| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Adaptive Fault Detection and Diagnosis of RAM Interconnects
|
Zhao, Jun
|
|
1999
|
15 |
1-2 |
p. 157-171
|
artikel
|
| 2 |
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing
|
Sogomonyan, E.S.
|
|
1999
|
15 |
1-2 |
p. 87-96
|
artikel
|
| 3 |
Decreasing the Sensitivity of ADC Test Parameters by Means of Wobbling
|
De Vries, R.
|
|
1999
|
15 |
1-2 |
p. 23-29
|
artikel
|
| 4 |
Defect-Oriented Sampling of Non-Equally Probable Faults in VLSI Systems
|
Gonçalves, F.M.
|
|
1999
|
15 |
1-2 |
p. 41-52
|
artikel
|
| 5 |
Deterministic Built-in Pattern Generation for Sequential Circuits
|
Iyengar, Vikram
|
|
1999
|
15 |
1-2 |
p. 97-114
|
artikel
|
| 6 |
Editorial
|
Agrawal, Vishwani D.
|
|
1999
|
15 |
1-2 |
p. 5
|
artikel
|
| 7 |
Effect of Noise on Analog Circuit Testing
|
Iyer, Madhu K.
|
|
1999
|
15 |
1-2 |
p. 11-22
|
artikel
|
| 8 |
Efficient Path Selection for Delay Testing Based on Path Clustering
|
Tani, Seiichiro
|
|
1999
|
15 |
1-2 |
p. 75-85
|
artikel
|
| 9 |
Experience in Validation of PowerPCTM Microprocessor Embedded Arrays
|
Wang, Li-C.
|
|
1999
|
15 |
1-2 |
p. 191-205
|
artikel
|
| 10 |
Guest Editorial
|
Nicolaidis, Michael
|
|
1999
|
15 |
1-2 |
p. 9
|
artikel
|
| 11 |
IDDQ Testing of Opens in CMOS SRAMs
|
Champac, Victor H.
|
|
1999
|
15 |
1-2 |
p. 53-62
|
artikel
|
| 12 |
Mixed Signal DFT at GHz Frequencies
|
Mason, R.
|
|
1999
|
15 |
1-2 |
p. 31-39
|
artikel
|
| 13 |
New Techniques for Deterministic Test Pattern Generation
|
Hamzaoglu, Ilker
|
|
1999
|
15 |
1-2 |
p. 63-73
|
artikel
|
| 14 |
On Design Validation Using Verification Technology
|
Moundanos, Dinos
|
|
1999
|
15 |
1-2 |
p. 173-189
|
artikel
|
| 15 |
Self-Timed Boundary-Scan Cells for Multi-Chip Module Test
|
García, T.A.
|
|
1999
|
15 |
1-2 |
p. 115-127
|
artikel
|
| 16 |
Structural Fault Testing of Embedded Cores Using Pipelining
|
Nourani, M.
|
|
1999
|
15 |
1-2 |
p. 129-144
|
artikel
|
| 17 |
Synthesis of Circuits with Low-Cost Concurrent Error Detection Based on Bose-Lin Codes
|
Das, Debaleena
|
|
1999
|
15 |
1-2 |
p. 145-155
|
artikel
|
| 18 |
Test Technology Technical Council Newsletter
|
|
|
1999
|
15 |
1-2 |
p. 7-8
|
artikel
|
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