| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications
|
Bhattacharya, Soumendu
|
|
2005
|
21 |
3 |
p. 323-339
|
artikel
|
| 2 |
An On-Chip Spectrum Analyzer for Analog Built-In Testing
|
Méndez-Rivera, Marcia G.
|
|
2005
|
21 |
3 |
p. 205-219
|
artikel
|
| 3 |
Detection and Evaluation of Deterministic Jitter Causes in CP-PLL’s Due to Macro Level Faults and Pre-Detection Using Simple Methods
|
Burbidge, Martin John
|
|
2005
|
21 |
3 |
p. 267-281
|
artikel
|
| 4 |
Editorial
|
Agrawal, Vishwani D.
|
|
2005
|
21 |
3 |
p. 199
|
artikel
|
| 5 |
Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications
|
Azaïs, F.
|
|
2005
|
21 |
3 |
p. 291-298
|
artikel
|
| 6 |
Frequency Specification Testing of Analog Filters Using Wavelet Transform of Dynamic Supply Current
|
Bhunia, Swarup
|
|
2005
|
21 |
3 |
p. 243-255
|
artikel
|
| 7 |
Guest Editorial
|
Rueda, Adoración
|
|
2005
|
21 |
3 |
p. 203
|
artikel
|
| 8 |
Low Cost BIST for Static and Dynamic Testing of ADCs
|
Gloria Flores, Maria Da
|
|
2005
|
21 |
3 |
p. 283-290
|
artikel
|
| 9 |
Multi-VDD Testing for Analog Circuits
|
Gyvez, José Pineda de
|
|
2005
|
21 |
3 |
p. 311-322
|
artikel
|
| 10 |
On-Chip Pseudorandom MEMS Testing
|
Rufer, L.
|
|
2005
|
21 |
3 |
p. 233-241
|
artikel
|
| 11 |
Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs
|
Wegener, Carsten
|
|
2005
|
21 |
3 |
p. 299-310
|
artikel
|
| 12 |
Sine-Wave Signal Characterization Using Square-Wave and ΣΔ-Modulation: Application to Mixed-Signal BIST
|
Vázquez, Diego
|
|
2005
|
21 |
3 |
p. 221-232
|
artikel
|
| 13 |
Testing Biquad Filters under Parametric Shifts Using X-Y Zoning
|
Sanahuja, R.
|
|
2005
|
21 |
3 |
p. 257-265
|
artikel
|
| 14 |
Test Technology Technical Council Newsletter
|
Kim, B.
|
|
2005
|
21 |
3 |
p. 201
|
artikel
|
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