| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Hierarchical Test Generation Approach Using Program Slicing Techniques on Hardware Description Languages
|
Vivekananda M. Vedula
|
|
2003
|
19 |
2 |
p. 149-160
12 p.
|
artikel
|
| 2 |
A Hierarchical Test Generation Approach Using Program Slicing Techniques on Hardware Description Languages
|
Vedula, Vivekananda M.
|
|
2003
|
19 |
2 |
p. 149-160
|
artikel
|
| 3 |
A Symbolic Inject-and-Evaluate Paradigm for Byzantine Fault Diagnosis
|
Shi-Yu Huang
|
|
2003
|
19 |
2 |
p. 161-172
12 p.
|
artikel
|
| 4 |
A Symbolic Inject-and-Evaluate Paradigm for Byzantine Fault Diagnosis
|
Huang, Shi-Yu
|
|
2003
|
19 |
2 |
p. 161-172
|
artikel
|
| 5 |
Dynamic Faults in Random-Access-Memories Concept, Fault Models and Tests
|
Said Hamdioui
|
|
2003
|
19 |
2 |
p. 195-205
11 p.
|
artikel
|
| 6 |
Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests
|
Hamdioui, Said
|
|
2003
|
19 |
2 |
p. 195-205
|
artikel
|
| 7 |
Editorial
|
Vishwani D. Agrawal
|
|
2003
|
19 |
2 |
p. 95-95
1 p.
|
artikel
|
| 8 |
Editorial
|
Agrawal, Vishwani D.
|
|
2003
|
19 |
2 |
p. 95
|
artikel
|
| 9 |
Guest Editorial
|
André Ivanov
|
|
2003
|
19 |
2 |
p. 101-102
2 p.
|
artikel
|
| 10 |
Guest Editorial
|
Ivanov, André
|
|
2003
|
19 |
2 |
p. 101-102
|
artikel
|
| 11 |
Instruction-Based Self-Testing of Processor Cores
|
Nektarios Kranitis
|
|
2003
|
19 |
2 |
p. 103-112
10 p.
|
artikel
|
| 12 |
Instruction-Based Self-Testing of Processor Cores
|
Kranitis, Nektarios
|
|
2003
|
19 |
2 |
p. 103-112
|
artikel
|
| 13 |
LI-BIST A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects
|
Krishna Sekar
|
|
2003
|
19 |
2 |
p. 113-123
11 p.
|
artikel
|
| 14 |
LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects
|
Sekar, Krishna
|
|
2003
|
19 |
2 |
p. 113-123
|
artikel
|
| 15 |
Modern Test Techniques Tradeoffs, Synergies, and Scalable Benefits
|
Erik H. Volkerink
|
|
2003
|
19 |
2 |
p. 125-135
11 p.
|
artikel
|
| 16 |
Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits
|
Volkerink, Erik H.
|
|
2003
|
19 |
2 |
p. 125-135
|
artikel
|
| 17 |
New Editorial Board Members
|
|
|
2003
|
19 |
2 |
p. 97-98
2 p.
|
artikel
|
| 18 |
New Editorial Board Members
|
|
|
2003
|
19 |
2 |
p. 97-98
|
artikel
|
| 19 |
Performance Comparison of VLV, ULV, and ECR Tests
|
Wanli Jiang
|
|
2003
|
19 |
2 |
p. 137-147
11 p.
|
artikel
|
| 20 |
Performance Comparison of VLV, ULV, and ECR Tests
|
Jiang, Wanli
|
|
2003
|
19 |
2 |
p. 137-147
|
artikel
|
| 21 |
Statistical Tolerance Analysis for Assured Analog Test Coverage
|
Sule Ozev
|
|
2003
|
19 |
2 |
p. 173-182
10 p.
|
artikel
|
| 22 |
Statistical Tolerance Analysis for Assured Analog Test Coverage
|
Ozev, Sule
|
|
2003
|
19 |
2 |
p. 173-182
|
artikel
|
| 23 |
Testing and Diagnosis Methodologies for Embedded Content Addressable Memories
|
Jin-Fu Li
|
|
2003
|
19 |
2 |
p. 207-215
9 p.
|
artikel
|
| 24 |
Testing and Diagnosis Methodologies for Embedded Content Addressable Memories
|
Li, Jin-Fu
|
|
2003
|
19 |
2 |
p. 207-215
|
artikel
|
| 25 |
Test Technology Technical Council Newsletter
|
André Ivanov
|
|
2003
|
19 |
2 |
p. 99-100
2 p.
|
artikel
|
| 26 |
Test Technology Technical Council Newsletter
|
Ivanov, André
|
|
2003
|
19 |
2 |
p. 99-100
|
artikel
|
| 27 |
Timing Jitter Measurement of Intrinsic Random Jitter and Sinusoidal Jitter Using Frequency Division
|
Takahiro J. Yamaguchi
|
|
2003
|
19 |
2 |
p. 183-193
11 p.
|
artikel
|
| 28 |
Timing Jitter Measurement of Intrinsic Random Jitter and Sinusoidal Jitter Using Frequency Division
|
Yamaguchi, Takahiro J.
|
|
2003
|
19 |
2 |
p. 183-193
|
artikel
|
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