nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Amorphization of niobium layers by phosphorus ion implantation
|
Linker, G. |
|
1983 |
201-210 |
P2 |
p. 969-974 6 p. |
artikel |
2 |
Annealing of In implanted germanium by pulsed electron beam
|
Laugier, A. |
|
1983 |
201-210 |
P2 |
p. 701-705 5 p. |
artikel |
3 |
Anodic polarization studies of some ion-implanted metal surfaces
|
Qing-Ming, Chen |
|
1983 |
201-210 |
P2 |
p. 867-871 5 p. |
artikel |
4 |
A study of Ar implantation induced defects in SiO2
|
Devine, R.A.B. |
|
1983 |
201-210 |
P2 |
p. 1201-1206 6 p. |
artikel |
5 |
A study of shallow and deep damage in Cu after implantation of 100 keV Cu and Ag ions
|
Lindgreen, R.J.Th. |
|
1983 |
201-210 |
P2 |
p. 963-967 5 p. |
artikel |
6 |
A study of the wear behaviour of ion implanted pure iron
|
Goode, P.D. |
|
1983 |
201-210 |
P2 |
p. 925-931 7 p. |
artikel |
7 |
Author index
|
|
|
1983 |
201-210 |
P2 |
p. 1207-1218 12 p. |
artikel |
8 |
Behavior of recoiled oxygen in through-oxide arsenic-implanted silicon
|
Izumi, T. |
|
1983 |
201-210 |
P2 |
p. 695-700 6 p. |
artikel |
9 |
Blistering observed in Mylar due to H+-ion bombardment
|
Shrinet, V. |
|
1983 |
201-210 |
P2 |
p. 1193-1199 7 p. |
artikel |
10 |
CEMS as applied to implantation studies in FeAl 40 at.%
|
Eymery, J.P. |
|
1983 |
201-210 |
P2 |
p. 919-924 6 p. |
artikel |
11 |
Characterization of calcium implanted zirconia thin films
|
Schnell, J.P. |
|
1983 |
201-210 |
P2 |
p. 1187-1191 5 p. |
artikel |
12 |
Characterization of ion implanted silicon by ellipsometry and channeling
|
Lohner, T. |
|
1983 |
201-210 |
P2 |
p. 615-620 6 p. |
artikel |
13 |
Composition and hardness profiles in ion implanted metals
|
Pethica, J.B. |
|
1983 |
201-210 |
P2 |
p. 995-1000 6 p. |
artikel |
14 |
Composition and thermal evolution of nitrogen implanted steels: a systematic study
|
dos Santos, C.A. |
|
1983 |
201-210 |
P2 |
p. 907-912 6 p. |
artikel |
15 |
Conversion electron Mössbauer study of LiF implanted with 57Fe ions
|
Kowalski, J. |
|
1983 |
201-210 |
P2 |
p. 1145-1152 8 p. |
artikel |
16 |
Decomposition kinetics of supersaturated solid solutions in ion implanted silicon
|
Campisano, S.U. |
|
1983 |
201-210 |
P2 |
p. 645-650 6 p. |
artikel |
17 |
Defect complexes in ion-irradiated aluminum
|
Swanson, M.L. |
|
1983 |
201-210 |
P2 |
p. 1029-1034 6 p. |
artikel |
18 |
Depth profiles of Fe and Cr in InP after annealing
|
Gauneau, M. |
|
1983 |
201-210 |
P2 |
p. 671-675 5 p. |
artikel |
19 |
Depth profiling and diffusion of 22Ne implanted in tantalum by (p, γ) resonance broadening
|
Da Silva, M.F. |
|
1983 |
201-210 |
P2 |
p. 889-893 5 p. |
artikel |
20 |
Determination of implanted electrical profiles by a microwave contactless method: Application to selenium implantation in semi-insulating InP
|
Bellec, M. |
|
1983 |
201-210 |
P2 |
p. 629-635 7 p. |
artikel |
21 |
Diffusion of implanted He in metals observed by PAC
|
Deicher, M. |
|
1983 |
201-210 |
P2 |
p. 817-822 6 p. |
artikel |
22 |
Doping of III–V compound semiconductors by ion implantation
|
Stephens, K.G. |
|
1983 |
201-210 |
P2 |
p. 589-614 26 p. |
artikel |
23 |
Effects of ion implantation on the reaction between water and glass
|
Lanford, W.A. |
|
1983 |
201-210 |
P2 |
p. 1099-1103 5 p. |
artikel |
24 |
Effects related to recoil implantation experiments
|
Maillot, Brigitte |
|
1983 |
201-210 |
P2 |
p. 707-710 4 p. |
artikel |
25 |
Electrical conductivity of nitrogen and argon implanted diamond
|
Iwaki, M. |
|
1983 |
201-210 |
P2 |
p. 1129-1133 5 p. |
artikel |
26 |
Electrochemical and A.E.S. studies of FeCr surface alloys formed on AISI 52100 steel by ion beam mixing
|
Chan, W.K. |
|
1983 |
201-210 |
P2 |
p. 857-865 9 p. |
artikel |
27 |
Endommagement produit dans des films de fer α irradies a 77 K par different ions
|
Jaouen, C. |
|
1983 |
201-210 |
P2 |
p. 947-952 6 p. |
artikel |
28 |
Epitaxial recrystallisation of gallium implanted (100) silicon
|
Elliman, R. |
|
1983 |
201-210 |
P2 |
p. 663-669 7 p. |
artikel |
29 |
Etude par microscopie electronique a balayage de l'endommagement par fatigue du cuivre apres implantation de divers elements (de He à Xe)
|
Mendez, J. |
|
1983 |
201-210 |
P2 |
p. 989-994 6 p. |
artikel |
30 |
Evidence for implantation-induced impurity diffusion in metals
|
Thomé, L. |
|
1983 |
201-210 |
P2 |
p. 1035-1039 5 p. |
artikel |
31 |
Exfoliation on stainless steel and inconel produced by 0.8–4 MeV helium ion bombardment
|
Pászti, F. |
|
1983 |
201-210 |
P2 |
p. 1001-1009 9 p. |
artikel |
32 |
Friction and wear of ion implanted aluminium
|
Madakson, Peter B. |
|
1983 |
201-210 |
P2 |
p. 983-988 6 p. |
artikel |
33 |
Helium decoration of impurities in metals
|
de Waard, H. |
|
1983 |
201-210 |
P2 |
p. 899-905 7 p. |
artikel |
34 |
High-temperature oxidation of ion implanted tantalum
|
Kaufmann, E.N. |
|
1983 |
201-210 |
P2 |
p. 953-961 9 p. |
artikel |
35 |
Hydrogen profiles in ion implanted garnets
|
Magnin, Joël |
|
1983 |
201-210 |
P2 |
p. 1153-1157 5 p. |
artikel |
36 |
Implantation of Mn In PbTe and synthesis of Pb1−xMnxTe
|
Palmetshofer, L. |
|
1983 |
201-210 |
P2 |
p. 725-729 5 p. |
artikel |
37 |
Implantation phases in solids
|
Pavlov, P.V. |
|
1983 |
201-210 |
P2 |
p. 791-798 8 p. |
artikel |
38 |
Influence de l'implantation d'aluminium sur la plasticite du cuivre monocristallin
|
Tranchant, F. |
|
1983 |
201-210 |
P2 |
p. 895-898 4 p. |
artikel |
39 |
Ion-beam analysis of implanted simulated nuclear waste glasses
|
Arnold, G.W. |
|
1983 |
201-210 |
P2 |
p. 1071-1077 7 p. |
artikel |
40 |
Ion-beam induced annealing of radiation damage in silicon on sapphire
|
Svensson, B. |
|
1983 |
201-210 |
P2 |
p. 755-760 6 p. |
artikel |
41 |
Ionic decomposition of platinum chlorides
|
Eskildsen, Svend Stensig |
|
1983 |
201-210 |
P2 |
p. 913-917 5 p. |
artikel |
42 |
Ion implanation effects in bubble garnet materials
|
Perez, A. |
|
1983 |
201-210 |
P2 |
p. 1179-1185 7 p. |
artikel |
43 |
Ion implantation damage in InP
|
Zhang, Tong He |
|
1983 |
201-210 |
P2 |
p. 761-766 6 p. |
artikel |
44 |
Ion implantation in Hg1−xCdxTe
|
Destefanis, G.L. |
|
1983 |
201-210 |
P2 |
p. 567-580 14 p. |
artikel |
45 |
Ion implantation into LiNbO3
|
Götz, G. |
|
1983 |
201-210 |
P2 |
p. 1079-1088 10 p. |
artikel |
46 |
Ion implantation into metals to prevent high temperature oxidation
|
Pons, M. |
|
1983 |
201-210 |
P2 |
p. 1011-1017 7 p. |
artikel |
47 |
Ion implantation of silicon in gallium arsenide: Damage and annealing characterizations
|
Pribat, D. |
|
1983 |
201-210 |
P2 |
p. 737-742 6 p. |
artikel |
48 |
Ion implantation through aluminum thin film deposited on iron
|
Iwaki, M. |
|
1983 |
201-210 |
P2 |
p. 941-945 5 p. |
artikel |
49 |
Ion implanted catalysts for fuel cell reactions
|
Wolf, Gerhard K. |
|
1983 |
201-210 |
P2 |
p. 835-840 6 p. |
artikel |
50 |
Ion-implanted polysilicon diffusion sources
|
Michel, A.E. |
|
1983 |
201-210 |
P2 |
p. 719-724 6 p. |
artikel |
51 |
Ion range studies of cerium implanted CaF2
|
Arafah, D.E. |
|
1983 |
201-210 |
P2 |
p. 1105-1110 6 p. |
artikel |
52 |
Lattice location of boron implanted into various metal crystals
|
Beck, K. |
|
1983 |
201-210 |
P2 |
p. 849-855 7 p. |
artikel |
53 |
Limiting compositions and phase transformations resulting from implanting aluminum into nickel
|
Cordts, Bernhardt |
|
1983 |
201-210 |
P2 |
p. 873-879 7 p. |
artikel |
54 |
Low temperature annealing behaviour of two species (argon and antimony) implanted silicon
|
Spinelli, P. |
|
1983 |
201-210 |
P2 |
p. 751-753 3 p. |
artikel |
55 |
Low temperature annealing of B and P ions incorporated into deposited- and self-implanted amorphous Si
|
Ishiwara, Hiroshi |
|
1983 |
201-210 |
P2 |
p. 689-693 5 p. |
artikel |
56 |
Metastable solid solutions of antimony in (100) silicon
|
Pogany, A.P. |
|
1983 |
201-210 |
P2 |
p. 731-736 6 p. |
artikel |
57 |
Mg+ and Be+ ion implantation into AlxGa1−xAs
|
Yokota, Masaki |
|
1983 |
201-210 |
P2 |
p. 711-718 8 p. |
artikel |
58 |
Modification of tribological characteristics of metals after nitrogen implantation
|
Fu-Zhai, Cui |
|
1983 |
201-210 |
P2 |
p. 881-887 7 p. |
artikel |
59 |
Near surface modification of α-Al2O3 by ion implantation followed by thermal annealing
|
Naramoto, H. |
|
1983 |
201-210 |
P2 |
p. 1159-1166 8 p. |
artikel |
60 |
On the thermal effect of ion implantation
|
Gratton, Luigi M. |
|
1983 |
201-210 |
P2 |
p. 1117-1120 4 p. |
artikel |
61 |
Oxidation behaviour of ion implanted nickel
|
Slater, M. |
|
1983 |
201-210 |
P2 |
p. 1023-1028 6 p. |
artikel |
62 |
Oxygen ion beam modification of GaAs
|
Xian-Can, Deng |
|
1983 |
201-210 |
P2 |
p. 657-661 5 p. |
artikel |
63 |
Photographic image storage in ion implanted PLZT ceramics
|
Peercy, P.S. |
|
1983 |
201-210 |
P2 |
p. 1167-1178 12 p. |
artikel |
64 |
Properties of ion implanted glasses
|
Mazzoldi, Paolo |
|
1983 |
201-210 |
P2 |
p. 1089-1098 10 p. |
artikel |
65 |
Radiation enhanced diffusion of krypton and uranium impurities in LiF
|
Bangert, U. |
|
1983 |
201-210 |
P2 |
p. 1111-1115 5 p. |
artikel |
66 |
Radiation enhanced diffusion of silicon into iron for high temperature oxidation improvement
|
Galarie, A. |
|
1983 |
201-210 |
P2 |
p. 823-829 7 p. |
artikel |
67 |
Redistribution of implanted noble gas atoms by self-interstitials in molybdenum and nickel
|
van Veen, A. |
|
1983 |
201-210 |
P2 |
p. 1055-1061 7 p. |
artikel |
68 |
Residual disorder in silicon after anneal of high dose through oxide arsenic implants
|
Hagmann, D. |
|
1983 |
201-210 |
P2 |
p. 683-687 5 p. |
artikel |
69 |
Reversible transformation of defects in hydrogen-implanted silicon
|
Gorelkinskii, Yu. |
|
1983 |
201-210 |
P2 |
p. 677-682 6 p. |
artikel |
70 |
Rutherford backscattering analysis of thermal-pulse annealed Hg1−xCdxTe
|
Conway, K.L. |
|
1983 |
201-210 |
P2 |
p. 651-655 5 p. |
artikel |
71 |
Site localization, aggregation and atomic size effects for implanted iron alloys — correlation with the miedema model of alloying
|
Sawicka, B.D. |
|
1983 |
201-210 |
P2 |
p. 799-816 18 p. |
artikel |
72 |
Some practical aspects of N+ implantation in various steels related to wearing
|
Kun, Yu |
|
1983 |
201-210 |
P2 |
p. 1063-1070 8 p. |
artikel |
73 |
Stoichiometry changes in III–V compounds under ion bombardment
|
Barcz, A. |
|
1983 |
201-210 |
P2 |
p. 621-627 7 p. |
artikel |
74 |
Stress and strain in quartz and silica irradiated with light ions
|
King, B.V. |
|
1983 |
201-210 |
P2 |
p. 1135-1143 9 p. |
artikel |
75 |
Sulphur implantation in GaAs
|
Bhattacharya, R.S. |
|
1983 |
201-210 |
P2 |
p. 637-643 7 p. |
artikel |
76 |
Superconductivity in H-charged ion-beam mixed PdxCu1−x
|
Scholz, W. |
|
1983 |
201-210 |
P2 |
p. 1019-1022 4 p. |
artikel |
77 |
Superconductivity of simple metal-hydrogen systems produced by ion implantation
|
Ochmann, Frank |
|
1983 |
201-210 |
P2 |
p. 831-834 4 p. |
artikel |
78 |
Tarnishing of ion implanted copper in hydrogen sulphide containing atmospheres
|
Peide, Zhou |
|
1983 |
201-210 |
P2 |
p. 841-847 7 p. |
artikel |
79 |
The application of nitrogen ion implantation in silicon technology
|
Josquin, W.J.M.J. |
|
1983 |
201-210 |
P2 |
p. 581-587 7 p. |
artikel |
80 |
The behaviour of hydrogen atoms implanted into metals
|
Möller, W. |
|
1983 |
201-210 |
P2 |
p. 773-790 18 p. |
artikel |
81 |
The effect of ion implantation on epitaxial magnetic garnet thin films
|
Guzman, Alberto M. |
|
1983 |
201-210 |
P2 |
p. 1121-1127 7 p. |
artikel |
82 |
The effect of recoiled oxygen on damage regrowth and electrical properties of through-oxide implanted Si
|
Sadana, D.K. |
|
1983 |
201-210 |
P2 |
p. 743-750 8 p. |
artikel |
83 |
The influence of electronic processes on the epitaxial regrowth rate in ion implanted silicon
|
Williams, J.S. |
|
1983 |
201-210 |
P2 |
p. 767-771 5 p. |
artikel |
84 |
The influence of implanted dopants on stresses and diffusion processes in NiO films during thermal oxidation of Ni
|
Loison, D. |
|
1983 |
201-210 |
P2 |
p. 975-981 7 p. |
artikel |
85 |
Thermally activated clustering of silver in tungsten studied with THDS
|
van der Kolk, G.J. |
|
1983 |
201-210 |
P2 |
p. 1047-1053 7 p. |
artikel |
86 |
Thermal stability of ion implanted AuFe and PbFe supersaturated alloys
|
Turos, A. |
|
1983 |
201-210 |
P2 |
p. 1041-1046 6 p. |
artikel |
87 |
Wear testing under high load conditions
|
Hartley, N.E.W. |
|
1983 |
201-210 |
P2 |
p. 933-940 8 p. |
artikel |