| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A BICS for CMOS OpAmps by Monitoring the Supply Current Peak
|
J. Font
|
|
2003
|
19 |
5 |
p. 597-603
7 p.
|
artikel
|
| 2 |
A BICS for CMOS OpAmps by Monitoring the Supply Current Peak
|
Font, J.
|
|
2003
|
19 |
5 |
p. 597-603
|
artikel
|
| 3 |
Accurate Analysis of Single Event Upsets in a Pipelined Microprocessor
|
M. Rebaudengo
|
|
2003
|
19 |
5 |
p. 577-584
8 p.
|
artikel
|
| 4 |
Accurate Analysis of Single Event Upsets in a Pipelined Microprocessor
|
Rebaudengo, M.
|
|
2003
|
19 |
5 |
p. 577-584
|
artikel
|
| 5 |
An Architecture for Self-Healing Digital Systems
|
P.K. Lala
|
|
2003
|
19 |
5 |
p. 523-535
13 p.
|
artikel
|
| 6 |
An Architecture for Self-Healing Digital Systems
|
Lala, P.K.
|
|
2003
|
19 |
5 |
p. 523-535
|
artikel
|
| 7 |
A Statistical Sampler for a New On-Line Analog Test Method
|
Marcelo Negreiros
|
|
2003
|
19 |
5 |
p. 585-595
11 p.
|
artikel
|
| 8 |
A Statistical Sampler for a New On-Line Analog Test Method
|
Negreiros, Marcelo
|
|
2003
|
19 |
5 |
p. 585-595
|
artikel
|
| 9 |
BIST-Based Delay-Fault Testing in FPGAs
|
Miron Abramovici
|
|
2003
|
19 |
5 |
p. 549-558
10 p.
|
artikel
|
| 10 |
BIST-Based Delay-Fault Testing in FPGAs
|
Abramovici, Miron
|
|
2003
|
19 |
5 |
p. 549-558
|
artikel
|
| 11 |
Editorial
|
V.D. Agrawal
|
|
2003
|
19 |
5 |
p. 495-495
1 p.
|
artikel
|
| 12 |
Editorial
|
Agrawal, V.D.
|
|
2003
|
19 |
5 |
p. 495
|
artikel
|
| 13 |
Error Correcting Strategy for High Speed and High Density Reliable Flash Memories
|
D. Rossi
|
|
2003
|
19 |
5 |
p. 511-521
11 p.
|
artikel
|
| 14 |
Error Correcting Strategy for High Speed and High Density Reliable Flash Memories
|
Rossi, D.
|
|
2003
|
19 |
5 |
p. 511-521
|
artikel
|
| 15 |
Guest Editorial
|
Cecilia Metra
|
|
2003
|
19 |
5 |
p. 499-499
1 p.
|
artikel
|
| 16 |
Guest Editorial
|
Metra, Cecilia
|
|
2003
|
19 |
5 |
p. 499
|
artikel
|
| 17 |
Multi-Level Fault Injections in VHDL Descriptions Alternative Approaches and Experiments
|
R. Leveugle
|
|
2003
|
19 |
5 |
p. 559-575
17 p.
|
artikel
|
| 18 |
Multi-Level Fault Injections in VHDL Descriptions: Alternative Approaches and Experiments
|
Leveugle, R.
|
|
2003
|
19 |
5 |
p. 559-575
|
artikel
|
| 19 |
On-Line Monitor Design of Finite-State Machines
|
Feng Gao
|
|
2003
|
19 |
5 |
p. 537-548
12 p.
|
artikel
|
| 20 |
On-Line Monitor Design of Finite-State Machines
|
Gao, Feng
|
|
2003
|
19 |
5 |
p. 537-548
|
artikel
|
| 21 |
On-Line Techniques for Error Detection and Correction in Processor Registers with Cross-Parity Check
|
M. Pflanz
|
|
2003
|
19 |
5 |
p. 501-510
10 p.
|
artikel
|
| 22 |
On-Line Techniques for Error Detection and Correction in Processor Registers with Cross-Parity Check
|
Pflanz, M.
|
|
2003
|
19 |
5 |
p. 501-510
|
artikel
|
| 23 |
Test Technology Technical Council Newsletter
|
André Ivanov
|
|
2003
|
19 |
5 |
p. 497-498
2 p.
|
artikel
|
| 24 |
Test Technology Technical Council Newsletter
|
Ivanov, André
|
|
2003
|
19 |
5 |
p. 497-498
|
artikel
|
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