| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Analysis of Application of the IDDQ Technique to the Deep Sub-Micron VLSI Testing
|
Chih-Wen Lu
|
|
2002
|
18 |
1 |
p. 89-97
9 p.
|
artikel
|
| 2 |
Analysis of Application of the IDDQ Technique to the Deep Sub-Micron VLSI Testing
|
Lu, Chih-Wen
|
|
2002
|
18 |
1 |
p. 89-97
|
artikel
|
| 3 |
An Efficient Deterministic Test Pattern Generator for Scan-Based BIST Environment
|
Wei-Lun Wang
|
|
2002
|
18 |
1 |
p. 43-53
11 p.
|
artikel
|
| 4 |
An Efficient Deterministic Test Pattern Generator for Scan-Based BIST Environment
|
Wang, Wei-Lun
|
|
2002
|
18 |
1 |
p. 43-53
|
artikel
|
| 5 |
Editorial
|
Vishwani D. Agrawal
|
|
2002
|
18 |
1 |
p. 5-5
1 p.
|
artikel
|
| 6 |
Editorial
|
Agrawal, Vishwani D.
|
|
2002
|
18 |
1 |
p. 5
|
artikel
|
| 7 |
Fast Hierarchical Test Path Construction for Circuits with DFT-Free Controller-Datapath Interface
|
Yiorgos Makris
|
|
2002
|
18 |
1 |
p. 29-42
14 p.
|
artikel
|
| 8 |
Fast Hierarchical Test Path Construction for Circuits with DFT-Free Controller-Datapath Interface
|
Makris, Yiorgos
|
|
2002
|
18 |
1 |
p. 29-42
|
artikel
|
| 9 |
Foreword
|
Kozo Kinoshita
|
|
2002
|
18 |
1 |
p. 13-13
1 p.
|
artikel
|
| 10 |
Foreword
|
Kinoshita, Kozo
|
|
2002
|
18 |
1 |
p. 13
|
artikel
|
| 11 |
Guest Editorial
|
Kuen-Jong Lee
|
|
2002
|
18 |
1 |
p. 15-16
2 p.
|
artikel
|
| 12 |
Guest Editorial
|
Lee, Kuen-Jong
|
|
2002
|
18 |
1 |
p. 15-16
|
artikel
|
| 13 |
Sequential Circuits with Combinational Test Generation Complexity under Single-Fault Assumption
|
Michiko Inoue
|
|
2002
|
18 |
1 |
p. 55-62
8 p.
|
artikel
|
| 14 |
Sequential Circuits with Combinational Test Generation Complexity under Single-Fault Assumption
|
Inoue, Michiko
|
|
2002
|
18 |
1 |
p. 55-62
|
artikel
|
| 15 |
State and Fault Information for Compaction-Based Test Generation
|
Ashish Giani
|
|
2002
|
18 |
1 |
p. 63-72
10 p.
|
artikel
|
| 16 |
State and Fault Information for Compaction-Based Test Generation
|
Giani, Ashish
|
|
2002
|
18 |
1 |
p. 63-72
|
artikel
|
| 17 |
TA-PSVTiming Analysis for Partially Specified Vectors
|
Liang-Chi Chen
|
|
2002
|
18 |
1 |
p. 73-88
16 p.
|
artikel
|
| 18 |
TA-PSV—Timing Analysis for Partially Specified Vectors
|
Chen, Liang-Chi
|
|
2002
|
18 |
1 |
p. 73-88
|
artikel
|
| 19 |
Test Generation for Crosstalk-Induced Faults Framework and Computational Results
|
Wei-Yu Chen
|
|
2002
|
18 |
1 |
p. 17-28
12 p.
|
artikel
|
| 20 |
Test Generation for Crosstalk-Induced Faults: Framework and Computational Results
|
Chen, Wei-Yu
|
|
2002
|
18 |
1 |
p. 17-28
|
artikel
|
| 21 |
Test Technology Technical Council Newsletter
|
|
|
2002
|
18 |
1 |
p. 7-8
2 p.
|
artikel
|
| 22 |
Test Technology Technical Council Newsletter
|
|
|
2002
|
18 |
1 |
p. 7-8
|
artikel
|
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