| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Low-Loss Built-In Current Sensor
|
Miura, Yukiya
|
|
1999
|
14 |
1-2 |
p. 39-48
|
artikel
|
| 2 |
A Scan-BIST Structure to Test Delay Faults in Sequential Circuits
|
Girard, P.
|
|
1999
|
14 |
1-2 |
p. 95-102
|
artikel
|
| 3 |
BISTing Datapaths under Heterogeneous Test Schemes
|
Berthelot, D.
|
|
1999
|
14 |
1-2 |
p. 115-123
|
artikel
|
| 4 |
Characterization of Floating Gate Defects in Analog Cells
|
Brosa, Anna M.
|
|
1999
|
14 |
1-2 |
p. 23-31
|
artikel
|
| 5 |
Detection of Defects Using Fault Model Oriented Test Sequences
|
Renovell, M.
|
|
1999
|
14 |
1-2 |
p. 13-22
|
artikel
|
| 6 |
Deterministic BIST with Multiple Scan Chains
|
Kiefer, Gundolf
|
|
1999
|
14 |
1-2 |
p. 85-93
|
artikel
|
| 7 |
Differential Thermal Testing: An Approach to its Feasibility
|
Altet, J.
|
|
1999
|
14 |
1-2 |
p. 57-66
|
artikel
|
| 8 |
Editorial
|
Agrawal, Vishwani D.
|
|
1999
|
14 |
1-2 |
p. 7
|
artikel
|
| 9 |
Exploiting Behavioral Information in Gate-Level ATPG
|
Chiusano, Silvia
|
|
1999
|
14 |
1-2 |
p. 141-148
|
artikel
|
| 10 |
Fault-Tolerant Memory Architecture Against Radiation-Dependent Errors: A Mixed Error Control Approach
|
Mocanu, Octavian-Dumitru
|
|
1999
|
14 |
1-2 |
p. 169-180
|
artikel
|
| 11 |
From Design Validation to Hardware Testing: A Unified Approach
|
Al-Hayek, Ghassan
|
|
1999
|
14 |
1-2 |
p. 133-140
|
artikel
|
| 12 |
Guest Editorial
|
Landrault, Christian
|
|
1999
|
14 |
1-2 |
p. 11
|
artikel
|
| 13 |
ICCQ: A Test Method for Analogue VLSI Using Local Current Sensors
|
Van Lammeren, Joop P.M.
|
|
1999
|
14 |
1-2 |
p. 33-38
|
artikel
|
| 14 |
Incremental Testability Analysis for Partial Scan Selection and Design Transformations
|
Yang, Tianruo
|
|
1999
|
14 |
1-2 |
p. 103-113
|
artikel
|
| 15 |
Integrated Design and Test of Mixed-Signal Circuits
|
Engin, Nur
|
|
1999
|
14 |
1-2 |
p. 75-83
|
artikel
|
| 16 |
Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach
|
Feige, Chris
|
|
1999
|
14 |
1-2 |
p. 125-131
|
artikel
|
| 17 |
Metrics and Criteria for Quality Assessment of Testable Hw/Sw Systems Architectures
|
Dias, Octávio P.
|
|
1999
|
14 |
1-2 |
p. 149-158
|
artikel
|
| 18 |
Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters
|
Rosing, Richard
|
|
1999
|
14 |
1-2 |
p. 67-74
|
artikel
|
| 19 |
Quality Determination for Gate Delay Fault Tests Considering Three-State Elements
|
Pöhl, Frank
|
|
1999
|
14 |
1-2 |
p. 49-55
|
artikel
|
| 20 |
SRAM-Based FPGAs: Testing the Embedded RAM Modules
|
Renovell, M.
|
|
1999
|
14 |
1-2 |
p. 159-167
|
artikel
|
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