, Hyoung-Kook
|
|
2013
|
29 |
1 |
p. 49-72
|
artikel
|
| 13 |
Test Technology Newsletter
|
|
|
2013
|
29 |
1 |
p. 7-8
|
artikel
|
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