| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
An Integrated Approach to Testing Embedded Cores and Interconnects Using Test Access Mechanism (TAM) Switch
|
Basu, Subhayu
|
|
2002
|
18 |
4-5 |
p. 475-485
|
artikel
|
| 2 |
An Integrated Framework for the Design and Optimization of SOC Test Solutions
|
Larsson, Erik
|
|
2002
|
18 |
4-5 |
p. 385-400
|
artikel
|
| 3 |
A Novel Reconfigurable Wrapper for Testing of Embedded Core-Based SOCs and its Associated Scheduling Algorithm
|
Koranne, Sandeep
|
|
2002
|
18 |
4-5 |
p. 415-434
|
artikel
|
| 4 |
CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing
|
Benabdenbi, Mounir
|
|
2002
|
18 |
4-5 |
p. 455-473
|
artikel
|
| 5 |
Design for Consecutive Testability of System-on-a-Chip with Built-In Self Testable Cores
|
Yoneda, Tomokazu
|
|
2002
|
18 |
4-5 |
p. 487-501
|
artikel
|
| 6 |
Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor
|
Jas, Abhijit
|
|
2002
|
18 |
4-5 |
p. 503-514
|
artikel
|
| 7 |
Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test
|
Li, Jin-Fu
|
|
2002
|
18 |
4-5 |
p. 515-527
|
artikel
|
| 8 |
Editorial
|
Agrawal, Vishwani D.
|
|
2002
|
18 |
4-5 |
p. 359
|
artikel
|
| 9 |
Guest Editorial
|
Chakrabarty, Krishnendu
|
|
2002
|
18 |
4-5 |
p. 363
|
artikel
|
| 10 |
On-Chip Clock Faults' Detector
|
Metra, C.
|
|
2002
|
18 |
4-5 |
p. 555-564
|
artikel
|
| 11 |
On Concurrent Test of Core-Based SOC Design
|
Huang, Yu
|
|
2002
|
18 |
4-5 |
p. 401-414
|
artikel
|
| 12 |
On IEEE P1500's Standard for Embedded Core Test
|
Marinissen, Erik Jan
|
|
2002
|
18 |
4-5 |
p. 365-383
|
artikel
|
| 13 |
Signal Integrity: Fault Modeling and Testing in High-Speed SoCs
|
Nourani, Mehrdad
|
|
2002
|
18 |
4-5 |
p. 539-554
|
artikel
|
| 14 |
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
|
Chen, Li
|
|
2002
|
18 |
4-5 |
p. 529-538
|
artikel
|
| 15 |
Test Technology Technical Council Newsletter
|
Ivanov, A.
|
|
2002
|
18 |
4-5 |
p. 361-362
|
artikel
|
| 16 |
The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs
|
Marinissen, Erik Jan
|
|
2002
|
18 |
4-5 |
p. 435-454
|
artikel
|
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