| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters
|
Goyal, Shalabh
|
|
2007
|
23 |
1 |
p. 95-106
|
artikel
|
| 2 |
Editorial
|
Agrawal, Vishwani D.
|
|
2007
|
23 |
1 |
p. 5
|
artikel
|
| 3 |
Evaluating Different Solutions to Design Fault Tolerant Systems with SRAM-based FPGAs
|
Sterpone, L.
|
|
2007
|
23 |
1 |
p. 47-54
|
artikel
|
| 4 |
Generation of Primary Input Blocking Pattern for Power Minimization during Scan Testing
|
Tseng, Wang-Dauh
|
|
2007
|
23 |
1 |
p. 75-84
|
artikel
|
| 5 |
Improve the Quality of Per-Test Fault Diagnosis Using Output Information
|
Liu, Chunsheng
|
|
2007
|
23 |
1 |
p. 11-24
|
artikel
|
| 6 |
Isolation of Failing Scan Cells through Convolutional Test Response Compaction
|
Mrugalski, Grzegorz
|
|
2007
|
23 |
1 |
p. 35-45
|
artikel
|
| 7 |
Magnetic In-circuit Testing of Multiple Power and Ground Pins for Open Faults
|
Çilingiroğlu, Uğur
|
|
2007
|
23 |
1 |
p. 25-34
|
artikel
|
| 8 |
Minimal March Tests for Detection of Dynamic Faults in Random Access Memories
|
Harutunyan, G.
|
|
2007
|
23 |
1 |
p. 55-74
|
artikel
|
| 9 |
New Editor
|
|
|
2007
|
23 |
1 |
p. 7
|
artikel
|
| 10 |
RF Testing on a Mixed Signal Tester
|
Brown, Dana
|
|
2007
|
23 |
1 |
p. 85-94
|
artikel
|
| 11 |
Test Technology Newsletter
|
Kim, Bruce C.
|
|
2007
|
23 |
1 |
p. 9-10
|
artikel
|
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