nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Analysis of Scheduled Latency Insensitive Systems with Periodic Clock Calculus
|
Xue, Bin |
|
2010 |
26 |
2 |
p. 227-242 |
artikel |
2 |
Defining and Providing Coverage for Assertion-Based Dynamic Verification
|
Tong, Jason G. |
|
2010 |
26 |
2 |
p. 211-225 |
artikel |
3 |
Editorial
|
Agrawal, V. D. |
|
2010 |
26 |
2 |
p. 145 |
artikel |
4 |
Experience with Widening Based Equivalence Checking in Realistic Multimedia Systems
|
Verdoolaege, Sven |
|
2010 |
26 |
2 |
p. 279-292 |
artikel |
5 |
Fault Table Computation on GPUs
|
Gulati, Kanupriya |
|
2010 |
26 |
2 |
p. 195-209 |
artikel |
6 |
Finding Multiple Equivalence-Preserving Transformations in Combinational Circuits through Incremental-SAT
|
Cabodi, Gianpiero |
|
2010 |
26 |
2 |
p. 261-278 |
artikel |
7 |
Guest Editorial
|
Mishra, Prabhat |
|
2010 |
26 |
2 |
p. 149-150 |
artikel |
8 |
Learning from Constraints for Formal Property Checking
|
Moon, In-Ho |
|
2010 |
26 |
2 |
p. 243-259 |
artikel |
9 |
Qualifying Serial Interface Jitter Rapidly and Cost-effectively
|
Fan, Yongquan |
|
2009 |
26 |
2 |
p. 177-193 |
artikel |
10 |
RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences
|
Fang, Hongxia |
|
2009 |
26 |
2 |
p. 151-164 |
artikel |
11 |
Search State Compatibility Based Incremental Learning Framework and Output Deviation Based X-filling for Diagnostic Test Generation
|
Chandrasekar, Maheshwar |
|
2010 |
26 |
2 |
p. 165-176 |
artikel |
12 |
Test Technology Newsletter
|
|
|
2010 |
26 |
2 |
p. 147-148 |
artikel |