| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus
|
Sheng, Xiaoqin
|
|
2012
|
28 |
4 |
p. 393-404
|
artikel
|
| 2 |
A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault Detection
|
Ahmed, Badar-ud-din
|
|
2012
|
28 |
4 |
p. 535-540
|
artikel
|
| 3 |
BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting
|
Sen, Shreyas
|
|
2012
|
28 |
4 |
p. 405-419
|
artikel
|
| 4 |
Cohesive Coverage Management: Simulation Meets Formal Methods
|
Hazra, Aritra
|
|
2012
|
28 |
4 |
p. 449-468
|
artikel
|
| 5 |
Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing
|
Sindia, Suraj
|
|
2012
|
28 |
4 |
p. 541-549
|
artikel
|
| 6 |
Editorial
|
Agrawal, Vishwani D.
|
|
2012
|
28 |
4 |
p. 389-390
|
artikel
|
| 7 |
FAST: An RTL Fault Simulation Framework based on RTL-to-TLM Abstraction
|
Bombieri, Nicola
|
|
2012
|
28 |
4 |
p. 495-510
|
artikel
|
| 8 |
Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints
|
Viilukas, Taavi
|
|
2012
|
28 |
4 |
p. 511-521
|
artikel
|
| 9 |
Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits
|
Freijedo, Judit F.
|
|
2012
|
28 |
4 |
p. 421-434
|
artikel
|
| 10 |
Multiple Soft Fault Diagnosis of Nonlinear Circuits Using the Continuation Method
|
Tadeusiewicz, Michał
|
|
2012
|
28 |
4 |
p. 487-493
|
artikel
|
| 11 |
On the Reuse of TLM Mutation Analysis at RTL
|
Guarnieri, Valerio
|
|
2012
|
28 |
4 |
p. 435-448
|
artikel
|
| 12 |
Test Technology Newsletter
|
|
|
2012
|
28 |
4 |
p. 391-392
|
artikel
|
| 13 |
Time-Constraint-Aware Optimization of Assertions in Embedded Software
|
Izosimov, Viacheslav
|
|
2012
|
28 |
4 |
p. 469-486
|
artikel
|
| 14 |
Yield Improvement for 3D Wafer-to-Wafer Stacked Memories
|
Taouil, Mottaqiallah
|
|
2012
|
28 |
4 |
p. 523-534
|
artikel
|
Tijdschrift beschrijving