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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
6 results found
| no | title | author | magazine | year | volume | issue | page(s) | type |
| 1 | Finely divided methylsilsesquioxane particles with SiO4/2 fragments in structure |
Averichkin, Pavel A. |
2016 |
2 | 1 |
p. 18-22 5 p. |
article |
|
| 2 | High resolution X-ray diffraction study of proton irradiated silicon crystals |
Smirnov, Igor S. |
2016 |
2 | 1 |
p. 29-32 4 p. |
article |
|
| 3 | Nitride HEMTs vs arsenides: The ultimate battle? |
Fedorov, Yuri V. |
2016 |
2 | 1 |
p. 1-6 6 p. |
article |
|
| 4 | Oxygen and erbium distribution in diffusion doped silicon |
Drozdov, Mikhail N. |
2016 |
2 | 1 |
p. 7-12 6 p. |
article |
|
| 5 | The simulation of carbon material structure based on polyacrylonitrile obtained under IR heating |
Kozhitov, Lev V. |
2016 |
2 | 1 |
p. 13-17 5 p. |
article |
|
| 6 | X-ray topographic study of defects in Si-based multilayer epitaxial power devices |
Shul'pina, Iren L. |
2016 |
2 | 1 |
p. 23-28 6 p. |
article |
6 results found