Digitale Bibliotheek
Sluiten Bladeren door artikelen uit een tijdschrift
     Tijdschrift beschrijving
       Alle jaargangen van het bijbehorende tijdschrift
         Alle afleveringen van het bijbehorende jaargang
                                       Alle artikelen van de bijbehorende aflevering
 
                             766 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A beam profile monitor based on the application of infrared thermography Büttig, H.
1982
201-210 1-3 p. 69-71
3 p.
artikel
2 Absolute Auger yield measurements of Al+, Si+, P+, S+, and Cl+ projectiles following foil excitation Schneider, D.
1982
201-210 1-3 p. 345-347
3 p.
artikel
3 Absolute calibration of 14N(d, α) and 14N(d, p) reactions for surface adsorption studies Davies, J.A.
1983
201-210 1-3 p. 141-146
6 p.
artikel
4 Absolute α-induced thick-target gamma-ray yields for the elemental analysis of light elements Lappalainen, R.
1983
201-210 1-3 p. 441-444
4 p.
artikel
5 Absolute measurement of undulator radiation in the extreme ultraviolet Maezawa, H.
1983
201-210 1-3 p. 151-155
5 p.
artikel
6 A camera shutter used in high resolution bubble chamber photography Ferrie, J.D.
1982
201-210 1-3 p. 223-225
3 p.
artikel
7 Accelerator based mass spectrometry of semiconductor materials Anthony, J.M.
1983
201-210 1-3 p. 463-467
5 p.
artikel
8 Accelerator energy calibration using nonresonant nuclear reactions Scott, D.M.
1983
201-210 1-3 p. 154-158
5 p.
artikel
9 Accelerator mass spectrometry with 26Al Middleton, R.
1983
201-210 1-3 p. 430-438
9 p.
artikel
10 Accuracy of stopping cross section determination from RBS-spectra by Warters' method Aumayr, Friedrich
1983
201-210 1-3 p. 529-532
4 p.
artikel
11 A compact Compton suppression spectrometer using bismuth germanate scintillator Mohsen, Mona
1983
201-210 1-3 p. 241-244
4 p.
artikel
12 A comparison of secondary ion mass spectrometry and auger electron spectroscopy as surface analytical techniques Morgan, A.E.
1983
201-210 1-3 p. 401-408
8 p.
artikel
13 A comparison of the effects of ultraviolet radiation on CR-39 and lexan plastics irradiated by alpha particles Wong, C.F.
1982
201-210 1-3 p. 443-449
7 p.
artikel
14 A crystal-diffraction monochromating system for small-angle experiments with synchrotron radiation Gerasimov, V.S.
1983
201-210 1-3 p. 479-487
9 p.
artikel
15 A cylindrical mirror photoelectron spectrometer with position-sensitive detector used for X-ray analysis Benka, O.
1982
201-210 1-3 p. 547-550
4 p.
artikel
16 A description of the ferromagnetic levitation electrometer used in the search of quarks in matter Marinelli, M.
1981
201-210 1-3 p. 129-140
12 p.
artikel
17 A design for one millimeter pitch multiware proportional chambers operating at high rates Crittenden, R.R.
1981
201-210 1-3 p. 75-79
5 p.
artikel
18 A differentially pumped supersonic jet gas target for low-energy nuclear reaction experiments Treichel, Michael
1983
201-210 1-3 p. 101-110
10 p.
artikel
19 A diffractometer for X-ray interferometry Spieker, P.
1983
201-210 1-3 p. 609-611
3 p.
artikel
20 A display-type analyzer with an image-processing system for angle-resolved photoelectron spectroscopy Rieger, D.
1983
201-210 1-3 p. 777-784
8 p.
artikel
21 A double crystal X-ray monochromator with focusing premirror Malzfeldt, W.
1983
201-210 1-3 p. 359-360
2 p.
artikel
22 Adsorption study of hydrogen on a stepped Pt (997) surface using low energy recoil scattering Koeleman, B.J.J.
1983
201-210 1-3 p. 225-229
5 p.
artikel
23 A dynamic control and measuring system for synchrotron X-ray rocking curves Krolzig, A.
1983
201-210 1-3 p. 613-619
7 p.
artikel
24 A ΔE-E telescope with very large solid angle Zurmühle, R.W.
1982
201-210 1-3 p. 261-267
7 p.
artikel
25 A fast, irradiation resistant fission fragment detector for neutron-fragment correlation measurements Plischke, P.
1982
201-210 1-3 p. 419-428
10 p.
artikel
26 A fast neutron spectrum unfolding method using activation measurements and its application to restoration of a thermonuclear reactor blanket neutron spectrum Novikov, V.M.
1982
201-210 1-3 p. 403-407
5 p.
artikel
27 A fast processor for dilepton triggers Areti, H.
1983
201-210 1-3 p. 135-144
10 p.
artikel
28 A flowing gas target system for precision electron scattering measurements Stapor, W.J.
1982
201-210 1-3 p. 97-100
4 p.
artikel
29 A gas cell for Doppler-shift attenuation measurements up to 107 Pa Bini, Maurizio
1983
201-210 1-3 p. 235-240
6 p.
artikel
30 A grouped-cathode-wire method for the position sensitive proportional counter Kitamoto, Shunji
1982
201-210 1-3 p. 613-614
2 p.
artikel
31 A Guinier camera for X-rays from a synchrotron source Arnold, H.
1983
201-210 1-3 p. 599-601
3 p.
artikel
32 A high efficiency electron pair spectrometer Birk, M.
1982
201-210 1-3 p. 255-259
5 p.
artikel
33 A high flux normal incidence monochromator for circularly polarized synchrotron radiation Eyers, A.
1983
201-210 1-3 p. 303-305
3 p.
artikel
34 A high resolution X-ray passband filter for inelastic scattering experiments with synchrotron radiation Schülke, W.
1983
201-210 1-3 p. 593-597
5 p.
artikel
35 A high temperature tensile stage for X-ray synchrotron topographic studies of dislocation mechanisms in semiconductors George, Amand
1983
201-210 1-3 p. 731-734
4 p.
artikel
36 Aifom, an analytic formula for universal assessment of goodness-of-fit of gamma ray spectra Misra, Sushil K.
1981
201-210 1-3 p. 257-259
3 p.
artikel
37 A large area position sensitive neutron detector Berliner, R.
1981
201-210 1-3 p. 481-495
15 p.
artikel
38 A large position-sensitive neutron detector Netter, P.
1981
201-210 1-3 p. 165-174
10 p.
artikel
39 A low-cost personal computer system for controlling an x-ray crystal spectrometer in use for collision experiments Marubayashi, K.
1982
201-210 1-3 p. 571-576
6 p.
artikel
40 Alpha particle stopping cross sections of Cu and Au at energies below 3 MeV Stoquert, J.P.
1982
201-210 1-3 p. 51-55
5 p.
artikel
41 A magnifying magnetic optical achromat Brown, K.L.
1982
201-210 1-3 p. 73-79
7 p.
artikel
42 A method for determination of the 152Eu activity Baba, S.
1982
201-210 1-3 p. 273-280
8 p.
artikel
43 A method for improving the quality of the magnetic field in a solenoid Feinberg, B.
1982
201-210 1-3 p. 81-85
5 p.
artikel
44 A method of studying atomic screening effects in pair production Bose, Jahnabi
1983
201-210 1-3 p. 539-543
5 p.
artikel
45 A 550 MeV injector microtron for max Eriksson, Mikael
1982
201-210 1-3 p. 1-5
5 p.
artikel
46 A modified continuum model for the evaluation of channeling experiments for foreign atom location Beck, K.
1983
201-210 1-3 p. 97-102
6 p.
artikel
47 Amplication factors of an EMI 9603B particle multiplier for singly charged alkali ions Ul Haq, Faizan
1982
201-210 1-3 p. 561-563
3 p.
artikel
48 A multipole wiggler magnet for DORIS Gürtler, P.
1983
201-210 1-3 p. 163-166
4 p.
artikel
49 A multiwire chamber for positron and photon beam scanning Albicocco, M.
1982
201-210 1-3 p. 63-68
6 p.
artikel
50 A muon monitor for neutrino flux measurement V. Baggett, Neil
1981
201-210 1-3 p. 87-94
8 p.
artikel
51 An all electrostatic mass spectrometer Kilius, L.R.
1981
201-210 1-3 p. 27-33
7 p.
artikel
52 An alpha-particle imaging system for detecting plutonium contamination Iida, Takao
1983
201-210 1-3 p. 413-418
6 p.
artikel
53 Analysis of hydrogen in corrosion product films on amorphous alloy using the elastic recoil detection technique Yamaguchi, S.
1983
201-210 1-3 p. 598-600
3 p.
artikel
54 An anti-cherenkov photomultiplier tube Selove, W.
1982
201-210 1-3 p. 615-616
2 p.
artikel
55 An apparatus for measuring the beam emittance of the Tohoku AVF cyclotron Ishii, K.
1981
201-210 1-3 p. 1-6
6 p.
artikel
56 An application of Rutherford backscattering to the study of growth of evaporated films Fujino, Y.
1981
201-210 1-3 p. 177-182
6 p.
artikel
57 An archaeological application of PIXE-PIGME analysis to admirality islands obsidians Ambrose, W.R.
1981
201-210 1-3 p. 397-402
6 p.
artikel
58 An assessment of nuclear waste transmutation with proton accelerators Krenciglowa, E.M.
1981
201-210 1-3 p. 393-400
8 p.
artikel
59 An automatic device for sampling of thin assays of short-lived radionuclides in a liquid flow Növik, S.I.
1981
201-210 1-3 p. 175-180
6 p.
artikel
60 An automatic fission track scanner Chou, H.P.
1981
201-210 1-3 p. 359-371
13 p.
artikel
61 An efficient HV pulser for supplying an e-beam controlled CO2 laser power amplifier Bizzarri, U.
1982
201-210 1-3 p. 287-289
3 p.
artikel
62 A neutron spectrometer suitable for diagnostics of extended fusion plasmas Elevant, T.
1981
201-210 1-3 p. 313-320
8 p.
artikel
63 A new advanced fixed in-core instrumentation for a PWR reactor Barbet, M.
1981
201-210 1-3 p. 377-386
10 p.
artikel
64 A new approach to the differentiation unfolding of neutron spectra from proton-recoil data Morton, Randall E.
1981
201-210 1-3 p. 271-276
6 p.
artikel
65 A new belt-type apparatus for energy-dispersive x-ray diffraction under high pressure and temperature Hinze, E.
1983
201-210 1-3 p. 569-572
4 p.
artikel
66 A new concept for improved ion and electron lenses — Aberration corrected systems of planar electrostatic deflection elements Dalglish, R.L.
1983
201-210 1-3 p. 7-10
4 p.
artikel
67 A new experiment for measuring the flux of high energy iron nuclei in cosmic rays Sood, R.K.
1981
201-210 1-3 p. 427-431
5 p.
artikel
68 A new measurement of the 429 keV 15N(p,αγ)12C resonance. Applications of the very narrow width fouNd to 15N and 1H depth location Maurel, B.
1983
201-210 1-3 p. 159-164
6 p.
artikel
69 A new method for identification of low energy fragments with 8<Z≤18 in plastic track detector Makrofol Todorović, Ž.
1983
201-210 1-3 p. 217-219
3 p.
artikel
70 A new method of intrinsic alpha particle discrimination by using parallel plate avalanche counters Neubert, W.
1981
201-210 1-3 p. 181-187
7 p.
artikel
71 A new monochromator for the energy range 5 eV ⩽ h ̵ ω ⩽ 1000 eV Jark, W.
1983
201-210 1-3 p. 315-318
4 p.
artikel
72 A new system for astrophysical nuclear reaction studies with radioactive ion beams Haight, R.C.
1983
201-210 1-3 p. 245-247
3 p.
artikel
73 A new VUV-reflectometer for UHV-applications Hogrefe, H.
1983
201-210 1-3 p. 415-418
4 p.
artikel
74 A new wiggler beam line for SSRL Bahr, Charles
1983
201-210 1-3 p. 117-125
9 p.
artikel
75 A new X-ray monochromator for synchrotron radiation coupled with a 5-circle diffractometer Kupčik, V.
1983
201-210 1-3 p. 519-522
4 p.
artikel
76 An experimental station for photoelectron spectroscopy of atoms and molecules in the VUV Bruhn, R.
1983
201-210 1-3 p. 771-776
6 p.
artikel
77 An experimental study of the 180° backscattering yield enhancement Jackman, T.E.
1981
201-210 1-3 p. 527-531
5 p.
artikel
78 An experimental study of the surface chemistry and evaporation kinetics of liquid sodium Becker, Christopher H.
1983
201-210 1-3 p. 533-536
4 p.
artikel
79 An extended range soft X-ray beam line for the 1 GeV storage ring Aladdin Hulbert, Steven L.
1983
201-210 1-3 p. 43-47
5 p.
artikel
80 Angular dependence of resonant coherent excitation in ion-surface scattering at grazing incidence Burgdörfer, J.
1982
201-210 1-3 p. 337-340
4 p.
artikel
81 Angular distribution measurements of sputtered Au atoms with quartz oscillator microbalances Mannami, Michi-hiko
1981
201-210 1-3 p. 533-537
5 p.
artikel
82 Angular distributions and differential sputtering yields of binary compounds as a function of angle of incidence Roth, J.
1983
201-210 1-3 p. 751-756
6 p.
artikel
83 Angular distributions of 250 GeV/c positive particles axially channeled in germanium crystal Sun, C.R.
1982
201-210 1-3 p. 125-128
4 p.
artikel
84 An in-beam-line low-level system for nuclear reaction γ-rays Damjantschitsch, H.
1983
201-210 1-3 p. 129-140
12 p.
artikel
85 An instrument with very high energy resolution in X-ray scattering Dorner, B.
1983
201-210 1-3 p. 587-592
6 p.
artikel
86 A nonlinear boltzmann equation calculation of sputtering from spikes Weller, Robert A.
1982
201-210 1-3 p. 573-577
5 p.
artikel
87 An optimized beam line and experimental station for angle resolved photoemission between 5 eV≤hv≤50 eV Feldmann, C.A.
1983
201-210 1-3 p. 785-789
5 p.
artikel
88 An order-sorting monochromator for synchrotron radiation Greaves, G.N.
1983
201-210 1-3 p. 335-339
5 p.
artikel
89 Antiproton mass measurement using stored beams cooled by electrons Poth, H.
1982
201-210 1-3 p. 597-599
3 p.
artikel
90 A nuclear microprobe analysis of laser treated aluminium implanted with antimony Jain, Animesh K.
1981
201-210 1-3 p. 151-156
6 p.
artikel
91 A polarimeter for vector- and tensor-polarized deuterons for use in polarization transfer experiments Grüebler, W.
1982
201-210 1-3 p. 235-242
8 p.
artikel
92 A possible source of monochromatic photons below 100 MeV Camarda, Harry S.
1981
201-210 1-3 p. 125-127
3 p.
artikel
93 Application of a threshold electron spectrometer in spin resolved photoelectron analysis Heckenkamp, Ch.
1983
201-210 1-3 p. 805-808
4 p.
artikel
94 Application of coincidence techniques to X-ray fluorescence analysis Puumalainen, P.
1983
201-210 1-3 p. 463-467
5 p.
artikel
95 Application of nuclear resonant reactions to the analysis of implanted Ne atoms in niobium crystal Naramoto, H.
1981
201-210 1-3 p. 367-372
6 p.
artikel
96 Application of RBS and PIXE in specific site determination of S and SI in ion implanted GaAs Bhattacharya, R.S.
1983
201-210 1-3 p. 515-518
4 p.
artikel
97 Application of synchrotron radiation to high resolution powder diffraction and rietveld refinement Cox, D.E.
1983
201-210 1-3 p. 573-578
6 p.
artikel
98 Application of synchrotron radiation to the study of man's circulatory system Kulipanov, G.N.
1983
201-210 1-3 p. 677-683
7 p.
artikel
99 Application of the Bragg-profiling technique to the analysis of metallurgical and optical surface layers Eichinger, P.
1983
201-210 1-3 p. 489-492
4 p.
artikel
100 Application of the channeling and X-ray diffraction techniques for defect analysis Kaufmann, R.
1983
201-210 1-3 p. 647-651
5 p.
artikel
101 Application of wavelength-shifter techniques to position measuring counters Klasen, P.
1981
201-210 1-3 p. 67-74
8 p.
artikel
102 Applications of focused ion beams Wagner, Alfred
1983
201-210 1-3 p. 355-362
8 p.
artikel
103 Applications of simultaneous ion backscattering and ion-induced X-ray emission Musket, R.G.
1983
201-210 1-3 p. 420-424
5 p.
artikel
104 A pulsed beam time of flight technique for studying ion-atom scattering Schectman, Richard M.
1982
201-210 1-3 p. 681-684
4 p.
artikel
105 A rapid method for the measurement of small peak shifts Brunner, Gerhard
1981
201-210 1-3 p. 309-312
4 p.
artikel
106 Argon defect complexes in low energy Ar irradiated molybdenum van Veen, A.
1982
201-210 1-3 p. 485-489
5 p.
artikel
107 A Rutherford backscattering study of diffusion in polymers Selen, M.A.
1983
201-210 1-3 p. 451-455
5 p.
artikel
108 A self-consistent method for calculating the evaporation of heavy fragments following energetic initial reactions Green, Ray E.L.
1981
201-210 1-3 p. 195-206
12 p.
artikel
109 A separated crystal, fixed-exit monochromator for X-ray synchrotron radiation Mills, D.M.
1983
201-210 1-3 p. 341-347
7 p.
artikel
110 A simple automatic deadtime loss correction system for particle counting processes induced by ion beams with fluctuating intensities Amsel, G.
1983
201-210 1-3 p. 16-22
7 p.
artikel
111 A simple light guide for coupling to thin scintillator sheets Kinney, E.R.
1981
201-210 1-3 p. 189-193
5 p.
artikel
112 Assessment of the capabilities of Monte Carlo electron transport models using the continuous slowing down approximation Vande Putte, Dave W.
1982
201-210 1-3 p. 367-375
9 p.
artikel
113 A station for studying solid state spectra using synchrotron radiation at the VEPP-2M storage ring Makarov, O.A.
1983
201-210 1-3 p. 419-421
3 p.
artikel
114 A study of albedo from hadronic calorimeter for energies ≈100–2000 GeV Ellsworth, R.W.
1982
201-210 1-3 p. 167-177
11 p.
artikel
115 A study of bulk-etch rates and track-etch rates in CR39 Green, P.F.
1982
201-210 1-3 p. 551-559
9 p.
artikel
116 A study of impurity mobility in ion-implanted Al by Rutherford backscattering Madakson, Peter B.
1983
201-210 1-3 p. 537-541
5 p.
artikel
117 A study of mixing behavior of AlAg, AlIn and AlSn systems by Ar ion irradiation Fujino, Y.
1983
201-210 1-3 p. 691-695
5 p.
artikel
118 Asymmetry of depth oscillations for 〈110〉 channeling in GaP Andersen, J.U.
1982
201-210 1-3 p. 129-132
4 p.
artikel
119 A system for measuring MCD spectra of low temperature samples with synchrotron radiation in the VUV region Hormes, J.
1983
201-210 1-3 p. 849-853
5 p.
artikel
120 A technique to correct for backgrounds caused by break-up neutrons from the D(d, n) reaction Grimes, S.M.
1982
201-210 1-3 p. 269-272
4 p.
artikel
121 A theory of a new, astigmatism- and coma-free spectrometer Oshio, Takanori
1983
201-210 1-3 p. 297-301
5 p.
artikel
122 A thin detector with ionization tubes for high energy electrons and photons Amatuni, Ts.A.
1982
201-210 1-3 p. 179-182
4 p.
artikel
123 Atomic excitations in sputtering studied with group two element targets Veje, E.
1982
201-210 1-3 p. 593-595
3 p.
artikel
124 Atomic mixing effects on high fluence Ge implantation into Si at 40 keV Gras-Marti, A.
1982
201-210 1-3 p. 449-451
3 p.
artikel
125 Atomic positions of surface atoms using high energy ion scattering Feldman, L.C.
1981
201-210 1-3 p. 211-219
9 p.
artikel
126 A tunable, fixed-exit, monolithic X-ray monochromator for synchrotron radiation sources Mills, D.M.
1983
201-210 1-3 p. 355-358
4 p.
artikel
127 Auger electron and characteristic energy loss spectra for electro-deposited americium-241 Varma, Matesh N.
1983
201-210 1-3 p. 493-495
3 p.
artikel
128 Auger electron emission from solids during bombardment with MeV ions Saemann-Ischenko, G.
1983
201-210 1-3 p. 757-763
7 p.
artikel
129 Auger electron emission induced by MeV H+ and He+ ions Macdonald, Jack R.
1983
201-210 1-3 p. 765-770
6 p.
artikel
130 Auger electron spectrometry of beam-foil excited molecular heavy ions Frischkorn, H.J.
1982
201-210 1-3 p. 311-313
3 p.
artikel
131 A UHV compatible two-crystal monochromator for synchrotron radiation Cowan, P.L.
1983
201-210 1-3 p. 349-353
5 p.
artikel
132 Author index 1983
201-210 1-3 p. 559-566
8 p.
artikel
133 Author index 1982
201-210 1-3 p. 617-623
7 p.
artikel
134 Author index 1983
201-210 1-3 p. 827-836
10 p.
artikel
135 Author index 1981
201-210 1-3 p. 591-597
7 p.
artikel
136 Author index 1981
201-210 1-3 p. 605-610
6 p.
artikel
137 Author index 1983
201-210 1-3 p. 855-865
11 p.
artikel
138 Author index 1982
201-210 1-3 p. 685-693
9 p.
artikel
139 Autobatch: I. system description for the automated batchwise isolation and study of short-lived fission products Lien III, O.G.
1981
201-210 1-3 p. 351-358
8 p.
artikel
140 Automatic monitoring of 22Rn daughter concentration in soil air by an electrode collector Tanaka, Fujio
1982
201-210 1-3 p. 587-593
7 p.
artikel
141 Average energy to create an ion pair in air by uranium and lead ions of about 4 MeV/amu Liesem, Helmut
1981
201-210 1-3 p. 443-446
4 p.
artikel
142 A versatile large area parallel plate avalanche counter (PPAC) for broad-range magnetic spectrographs Sernicki, Jan
1983
201-210 1-3 p. 195-201
7 p.
artikel
143 A vidicon camera for real time X-ray diffraction studies on polymers using synchrotron radiation Prieske, W.
1983
201-210 1-3 p. 435-438
4 p.
artikel
144 Avoidance of blister formation in target backings during α-particle bombardment Kiss, Á.Z.
1982
201-210 1-3 p. 107-108
2 p.
artikel
145 Axial channeling radiation from MeV electrons Andersen, J.U.
1982
201-210 1-3 p. 209-224
16 p.
artikel
146 Axial channeling studies of strained-layer superlattices Picraux, S.T.
1983
201-210 1-3 p. 57-62
6 p.
artikel
147 Background formation in SIMS analysis of hydrogen, carbon, nitrogen and oxygen in silicon Wittmaack, K.
1983
201-210 1-3 p. 327-332
6 p.
artikel
148 Background in semiconductor devices Sellschop, J.P.F.
1981
201-210 1-3 p. 447-452
6 p.
artikel
149 BATTY83: A computer program for thick target PIXE analysis Clayton, E.
1983
201-210 1-3 p. 221-224
4 p.
artikel
150 Beam optical properties of the magnetic field produced by two coaxial coils Lobb, D.E.
1981
201-210 1-3 p. 13-24
12 p.
artikel
151 Bessy SX 700 UHV monochromator: Design features and kinematic concept Riemer, F.
1983
201-210 1-3 p. 313-314
2 p.
artikel
152 Binomial vs poisson statistics in radiation studies Foster, John
1983
201-210 1-3 p. 301-305
5 p.
artikel
153 Biological effects of low doses of ionizing radiations: Particle tracks in radiobiology Katz, Robert
1982
201-210 1-3 p. 433-442
10 p.
artikel
154 Biomolecule mass spectrometry by fast heavy ion induced desorption Sundqvist, Bo
1983
201-210 1-3 p. 267-275
9 p.
artikel
155 Blocking experiments with positive muons and positrons arising from the decay of pions and muons implanted in single crystals Maier, K.
1982
201-210 1-3 p. 159-163
5 p.
artikel
156 Bombardment induced cascade mixing and the importance of post-cascade relaxation Webb, R.P.
1983
201-210 1-3 p. 697-702
6 p.
artikel
157 Bulk response of some polymeric nuclear track detectors to ionizing radiation Lück, H.B.
1983
201-210 1-3 p. 371-373
3 p.
artikel
158 Calculated differential π + production spectra at large angles from 28 GeV protons on a thick iridium target and comparisons with experimental data Alsmiller Jr., R.G.
1981
201-210 1-3 p. 253-255
3 p.
artikel
159 Calculated initial energies of electrons in Si and SiO2 irradiated by photons with energies up to 2 MeV Todo, A.S.
1982
201-210 1-3 p. 459-465
7 p.
artikel
160 Calibration of a gamma-ray telescope using tagged positron annihilation photons Bertsch, D.L.
1981
201-210 1-3 p. 439-448
10 p.
artikel
161 Capacitative charge division read-out with a silicon strip detector England, J.B.A.
1981
201-210 1-3 p. 43-47
5 p.
artikel
162 Catalyst metal-support interactions: Rutherford backscattering spectrometry applied to discontinuous films Beglin, J.E.E.
1983
201-210 1-3 p. 445-450
6 p.
artikel
163 Channeling analysis of thermally nitrided silicon Amano, Jun
1983
201-210 1-3 p. 589-592
4 p.
artikel
164 Channeling in diamond at high depth resolution Edge, R.D.
1982
201-210 1-3 p. 133-137
5 p.
artikel
165 Channeling in Mg and Zr doped gadolinium gallium garnets Timm, Andreas
1982
201-210 1-3 p. 175-179
5 p.
artikel
166 Channeling studies of defects Swanson, M.L.
1982
201-210 1-3 p. 165-174
10 p.
artikel
167 Channeling study of low-Z impurities dissolved in metals Takahashi, Junzo
1982
201-210 1-3 p. 187-191
5 p.
artikel
168 Characterisation of a new batch of ion implanted Bi in silicon specimens for use as primary reference surface standards Mitchell, I.V.
1983
201-210 1-3 p. 91-96
6 p.
artikel
169 Characteristic energy losses from channeled 100 keV electrons Taftø, J.
1982
201-210 1-3 p. 153-158
6 p.
artikel
170 Characteristics of a gas proportional chamber for observations of shower particles, with applications to the shower transition curve in the high energy region Mitsui, K.
1981
201-210 1-3 p. 433-438
6 p.
artikel
171 Characteristics of multiware proportional counters Kuzminov, V.V.
1982
201-210 1-3 p. 477-482
6 p.
artikel
172 Characteristics of thermoluminescent dosimeter at high temperature and high exposure rate Pin-Chieh Hsu,
1982
201-210 1-3 p. 429-432
4 p.
artikel
173 Charge-coupled devices for particle detection with high spatial resolution Damerell, C.J.S.
1981
201-210 1-3 p. 33-42
10 p.
artikel
174 Charge states of reflected particles for grazing incidence of D+, D2 + and D0 on Ni and Cs targets Schneider, P.J.
1982
201-210 1-3 p. 387-390
4 p.
artikel
175 Cluster ion emission from ion bombarded niobium-vanadium alloys Garrett, R.F.
1981
201-210 1-3 p. 308-312
5 p.
artikel
176 Collisional effects in the passage of fast molecular ions through thin foils Gemmell, Donald S.
1982
201-210 1-3 p. 255-267
13 p.
artikel
177 Committees 1981
201-210 1-3 p. xii-
1 p.
artikel
178 Comparative erosion yields, topographical changes and depth profile analysis of ion eroded nickel-based alloys Navinšek, B.
1982
201-210 1-3 p. 621-624
4 p.
artikel
179 Comparison of kinematic X-ray diffraction and backscattering spectrometry — strain and damage profiles in garnet Paine, B.M.
1981
201-210 1-3 p. 80-86
7 p.
artikel
180 Comparison of the retention characteristics of low-energy xenon and caesium implanted in silicon Menzel, N.
1981
201-210 1-3 p. 235-240
6 p.
artikel
181 Compensation of errors by cross-calibration of incoming and scattered energies in deep-inelastic lepton scattering Navarria, F.-L.
1983
201-210 1-3 p. 125-133
9 p.
artikel
182 Computation and error analysis of the optical constants of gold in the 280 to 640 eV range from transmission diffraction data Tatchyn, R.
1983
201-210 1-3 p. 409-413
5 p.
artikel
183 Computer simulation of bunch lengthening in spear Siemann, R.
1982
201-210 1-3 p. 57-62
6 p.
artikel
184 Computer simulations of slowing down of ions in polycrystalline materials Hautala, Mikko
1983
201-210 1-3 p. 799-802
4 p.
artikel
185 Contamination induced changes in photon emission from Nb and Nb/V alloys Loxton, C.M.
1981
201-210 1-3 p. 269-274
6 p.
artikel
186 Convoy electron production in heavy ion-solid collisions Sellin, Ivan A.
1982
201-210 1-3 p. 395-404
10 p.
artikel
187 Core level photoelectron spectroscopy for surface crystallography Minh Duc, Tran
1982
201-210 1-3 p. 633-638
6 p.
artikel
188 Corrected electrostatic lens systems for ion beams Dalglish, R.L.
1981
201-210 1-3 p. 191-198
8 p.
artikel
189 Corrosion inhibition by ion implantation of Al or Mg in Cu, investigated by RBS Svendsen, Leo G.
1981
201-210 1-3 p. 141-145
5 p.
artikel
190 Current techniques in muon spin rotation experiments Lankford, William F.
1981
201-210 1-3 p. 469-480
12 p.
artikel
191 DAG, a digital-to-analog generator of coincident pulse pairs Guazzoni, Paolo
1981
201-210 1-3 p. 219-225
7 p.
artikel
192 Dating of obsidian artifacts by depth-profiling of artificially hydrated surface layers Tsong, I.S.T.
1981
201-210 1-3 p. 403-407
5 p.
artikel
193 Dechanneling analysis of disorder in (100) gallium arsenide Rossiter, K.G.
1983
201-210 1-3 p. 639-642
4 p.
artikel
194 Dechanneling by dislocations and stacking faults in ion-implanted Si Götz, G.
1982
201-210 1-3 p. 199-204
6 p.
artikel
195 Decoration of dislocations by proton irradiation of halite Bird, J.R.
1981
201-210 1-3 p. 19-22
4 p.
artikel
196 Defects in In Cu simultaneously observed by channeling and PAC Lindner, G.
1982
201-210 1-3 p. 193-197
5 p.
artikel
197 Defect trapping of hydrogen in iron studied by the 1H(15N, αγ)12C reaction Frech, G.
1983
201-210 1-3 p. 500-503
4 p.
artikel
198 Dependence of energy straggling on energy loss as a first order correction Stoquert, J.P.
1981
201-210 1-3 p. 513-516
4 p.
artikel
199 Dependence on pulse width for production of multiply charged ions Yamaya, T.
1982
201-210 1-3 p. 7-12
6 p.
artikel
200 Depth profiles and microtopology Bird, J.R.
1983
201-210 1-3 p. 53-56
4 p.
artikel
201 Depth profiling in the investigation of industrial processes Mercer, P.D.
1981
201-210 1-3 p. 283-288
6 p.
artikel
202 Depth profiling light nuclei in single crystals: A combined nuclear reaction and RBS technique to minimize unwanted channeling effects L'Hoir, A.
1981
201-210 1-3 p. 357-366
10 p.
artikel
203 Depth profiling of hydrogen in thin films with the elastic recoil detection technique Cheng, Huan-sheng
1983
201-210 1-3 p. 601-606
6 p.
artikel
204 Depth selective conversion electron mössbauer spectroscopy: comparison of experiment with Monte Carlo simulation of electron scattering Liljequist, D.
1981
201-210 1-3 p. 599-600
2 p.
artikel
205 Design and construction of two large aperture cherenkov counters for use in a photoproduction experiment Bevan, A.
1982
201-210 1-3 p. 159-166
8 p.
artikel
206 Design considerations for an X-ray microprobe Howells, M.R.
1983
201-210 1-3 p. 379-386
8 p.
artikel
207 Design of a non-resonant Mössbauer scattering system at low temperatures Ti, S.S.
1982
201-210 1-3 p. 533-536
4 p.
artikel
208 Design of a nuclear clock Notea, A.
1981
201-210 1-3 p. 539-543
5 p.
artikel
209 Design of doubly focusing, tunable (5–30 keV), wide bandpass optics made from layered synthetic microstructures Bilderback, D.H.
1983
201-210 1-3 p. 251-261
11 p.
artikel
210 Design of small-angle X-ray diffractometer using synchrotron radiation at the photon factory Amemiya, Yoshiyuki
1983
201-210 1-3 p. 471-477
7 p.
artikel
211 Design studies of mirror-grating systems for use with an electron storage ring source at the photon factory Namioka, Takeshi
1983
201-210 1-3 p. 215-222
8 p.
artikel
212 Detection of carbon contamination by means of the 12 C(p, γ)13 N resonance reaction Rudolph, W.
1981
201-210 1-3 p. 373-378
6 p.
artikel
213 Detection of charged particles with a phoswich counter Pastor, C.
1983
201-210 1-3 p. 209-215
7 p.
artikel
214 Detection of fluorine contamination by means of the 19(p,p′γ)19 reaction Gippner, P.
1981
201-210 1-3 p. 341-344
4 p.
artikel
215 Detection of single electrons produced by aerosol photoemission in a drift chamber Seiler, P.G.
1982
201-210 1-3 p. 129-131
3 p.
artikel
216 Detection of sputtered neutrals by multi-photon resonance ionization Kimock, F.M.
1983
201-210 1-3 p. 287-292
6 p.
artikel
217 Detection of trace elements in ash samples performed by combining RBS and PIXE Svendsen, Leo G.
1981
201-210 1-3 p. 414-418
5 p.
artikel
218 Determination of defect structures by ion-channeling and by X-ray diffraction — A comparative study Kaufmann, R.
1981
201-210 1-3 p. 532-536
5 p.
artikel
219 Determination of excited sputtered atoms kinetic energy as a contribution to the understanding of the excitation phenomenon in the sputtering process Auciello, O.
1982
201-210 1-3 p. 549-553
5 p.
artikel
220 Determination of partial subshell cross-sections and electron mean free path in solids with the photoemission set-up at the FLIPPER monochromator Barth, J.
1983
201-210 1-3 p. 797-804
8 p.
artikel
221 Determination of the displacement field of hydrogen (deuterium) in tantalum by fast ion channeling Müller, R.
1983
201-210 1-3 p. 75-80
6 p.
artikel
222 Determination of the fluorine distribution in porous silicon using nuclear reaction, XPS and Auger analyses. Earwaker, L.G.
1983
201-210 1-3 p. 481-484
4 p.
artikel
223 Determination of three parameters of a depth profile of foreign atoms in bulk material using pixe analysis Geretschläger, M.
1982
201-210 1-3 p. 503-508
6 p.
artikel
224 Development of a new energy scanned (4–20 keV) ESAFS-II spectrometer at lure Goulon, José
1983
201-210 1-3 p. 625-630
6 p.
artikel
225 Development of an underwater high sensitivity cherenkov detector: Sea urchin Camerini, Ugo
1982
201-210 1-3 p. 467-476
10 p.
artikel
226 Development of an undulator for the SRS Poole, M.W.
1983
201-210 1-3 p. 143-148
6 p.
artikel
227 Diamond: Ion beam analyses of an extreme form of carbon Sellschop, J.P.F.
1981
201-210 1-3 p. 11-18
8 p.
artikel
228 Diminished stopping power for fast nitrogen and oxygen diclusters in carbon Steuer, Malcolm F.
1982
201-210 1-3 p. 277-279
3 p.
artikel
229 Disorder dependence of ion implanted GaAs on the type of ion Tashlykov, I.S.
1982
201-210 1-3 p. 523-526
4 p.
artikel
230 Dose dependence in angular distributions of Ag and Au sputtered from an alloy target Weller, Martha Riherd
1983
201-210 1-3 p. 419-426
8 p.
artikel
231 Double bifurcation optimization for reduction of secondary loading in neutral beam injectors Whealton, J.H.
1982
201-210 1-3 p. 377-387
11 p.
artikel
232 Double-crystal topography with polarized synchrotron X-rays Bonse, Ulrich
1983
201-210 1-3 p. 711-712
2 p.
artikel
233 Double-differential cross sections for delta-electrons from heavy ion—atom collisions Bell, F.
1982
201-210 1-3 p. 423-427
5 p.
artikel
234 Economical on-line image processing of synchrotron x-radiation topographs Tanner, B.K.
1983
201-210 1-3 p. 713-717
5 p.
artikel
235 Editorial 1981
201-210 1-3 p. vii-
1 p.
artikel
236 Editorial Koch, Ernst-Eckhard
1983
201-210 1-3 p. vii-viii
nvt p.
artikel
237 Editorial Remillieux, J.
1982
201-210 1-3 p. vii-
1 p.
artikel
238 Editorial 1981
201-210 1-3 p. v-vi
nvt p.
artikel
239 Editorial Board 1982
201-210 1-3 p. ii-
1 p.
artikel
240 Editorial Board 1983
201-210 1-3 p. iii-
1 p.
artikel
241 Editorial Board 1982
201-210 1-3 p. ii-iii
nvt p.
artikel
242 Editorial Board 1983
201-210 1-3 p. ii-
1 p.
artikel
243 Editorial Board 1983
201-210 1-3 p. ii-
1 p.
artikel
244 Editorial Board 1981
201-210 1-3 p. IFC-
1 p.
artikel
245 Editorial Board 1981
201-210 1-3 p. ii-iii
nvt p.
artikel
246 Effective charges of ions and the stopping power of dense media Brandt, Werner
1982
201-210 1-3 p. 13-19
7 p.
artikel
247 Effect of charge carrier collection on the shape of the amplitude spectrum of coaxial Ge(Li) detectors Katkov, V.P.
1983
201-210 1-3 p. 327-332
6 p.
artikel
248 Effect of CW-laser irradiation of evaporated layers on silicon Bhattacharya, P.K.
1981
201-210 1-3 p. 47-50
4 p.
artikel
249 Effects of target crystallinity on the range distribution of hydrogen ions in metals Möller, W.
1982
201-210 1-3 p. 121-124
4 p.
artikel
250 Efficiency calibration of semiconductor detectors by primary standard sources and Monte Carlo calculations Debertin, K.
1982
201-210 1-3 p. 343-352
10 p.
artikel
251 Elastic recoil detection analysis of light particles (1H16O) using 30 MeV sulphur ions Nölscher, C.
1983
201-210 1-3 p. 116-119
4 p.
artikel
252 Electron capture process into the wake potential Yamazaki, Y.
1982
201-210 1-3 p. 415-418
4 p.
artikel
253 Electron capture spectroscopy ECS at Cr(100) and Ni(110) surfaces Rau, Carl
1981
201-210 1-3 p. 433-436
4 p.
artikel
254 Electron emission from silver under heavy atomic and molecular ion bombardment Svensson, B.
1982
201-210 1-3 p. 429-432
4 p.
artikel
255 Electronic energy loss of H, D and He in single crystal gold films in the energy range below 15 keV Blume, R.
1982
201-210 1-3 p. 67-70
4 p.
artikel
256 Electronic excitation of Ti atoms sputtered by energetic Ar+ and He+ from clean and monolayer oxygen covered surfaces Pellin, M.J.
1983
201-210 1-3 p. 771-776
6 p.
artikel
257 Electronic stopping cross sections for 30–300 keV protons in materials with 23 ⩽ Z 2 ⩽ 30 Mertens, P.
1982
201-210 1-3 p. 57-60
4 p.
artikel
258 Electron transport through foils Kaplanis, S.N.
1982
201-210 1-3 p. 359-365
7 p.
artikel
259 Elemental analysis of algae with PIXE and PIGME MacArthur, J.D.
1983
201-210 1-3 p. 519-524
6 p.
artikel
260 Energy and mass analysis of secondary ions sputtered from metallic targets by MeV heavy ions O'Connor, John P.
1983
201-210 1-3 p. 293-298
6 p.
artikel
261 Energy determination and identification of high energy electrons by energy deposition measurement near the shower maximum Amatuni, Ts.A.
1982
201-210 1-3 p. 183-187
5 p.
artikel
262 Energy loss and energy loss straggling of fast heavy ions in matter Geissel, H.
1982
201-210 1-3 p. 21-29
9 p.
artikel
263 Energy loss measurement in a jet chamber Va'vra, J.
1982
201-210 1-3 p. 109-118
10 p.
artikel
264 Energy-loss radiography with a scanning MeV-ion microprobe Overley, J.C.
1983
201-210 1-3 p. 43-46
4 p.
artikel
265 Energy-loss straggling of protons, deuterons and α-particles in copper Friedland, E.
1981
201-210 1-3 p. 490-494
5 p.
artikel
266 Energy resolution and structure of a calorimeter Vovenko, A.S.
1983
201-210 1-3 p. 155-162
8 p.
artikel
267 Energy resolved spin polarized photoemission from ferromagnets Gudat, W.
1983
201-210 1-3 p. 809-813
5 p.
artikel
268 Enhanced intensity of 7.6 MeV gamma rays from an 241Am/Be source in a multilayered CH2Fe shield Atwater, H.F.
1983
201-210 1-3 p. 555-557
3 p.
artikel
269 Errata 1981
201-210 1-3 p. 603-
1 p.
artikel
270 Errata 1981
201-210 1-3 p. 603-
1 p.
artikel
271 ESCA investigation of ion beam synthesized silicon nitride passivating layers on silicon Yadav, A.D.
1981
201-210 1-3 p. 293-296
4 p.
artikel
272 Etude de la decharge resonnante dans des cavites reentrantes supraconductrices Boussoukaya, M.
1982
201-210 1-3 p. 13-19
7 p.
artikel
273 Evaluation of a liquid metal ion source for secondary ion mass spectrometry Gnaser, H.
1983
201-210 1-3 p. 303-306
4 p.
artikel
274 EXAFS in dispersive mode Flank, A.M.
1983
201-210 1-3 p. 651-654
4 p.
artikel
275 Excited states of sputtered molecules Efstathiou, L.
1982
201-210 1-3 p. 589-591
3 p.
artikel
276 Experimental activity at the adone wiggler facility Burattini, E.
1983
201-210 1-3 p. 91-96
6 p.
artikel
277 Experimental dead-time distortions of poisson processes Faraci, G.
1983
201-210 1-3 p. 307-310
4 p.
artikel
278 Experimental investigations of fast heavy ion induced desorption Dück, P.
1981
201-210 1-3 p. 245-252
8 p.
artikel
279 Experimental study of relative level populations in beam-foil excited Ar7+ and Kr7+ Bashkin, S.
1982
201-210 1-3 p. 369-372
4 p.
artikel
280 Experimental study of the enhanced ion backscattering yield at 180° and its depth dependence Moore, J.A.
1981
201-210 1-3 p. 459-468
10 p.
artikel
281 Experiments on X-ray lithography using synchrotron radiation from the VEPP-2M storage ring Gluskin, E.S.
1983
201-210 1-3 p. 393-398
6 p.
artikel
282 Extraction of a parasitic electron beam and its use for a tagged photon facility at the 600 MeV Saclay linac Veyssière, A.
1983
201-210 1-3 p. 61-72
12 p.
artikel
283 Fabrication method and efficiency of new soft X-ray diffraction gratings: Bakable laminar gratings and transmission gratings for synchrotron radiation spectroscopy Aritome, H.
1983
201-210 1-3 p. 233-236
4 p.
artikel
284 Facility for the measurement of proton polarization in the range 50–70 MeV Nakamura, Masanobu
1983
201-210 1-3 p. 173-184
12 p.
artikel
285 Fast neutron detection with Al2O3 thermoluminescence dosimeter Ranogajec-Komor, Maria
1983
201-210 1-3 p. 383-386
4 p.
artikel
286 Fiber-optics light guides for thin scintillators Yang, Ming-Jen
1981
201-210 1-3 p. 115-117
3 p.
artikel
287 Flexure pivot mirror support Henins, Albert
1983
201-210 1-3 p. 287-289
3 p.
artikel
288 FLIPPER II — a new photoemission system in HASYLAB Johnson, R.L.
1983
201-210 1-3 p. 791-796
6 p.
artikel
289 Foil-excited rydberg states of fast oxygen and sulfur ions Rothermel, J.
1982
201-210 1-3 p. 341-343
3 p.
artikel
290 Foreword 1981
201-210 1-3 p. viii-ix
nvt p.
artikel
291 Formation of CN− radicals by ion implantation Metz, W.A.
1982
201-210 1-3 p. 505-508
4 p.
artikel
292 Free electron laser quantum analysis Dattoli, Giuseppe
1983
201-210 1-3 p. 193-197
5 p.
artikel
293 Front ends for the Photon Factory beam lines Sato, Shigeru
1983
201-210 1-3 p. 31-36
6 p.
artikel
294 Furnace and laser annealing of bismuth implanted silicon Wagh, A.G.
1981
201-210 1-3 p. 96-100
5 p.
artikel
295 Gas re-emission and surface structure due to implantation of helium in nickel Ehrenberg, J.
1982
201-210 1-3 p. 501-504
4 p.
artikel
296 Gated time projection chamber Némethy, Peter
1983
201-210 1-3 p. 273-280
8 p.
artikel
297 Generation of photoneutrons by means of a channeled electron beam Golovkov, V.M.
1983
201-210 1-3 p. 167-172
6 p.
artikel
298 Glancing angle measurements of oxygen depth profiles Bird, J.R.
1981
201-210 1-3 p. 345-348
4 p.
artikel
299 Global track measuring algorithm using roads Fortney, L.R.
1981
201-210 1-3 p. 227-233
7 p.
artikel
300 Grazing incidence monochromator FLIPPER Barth, J.
1983
201-210 1-3 p. 307-312
6 p.
artikel
301 Growth of the avalanche along the anode wire in a gas counter Sanada, Junpei
1982
201-210 1-3 p. 605-607
3 p.
artikel
302 Growth of the avalanche along the anode wire in a gas counter - II Sanada, Junpei
1983
201-210 1-3 p. 291-298
8 p.
artikel
303 Heat extraction from targets in high current electron beams Bubb, Ernest
1982
201-210 1-3 p. 101-106
6 p.
artikel
304 Heavy ion energy straggling Anthony, J.M.
1983
201-210 1-3 p. 803-809
7 p.
artikel
305 Helium-induced hydrogen recoil analysis for metallurgical applications Wielunski, L.S.
1983
201-210 1-3 p. 120-124
5 p.
artikel
306 High depth resolution for profiling carbon by the 12C(3He, α0)11C reaction Gossett, C.R.
1981
201-210 1-3 p. 335-340
6 p.
artikel
307 High dose implantation of xenon into nickel Ingram, D.C.
1982
201-210 1-3 p. 117-119
3 p.
artikel
308 High energy, high current neutral beam injector operation with single stage and two-stage multi-aperture extraction systems Becherer, R.
1982
201-210 1-3 p. 389-402
14 p.
artikel
309 High energy ion microprobes Nobiling, Rainer
1983
201-210 1-3 p. 197-202
6 p.
artikel
310 High-energy mass spectrometry of 10Be using a tandem van de graaff accelerator Moniot, Robert K.
1982
201-210 1-3 p. 495-502
8 p.
artikel
311 High energy proton interactions with Sr and Cs De Felice, P.
1983
201-210 1-3 p. 359-365
7 p.
artikel
312 High-fluence implantations of Ge into 〈111〉 Si Hart, R.R.
1981
201-210 1-3 p. 70-74
5 p.
artikel
313 High flux and high resolution VUV beam line for luminescence spectroscopy Wilcke, H.
1983
201-210 1-3 p. 59-63
5 p.
artikel
314 High-intensity vacuum ultraviolet continuum emission from intense relativistic electron rings Schumacher, U.
1981
201-210 1-3 p. 545-551
7 p.
artikel
315 High performance silicon solar cells using low dose phosphorus implants Blakers, Andrew W.
1981
201-210 1-3 p. 51-53
3 p.
artikel
316 High precision automatic energy scanning of slit stabilized electrostatic accelerators Amsel, G.
1981
201-210 1-3 p. 189-190
2 p.
artikel
317 High precision SIMS measurements of dopant concentration in III–V semiconductors Miller, Jeffrey N.
1983
201-210 1-3 p. 547-550
4 p.
artikel
318 High-pressure device for use in low energy x-ray absorption spectroscopy Röhler, J.
1983
201-210 1-3 p. 647-650
4 p.
artikel
319 High pressure research with synchrotron radiation Buras, B.
1983
201-210 1-3 p. 563-568
6 p.
artikel
320 High resolution depth profiling of F, Ne and Na in materials Deconninck, G.
1983
201-210 1-3 p. 165-170
6 p.
artikel
321 High resolution depth profiling of light elements in high atomic mass materials Thomas, J.P.
1983
201-210 1-3 p. 125-128
4 p.
artikel
322 High resolution RBS and channeling analysis of ion implanted single crystal Fe Short, K.T.
1981
201-210 1-3 p. 537-542
6 p.
artikel
323 High resolution soft X-ray spectrum reconstruction by MWPC attenuation measurements Kosarev, E.L.
1983
201-210 1-3 p. 637-645
9 p.
artikel
324 High resolution techniques for nuclear reaction narrow resonance width measurements and for shallow depth profiling Amsel, G.
1983
201-210 1-3 p. 183-196
14 p.
artikel
325 High resolution time-of-flight measurements in small and large scintillation counters D'Agostini, G.
1981
201-210 1-3 p. 49-65
17 p.
artikel
326 High-resolution X-ray scattering Moncton, D.E.
1983
201-210 1-3 p. 579-586
8 p.
artikel
327 HIXE — A comparison of experimental ionization subshell cross sections with PWBA, PWBAR and CPSSR theories Cohen, D.D.
1981
201-210 1-3 p. 551-557
7 p.
artikel
328 H2 + traversing ultra-thin carbon foils: Cluster effects in the energy loss at 12.5 and 25 keV/amu Levi-Setti, R.
1982
201-210 1-3 p. 281-284
4 p.
artikel
329 H2 + traversing ultra-thin carbon foils: Exiting molecular states at 12.5 and 25 keV/amu Fox, T.R.
1982
201-210 1-3 p. 285-289
5 p.
artikel
330 Hydrogen and chlorine detection at the SiO2/Si interface Tsong, I.S.T.
1981
201-210 1-3 p. 91-95
5 p.
artikel
331 Hydrogen in gas phase and ion implantation doped amorphous silicon Demond, F.J.
1981
201-210 1-3 p. 59-62
4 p.
artikel
332 Hydrogen streamer chamber with laser registration Kalimov, A.G.
1981
201-210 1-3 p. 81-82
2 p.
artikel
333 Impact-energy dependence of the angular distribution of gold sputtered from a (111) crystal at 100 and 300 K Szymczak, W.
1982
201-210 1-3 p. 561-565
5 p.
artikel
334 Implantation induced diamond to amorphous-carbon transition studied by conversion electron Mössbauer spectroscopy Sawicki, J.A.
1982
201-210 1-3 p. 465-469
5 p.
artikel
335 Improvement of gas efficiency of negative ion sources Whealton, J.H.
1981
201-210 1-3 p. 25-27
3 p.
artikel
336 Incremental deconvolution I algorithm development and assessment Kennett, T.J.
1982
201-210 1-3 p. 317-327
11 p.
artikel
337 Inelastic scattering of channeled charged particles by phonon excitation Fedyanin, V.K.
1982
201-210 1-3 p. 147-152
6 p.
artikel
338 Influence of damage on the thermal release of deuterium implants in graphite Scherzer, B.M.U.
1982
201-210 1-3 p. 497-500
4 p.
artikel
339 Infrared FEL microtron operation at the ENEA center of Frascati Bizzarri, U.
1983
201-210 1-3 p. 177-183
7 p.
artikel
340 Initial operation of a 5 T superconducting wiggler magnet in the SRS Marks, N.
1983
201-210 1-3 p. 97-103
7 p.
artikel
341 Inner shell ionization by molecular ion bombardment on solid foils Yamazaki, Y.
1982
201-210 1-3 p. 323-325
3 p.
artikel
342 In situ Rutherford backscattering analysis of radiation-induced segregation Averback, R.S.
1982
201-210 1-3 p. 457-460
4 p.
artikel
343 In situ rutherford backscattering measurements of ion-beam-induced atomic mixing Jorch, H.H.
1983
201-210 1-3 p. 703-706
4 p.
artikel
344 Instrumental cross-contamination in the Cameca IMS-3F secondary ion microscope Deline, Vaughn R.
1983
201-210 1-3 p. 316-318
3 p.
artikel
345 Instrumentation for real-time x-ray topography Queisser, H.-J.
1983
201-210 1-3 p. 691-695
5 p.
artikel
346 Interactive computer analysis of nuclear backscattering spectra Saunders, Philip A.
1983
201-210 1-3 p. 67-74
8 p.
artikel
347 Interatomic potential considerations in low energy ion scattering Cruz, S.A.
1982
201-210 1-3 p. 659-661
3 p.
artikel
348 Intercomparison of absolute standards for RBS studies Cohen, C.
1983
201-210 1-3 p. 147-148
2 p.
artikel
349 Interferometric investigation of the SiSiO2 interregion at wavelengths of 110–130 Å Blau, W.
1983
201-210 1-3 p. 605-608
4 p.
artikel
350 Inter-laboratory standardization of glass dosimeters Modgil, S.K.
1983
201-210 1-3 p. 367-370
4 p.
artikel
351 Interpretation of activation measurements at the princeton large torus vessel in terms of isotropic and anisotropic neutron emission Pedretti, Edmondo
1982
201-210 1-3 p. 409-414
6 p.
artikel
352 Interstitial trapping in Fe-implanted Al after excimer laser annealing Swanson, M.L.
1983
201-210 1-3 p. 643-646
4 p.
artikel
353 Intrinsic and effective sensitivities of analysis by X-ray fluorescence induced by protons, electrons, and photons Grodzins, L.
1983
201-210 1-3 p. 203-208
6 p.
artikel
354 Investigation of a moderated SB-Be-photoneutron source and its application to the determination of the neutron importance function Albert, Dietmar
1981
201-210 1-3 p. 387-392
6 p.
artikel
355 Investigation of carbon contamination of mirror surfaces exposed to synchrotron radiation Boller, K.
1983
201-210 1-3 p. 273-279
7 p.
artikel
356 Investigation of damage produced by self-implantation of tellurium Wu, M.F.
1983
201-210 1-3 p. 652-657
6 p.
artikel
357 Investigation of soft upsets in integrated circuit memories and charge collection in semiconductor test structures by the use of an ion microbeam Knudson, A.R.
1983
201-210 1-3 p. 625-631
7 p.
artikel
358 Investigation of soft upsets in MOS memories with a microbeam Campbell, A.B.
1981
201-210 1-3 p. 437-442
6 p.
artikel
359 Investigation of X-ray exposure using plane scanning mirrors Bieber, M.
1983
201-210 1-3 p. 281-286
6 p.
artikel
360 Ion beam analysis in archaeology Huan-sheng Chen,
1981
201-210 1-3 p. 391-396
6 p.
artikel
361 Ion beam analysis of beam processing operations Gibbons, J.F.
1981
201-210 1-3 p. 115-118
4 p.
artikel
362 Ion beam analysis of defect trapping Swanson, M.L.
1983
201-210 1-3 p. 613-624
12 p.
artikel
363 Ion beam analysis of niobium-vanadium alloys Martin, P.J.
1981
201-210 1-3 p. 275-281
7 p.
artikel
364 Ion beam analysis of powdered samples Sellschop, J.P.F.
1983
201-210 1-3 p. 593-597
5 p.
artikel
365 Ion beam analysis of semiconductor interfaces Poate, J.M.
1981
201-210 1-3 p. 39-46
8 p.
artikel
366 Ion beam analysis techniques and characterization of amorphous hydrogenated GaAs Thomas, J.P.
1983
201-210 1-3 p. 579-583
5 p.
artikel
367 Ion beam crystallography of surfaces and interfaces Saris, F.W.
1982
201-210 1-3 p. 625-632
8 p.
artikel
368 Ion beam detection of the austenitic-martensitic phase transformation of single crystal stainless steel Besenbacher, Flemming
1983
201-210 1-3 p. 551-554
4 p.
artikel
369 Ion beam dosimetry by Rutherford backscattering with continuous rotation of the sample Hemment, P.L.F.
1983
201-210 1-3 p. 103-106
4 p.
artikel
370 Ion beam induced radiation defects and stimulated trapping efficiency Karpuzov, D.S.
1982
201-210 1-3 p. 477-483
7 p.
artikel
371 Ion beam lithography Brown, W.L.
1981
201-210 1-3 p. 157-168
12 p.
artikel
372 Ion beam mixing of CuAu and CuW systems Westendorp, Han
1982
201-210 1-3 p. 453-456
4 p.
artikel
373 Ion channeling and TEM studies of pulse melted Fe(Pd) alloys Knapp, J.A.
1983
201-210 1-3 p. 542-546
5 p.
artikel
374 Ion channeling study of radiation induced defects in a bent silicon crystal Wang, G.H.
1983
201-210 1-3 p. 669-672
4 p.
artikel
375 Ion desorption spectrometry: A new method of surface investigation Schneider, Peter J.
1983
201-210 1-3 p. 713-718
6 p.
artikel
376 Ion-electron emission from magnetostrictive alloy Soszka, M.
1983
201-210 1-3 p. 782-784
3 p.
artikel
377 Ion implantation of carbon in diamond Derry, T.E.
1981
201-210 1-3 p. 23-26
4 p.
artikel
378 Ion implanted nuclear radiation detectors passivated with anodic silicon oxide Von Borany, J.
1983
201-210 1-3 p. 489-492
4 p.
artikel
379 Ion implant gettering of generation impurities in silicon investigated using PIXE and Rutherford backscattering spectrometry Golja, B.
1981
201-210 1-3 p. 63-69
7 p.
artikel
380 Ion-induced chemistry in condensed gas solids Boring, J.W.
1983
201-210 1-3 p. 707-711
5 p.
artikel
381 Ion induced electron emission from polycrystalline copper Holmén, G.
1981
201-210 1-3 p. 523-532
10 p.
artikel
382 Ion-induced high density excitation in ionic crystals Matsunami, N.
1982
201-210 1-3 p. 39-43
5 p.
artikel
383 Ionization cross-sections in the case of medium and low energy heavy charged particles crossing complex media Senger, Bernard
1982
201-210 1-3 p. 437-441
5 p.
artikel
384 Ionization of atoms sputtered from AIIIBV compounds Šroubek, Z.
1983
201-210 1-3 p. 336-339
4 p.
artikel
385 Ion multiple scattering: A tool for studying the thickness topography of self-supporting targets Schmaus, D.
1982
201-210 1-3 p. 81-85
5 p.
artikel
386 Ion neutralisation in secondary ion mass spectrometry Garrett, R.F.
1983
201-210 1-3 p. 333-335
3 p.
artikel
387 Ion range and damage depth parameters for 20–200 keV Pb+ ion implantation in Si Christodoulides, C.E.
1981
201-210 1-3 p. 124-134
11 p.
artikel
388 Ion-source dependence of the distributions of internuclear separations in 2 MeV HeH+ beams Kanter, Elliot P.
1982
201-210 1-3 p. 307-310
4 p.
artikel
389 Ion sputtered deposit analysis by electron microscopy Lundquist, T.R.
1983
201-210 1-3 p. 563-565
3 p.
artikel
390 Ion time-of-flight spectroscopy: Krypton charge state spectra as a function of photon excitation energy near the K edge Hastings, J.B.
1983
201-210 1-3 p. 815-818
4 p.
artikel
391 Kinematically complete angular correlation experiments with position insensitive large area detectors Wick, Klaus
1982
201-210 1-3 p. 243-254
12 p.
artikel
392 Kinetic energy distributions of sputtered particles in non-casade sputtering processes Ziv, A.R.
1983
201-210 1-3 p. 742-746
5 p.
artikel
393 K-Vector selection for electron capture at metal surfaces Schröder, H.
1982
201-210 1-3 p. 381-385
5 p.
artikel
394 Large angle differential scattering cross-sections for various ions (2 ⩽ Z 1 ⩽ 10) in the 65–135 keV energy range Poehlman, W.F.S.
1981
201-210 1-3 p. 495-499
5 p.
artikel
395 Large area position-sensitive channel-plate detector system and ΔE-E ionization chamber for a time-of-flight spectrometer Renfordt, R.E.
1981
201-210 1-3 p. 157-163
7 p.
artikel
396 Large proportional chambers for muon detection in the CELLO experiment at petra Aleksan, R.
1981
201-210 1-3 p. 95-105
11 p.
artikel
397 Large scintillation cells for high sensitivity radon concentration measurements Cohen, B.L.
1983
201-210 1-3 p. 403-412
10 p.
artikel
398 Lateral variation measurement of helium concentration in implanted Al foils using a proton microbeam Bodart, F.
1983
201-210 1-3 p. 529-532
4 p.
artikel
399 Latest news from the ESF 1981
201-210 1-3 p. 559-580
22 p.
artikel
400 Lattice deformation and impurity location of Bi implanted Si induced by pulsed laser annealing De-xin, Cao
1981
201-210 1-3 p. 54-58
5 p.
artikel
401 Layered synthetic microstructures: Measurements and applications Day, Robert
1983
201-210 1-3 p. 245-249
5 p.
artikel
402 Li, B and N in ancient materials Fink, D.
1983
201-210 1-3 p. 456-462
7 p.
artikel
403 Linearity and stability tests of photomultipliers with two-stage amplifiers for the electromagnetic calorimeter of the UA1-experiment Pernicka, M.
1982
201-210 1-3 p. 281-285
5 p.
artikel
404 Liquid and solid argon, and nitrogen-doped liquid and solid argon scintillators Himi, Susumu
1982
201-210 1-3 p. 153-157
5 p.
artikel
405 Liquid metal ion sources: Mechanism and applications Swanson, L.W.
1983
201-210 1-3 p. 347-353
7 p.
artikel
406 Low energy ion scattering for the determination of the locations of surface atoms Niehus, H.
1983
201-210 1-3 p. 230-234
5 p.
artikel
407 Low-energy ion scattering from the Si(111) surface: Analysis of the clean 7×7 and Te-stabilized “1×1” structures Aono, M.
1983
201-210 1-3 p. 241-247
7 p.
artikel
408 Low energy ion scattering study of MoO3BiPO4 biphase catalysts Bertrand, P.
1983
201-210 1-3 p. 249-252
4 p.
artikel
409 Low energy ion scattering study of palladium films on silicon(111)-7 × 7 surfaces Oura, K.
1983
201-210 1-3 p. 253-256
4 p.
artikel
410 Low energy range distributions of 10B and 11B in amorphous and crystalline silicon Wach, W.
1982
201-210 1-3 p. 113-116
4 p.
artikel
411 Low-energy separated beam K3 at KEK Kurokawa, Shin-ichi
1983
201-210 1-3 p. 91-100
10 p.
artikel
412 Low-temperature and time-resolved protein crystallography using synchrotron radiation Bartunik, H.D.
1983
201-210 1-3 p. 523-533
11 p.
artikel
413 Low-temperature ion-beam mixing of platinum markers in iron Bøttiger, J.
1983
201-210 1-3 p. 684-686
3 p.
artikel
414 L subshell ionization cross section for light ion bombardment of high Z targets Cohen, D.D.
1983
201-210 1-3 p. 795-798
4 p.
artikel
415 Mass-separated microbeam system with a liquid-metal-ion source Ishitani, T.
1983
201-210 1-3 p. 363-367
5 p.
artikel
416 Mass spectrometric study of the negatively-charged krypton and xenon monofluorides Minehara, Eisuke
1983
201-210 1-3 p. 533-537
5 p.
artikel
417 Materials analysis with an external beam proton microprobe Macarthur, J.D.
1981
201-210 1-3 p. 204-210
7 p.
artikel
418 Maximum-efficiency transmission grating profiles for metals in the soft X-ray range Tatchyn, R.
1983
201-210 1-3 p. 237-243
7 p.
artikel
419 Measurement and parametrization of the response of NE102 to fast neutrons Martin Jr, S.D.
1981
201-210 1-3 p. 287-289
3 p.
artikel
420 Measurement of a magnetic field integral using the Faraday effect Robertson, J.L.
1982
201-210 1-3 p. 87-92
6 p.
artikel
421 Measurement of the parameters of a linear CCD structure as a one-dimensional X-ray imaging detector Fedotov, M.G.
1983
201-210 1-3 p. 427-433
7 p.
artikel
422 Measurements of atomic ƒ-values by magneto-rotation in the VUV Alexa, B.
1983
201-210 1-3 p. 841-843
3 p.
artikel
423 Measurements of partial and differential photoionization cross sections of helium and diatomic molecules in the 15–100 eV range by angular electron spectroscopy Morin, P.
1983
201-210 1-3 p. 761-766
6 p.
artikel
424 Measurements of the wavelength of the polarization wake in carbon and aluminium Kumbartzki, G.J.
1982
201-210 1-3 p. 291-293
3 p.
artikel
425 Metal deposition for microelectronic applications studied by RBS technique Eskildsen, Svend Stensig
1983
201-210 1-3 p. 485-488
4 p.
artikel
426 Metal doped fluorocarbon polymer films prepared by plasma polymerization using an RF planar magnetron target Biederman, H.
1983
201-210 1-3 p. 497-503
7 p.
artikel
427 MeV backscattering analysis of annealing behaviors of ion-implanted arsenic in silicon Inada, T.
1983
201-210 1-3 p. 607-611
5 p.
artikel
428 Microanalysis of fluorine by nuclear reactions Maurel, B.
1981
201-210 1-3 p. 349-356
8 p.
artikel
429 Microbeam analysis of deuterium in carbon probes exposed to plasma in the DITE tokamak Sofield, C.J.
1981
201-210 1-3 p. 383-390
8 p.
artikel
430 Microbeam analysis of hydrogen in coked catalyst pellets Sofield, C.J.
1981
201-210 1-3 p. 379-382
4 p.
artikel
431 Mirrors, gratings and a monochromator for use with synchrotron radiation Franks, A.
1983
201-210 1-3 p. 223-226
4 p.
artikel
432 Modelling a soft X-ray wunder Hecht, M.H.
1983
201-210 1-3 p. 113-116
4 p.
artikel
433 Modern problems of low-velocity stopping powers Brandt, Werner
1981
201-210 1-3 p. 453-461
9 p.
artikel
434 Molecular and atomic adsorption on surfaces: Can SIMS differentiate between the two cases? Passler, M.A.
1981
201-210 1-3 p. 323-326
4 p.
artikel
435 Molecular ion structure with a charge-coupled device Algranati, M.
1982
201-210 1-3 p. 303-305
3 p.
artikel
436 Monochromator crystals for synchrotron radiation use in the energy region 550–5000 eV Hussain, Z.
1983
201-210 1-3 p. 333-334
2 p.
artikel
437 Monte Carlo calculation of accurate response functions for a NaI(Tl) detector for gamma rays Saito, Kimiaki
1981
201-210 1-3 p. 299-308
10 p.
artikel
438 Monte Carlo calculation of energy spectrum and spatial distribution of photons from positron annihilation Capitani, G.P.
1982
201-210 1-3 p. 353-358
6 p.
artikel
439 Monte Carlo calculation of the distributions of interatomic separation and relative velocity resulting from the dissociation of fast molecular ions by thin foils Schectman, Richard M.
1982
201-210 1-3 p. 295-297
3 p.
artikel
440 Monte Carlo calculations of channeling radiation and comparison with experiment Bloom, S.D.
1982
201-210 1-3 p. 229-233
5 p.
artikel
441 Morphological change and crystal structure of skeletal muscle actin Taniguchi, Mieko
1983
201-210 1-3 p. 541-544
4 p.
artikel
442 Multilayer mirrors for soft X-ray and VUV radiation Gaponov, S.V.
1983
201-210 1-3 p. 227-231
5 p.
artikel
443 Multiple-collision analysis of characteristic X-rays from low-energy Ar2+ travelling in solid targets Cipolla, Sam J.
1983
201-210 1-3 p. 777-781
5 p.
artikel
444 Multiple scattering from an infinite plane slab Soper, A.K.
1983
201-210 1-3 p. 337-347
11 p.
artikel
445 Multiple scattering of MeV light ions transmitted through thin Al2O3 films: Detailed analysis of angular distributions Schmaus, D.
1982
201-210 1-3 p. 75-79
5 p.
artikel
446 Multi-wire proportional counter for soft x-ray detection Källne, J.
1982
201-210 1-3 p. 415-418
4 p.
artikel
447 Nanosecond resolved X-ray diffraction during pulsed laser annealing of silicon Mills, D.M.
1983
201-210 1-3 p. 511-517
7 p.
artikel
448 Neutralisation effects in low energy ion scattering Woodruff, D.P.
1982
201-210 1-3 p. 639-647
9 p.
artikel
449 Neutron depth profiling at the National Bureau of Standards Downing, R.G.
1983
201-210 1-3 p. 47-51
5 p.
artikel
450 Neutron flux measurements around the Princeton large tokamak Zankl, G.
1981
201-210 1-3 p. 321-329
9 p.
artikel
451 Neutron sensitivity of LR 115 SSNTD using different (n, α) radiators Pálfavi, József
1982
201-210 1-3 p. 451-457
7 p.
artikel
452 Neutron spectral unfolding using the Monte Carlo method O'Brien, Keran
1981
201-210 1-3 p. 277-286
10 p.
artikel
453 New method for the production of polarized 3He ions based on the 23S1 state of 3He Slobodrian, R.J.
1981
201-210 1-3 p. 581-583
3 p.
artikel
454 New trends in EXAFS Lagarde, P.
1983
201-210 1-3 p. 621-624
4 p.
artikel
455 Nitrogen depth profiling using the 14N(n,p)4C reaction Fink, D.
1983
201-210 1-3 p. 171-175
5 p.
artikel
456 Noise in resistive charge-division position-sensing methods Vermeulen, J.C.
1981
201-210 1-3 p. 591-593
3 p.
artikel
457 Nolin: Nonlinear analysis of complex alpha spectra Garcia-Toraño, E.
1981
201-210 1-3 p. 261-269
9 p.
artikel
458 Non-vacuum Rutherford backscattering spectrometry Doyle, B.L.
1983
201-210 1-3 p. 29-32
4 p.
artikel
459 Nuclear Physics Methods in Materials Research Karlsson, Erik
1981
201-210 1-3 p. 604-
1 p.
artikel
460 Observation of large saturated pulses in wire chambers filled with argon-carbon dioxide mixtures Mulera, T.A.
1982
201-210 1-3 p. 609-611
3 p.
artikel
461 One-coordinate X-ray detector Aultchenko, V.M.
1983
201-210 1-3 p. 443-444
2 p.
artikel
462 On fission experiments by means of a quasi-monochromatic photon beam at the frascati linac De Sanctis, E.
1982
201-210 1-3 p. 227-233
7 p.
artikel
463 On the accuracy of track reconstruction with inhomogeneous magnetic detectors Mecking, B.
1982
201-210 1-3 p. 299-305
7 p.
artikel
464 On the cleaning of heavy-ion source anodes Rogers, R.C.
1981
201-210 1-3 p. 585-
1 p.
artikel
465 On the nuclear charge and atomic mass of attenuated mean fission fragments Laichter, Y.
1982
201-210 1-3 p. 45-50
6 p.
artikel
466 On the origin of sputtered excited atoms Kelly, Roger
1982
201-210 1-3 p. 583-588
6 p.
artikel
467 On the possibility of immediate analysis of chlorine and sulfur in air by argon ion induced X-ray emission Heitz, Ch.
1981
201-210 1-3 p. 558-564
7 p.
artikel
468 On the shapes of high-resolution Rutherford backscattering spectra Butler, J.W.
1981
201-210 1-3 p. 516-520
5 p.
artikel
469 On the use of cellulose nitrate as solid state nuclear track detector Lück, H.B.
1983
201-210 1-3 p. 483-487
5 p.
artikel
470 On the use of cellulose nitrate as solid state nuclear track detector Lück, H.B.
1983
201-210 1-3 p. 479-482
4 p.
artikel
471 Optical behaviour of acceleration tubes studied in bremsstrahlung measurements Kiss, Á.Z.
1983
201-210 1-3 p. 81-89
9 p.
artikel
472 Optical design for the NSLS crystallography beam line Hastings, J.B.
1983
201-210 1-3 p. 55-58
4 p.
artikel
473 Optical resolution of beam cross-section measurements by means of synchrotron radiation Hofmann, A.
1982
201-210 1-3 p. 483-493
11 p.
artikel
474 Optimisation of a synchrotron radiation source Thompson, D.J.
1983
201-210 1-3 p. 1-10
10 p.
artikel
475 Optimization and application of glancing angle Rutherford backscattering spectrometry Tamminga, Y.
1983
201-210 1-3 p. 107-110
4 p.
artikel
476 Optimization of parameters of a dedicated synchrotron radiation source for technology Korchuganov, V.N.
1983
201-210 1-3 p. 11-18
8 p.
artikel
477 Optimum sample utilization in secondary ion mass spectrometry Liebl, Helmut
1981
201-210 1-3 p. 183-188
6 p.
artikel
478 Opto-electronic system for automatic track counting in plastic SSNTD Flores, R.
1983
201-210 1-3 p. 375-381
7 p.
artikel
479 Organizing Committees 1983
201-210 1-3 p. vi-
1 p.
artikel
480 Oriented indium metallic aggregates in implanted LiF single crystals Fritsch, L.
1982
201-210 1-3 p. 461-464
4 p.
artikel
481 Outer-shell electronic processes in Ne+ collisions with a Ni(110) surface Tsong, I.S.T.
1982
201-210 1-3 p. 655-658
4 p.
artikel
482 Oxygen and hydrogen on the surface of diamond Derry, T.E.
1983
201-210 1-3 p. 559-562
4 p.
artikel
483 Oxygen-concentration dependent enhancement of positive secondary ion emission from silicon Gnaser, H.
1983
201-210 1-3 p. 312-315
4 p.
artikel
484 Particle identification in an electron/hadron calorimeter Bleichert, Bernd-Michael
1983
201-210 1-3 p. 145-153
9 p.
artikel
485 Particle identification through the measurement of the Bragg curve centroid Kimura, Kikuo
1983
201-210 1-3 p. 227-234
8 p.
artikel
486 Particle-size effects in non-destructive material assay by gamma-ray absorptiometry I. Theoretical model The, H.L.
1983
201-210 1-3 p. 445-461
17 p.
artikel
487 Pattern recognition in layered track chambers using a tree algorithm Cassel, D.G.
1981
201-210 1-3 p. 235-251
17 p.
artikel
488 Peculiar effects induced by statistical processes related to fast particle-matter interactions in dilute and dense media Amsel, G.
1982
201-210 1-3 p. 1-12
12 p.
artikel
489 Performance characteristics of large aperture, ten-cell atmospheric pressure isobutane Cherenkov counters Hylen, J.
1981
201-210 1-3 p. 107-114
8 p.
artikel
490 Performance of a recoil mass spectrometer Cormier, T.M.
1983
201-210 1-3 p. 185-193
9 p.
artikel
491 Periodicity of the degree of positive ionization of sputtered atoms in the conception of thermal spikes Jurela, Z.
1982
201-210 1-3 p. 597-601
5 p.
artikel
492 Perspectives of production of coherent VUV with transverse optical klystrons Coisson, R.
1983
201-210 1-3 p. 185-188
4 p.
artikel
493 Perturbation of L X-rays emitted by swift heavy-ion projectiles Hay, H.J.
1982
201-210 1-3 p. 349-351
3 p.
artikel
494 Photodiode readout for scintillating crystals of BGO and Nal(Tl) Blanar, G.
1982
201-210 1-3 p. 213-221
9 p.
artikel
495 Photoelectron spectrometer for high resolution angular resolved studies Parr, Albert C.
1983
201-210 1-3 p. 767-770
4 p.
artikel
496 Photoemission from atoms and molecules Sonntag, B.
1983
201-210 1-3 p. 735-752
18 p.
artikel
497 Photoemission from solids Himpsel, F.J.
1983
201-210 1-3 p. 753-760
8 p.
artikel
498 Photoemissive effects and associated stresses in ultrafine transmission grating structures irradiated with synchrotron light Tatchyn, R.
1981
201-210 1-3 p. 553-558
6 p.
artikel
499 Photon emission from sputtered atoms as a function of the phase transition in the targets Gabła, Lubomir
1982
201-210 1-3 p. 603-605
3 p.
artikel
500 PIN diodes as detectors in the energy region 500 eV–10 keV Jach, Terrence
1983
201-210 1-3 p. 423-425
3 p.
artikel
501 PIXE analysis of compound materials Kalish, R.
1983
201-210 1-3 p. 415-419
5 p.
artikel
502 Planar dechanneling studies of strained-layer superlattice structures Chu, W.K.
1983
201-210 1-3 p. 81-89
9 p.
artikel
503 Plasma delay of 238U ions in surface barrier detectors Neidel, H.-O.
1983
201-210 1-3 p. 299-300
2 p.
artikel
504 Polarisation determination of monochromatized synchrotron radiation Derenbach, H.
1983
201-210 1-3 p. 845-847
3 p.
artikel
505 Polarisation properties of bremsstrahlung produced by electron opaque targets of low-Z elements with application to X-ray fluorescence analysis Sikanen, P.
1983
201-210 1-3 p. 469-473
5 p.
artikel
506 Polarized neutron set-up for experimental study of the neutron nuclear precession Tsulaya, M.I.
1981
201-210 1-3 p. 497-504
8 p.
artikel
507 Position sensitive multiwire proportional parallel plate detector for heavy ions Mazur, C.
1983
201-210 1-3 p. 203-208
6 p.
artikel
508 Positron analysis as a quantitative technique in ion beam analysis Sellschop, J.P.F.
1983
201-210 1-3 p. 23-28
6 p.
artikel
509 Possibility of a high-resolution nuclear radiation detector using a superconductor Kurakado, M.
1981
201-210 1-3 p. 141-147
7 p.
artikel
510 Possibility of a high-resolution nuclear radiation detector using a superconductor Kurakado, M.
1981
201-210 1-3 p. 149-155
7 p.
artikel
511 Possible applications of the steering of charged particles by bent single crystals Carrigan Jr., R.A.
1982
201-210 1-3 p. 205-208
4 p.
artikel
512 Practical prototype of a cluster-counting transition radiation detector Fabjan, C.W.
1981
201-210 1-3 p. 119-124
6 p.
artikel
513 Precise measurements of gamma ray energies and intensities in the 166mHo decay Sooch, S.S.
1982
201-210 1-3 p. 339-341
3 p.
artikel
514 Precision measurements of gamma-ray intensities IV. Low energy region: 75Se and 133Ba Yoshizawa, Yasukazu
1983
201-210 1-3 p. 249-257
9 p.
artikel
515 Precision measurements of gamma-ray intensities V. 160Tb, 168Tm and 182Ta Jin, Jilong
1983
201-210 1-3 p. 259-271
13 p.
artikel
516 Precision standard reference targets for microanalysis by nuclear reactions Amsel, G.
1983
201-210 1-3 p. 177-182
6 p.
artikel
517 Preface 1983
201-210 1-3 p. vii-
1 p.
artikel
518 Preliminary design of a 6 pole, 5 T wiggler for the Hefei synchrotron light source Qi-rui, Zhang
1983
201-210 1-3 p. 149-150
2 p.
artikel
519 Preparation de cibles tritiees dans un absorbent de zirconium Bonetti, C.
1982
201-210 1-3 p. 595-596
2 p.
artikel
520 Present status of the photon factory Kohra, K.
1983
201-210 1-3 p. 23-30
8 p.
artikel
521 Primary recoil contribution to low energy light ion sputtering Littmark, U.
1982
201-210 1-3 p. 607-610
4 p.
artikel
522 Probability and statistics in particle physics Brandt, S.
1981
201-210 1-3 p. 604-
1 p.
artikel
523 Probing of lattice defects by radioactive atoms Wichert, Th.
1983
201-210 1-3 p. 633-638
6 p.
artikel
524 Production of intense beams of polarized negative hydrogen ions by double charge exchange in alkali vapour Gruëbler, W.
1983
201-210 1-3 p. 1-4
4 p.
artikel
525 Production of optically thin free-standing oil films from the edge of a rotating disc Cramer, John G.
1981
201-210 1-3 p. 29-32
4 p.
artikel
526 Profile deconvolution method for small computers Verma, Ravi
1983
201-210 1-3 p. 323-326
4 p.
artikel
527 Profile distortions and atomic mixing in SIMS analysis using oxygen primary ions Wittmaack, K.
1981
201-210 1-3 p. 327-334
8 p.
artikel
528 Projectile charge state distributions in close, fast heavy ion-atom collisions: dependence on target thickness and inner shell vacancy production Maor, D.
1982
201-210 1-3 p. 377-380
4 p.
artikel
529 Project of a photoelectron X-ray microscope on aco storage ring Polack, F.
1983
201-210 1-3 p. 373-377
5 p.
artikel
530 Prompt ion-induced autoradiography and its application for the determination of deuterium Ilić, Radomir
1981
201-210 1-3 p. 505-512
8 p.
artikel
531 Proton energies at the maximum of the electronic stopping cross section in materials with 57⩽Z 2⩽83 Krist, Th.
1983
201-210 1-3 p. 790-794
5 p.
artikel
532 Proton microprobe dating of natural zircons Lucas, M.A.
1981
201-210 1-3 p. 34-38
5 p.
artikel
533 Proton-proton scattering as a tool for hydrogen profiling in thin films for semiconductor technology Paduschek, P.
1981
201-210 1-3 p. 75-79
5 p.
artikel
534 Pulse amplitude method for determining the pyroelectric coefficient of pyroelectric materials Tuzzolino, A.J.
1983
201-210 1-3 p. 505-516
12 p.
artikel
535 Pulsed ion beam irradiation of silicon Chu, W.K.
1982
201-210 1-3 p. 443-447
5 p.
artikel
536 Pulsed proton beam annealing: Semiconductors and silicides Baglin, J.E.E.
1981
201-210 1-3 p. 169-176
8 p.
artikel
537 Pulse triggering mechanism of air proportional counters Aoyama, Takahiko
1983
201-210 1-3 p. 281-289
9 p.
artikel
538 Quantification of hydrogen in solids by two methods of ion beam analysis Madiba, C.C.P.
1983
201-210 1-3 p. 409-414
6 p.
artikel
539 Quantitative analysis of buried interfacial impurity layers by SIMS and RBS Williams, Peter
1981
201-210 1-3 p. 318-322
5 p.
artikel
540 Quantitative analysis of first and second surface layers by LEIS (TOF) Buck, T.M.
1983
201-210 1-3 p. 257-265
9 p.
artikel
541 Quantitative analysis of light elements in a heavy material by high energy ion recoil (heir) spectrometry Moreau, C.
1983
201-210 1-3 p. 111-115
5 p.
artikel
542 Quantitative mapping of atomic species by X-ray absorption spectroscopy and contact microradiography Bigler, E.
1983
201-210 1-3 p. 387-392
6 p.
artikel
543 Quantitative SIMS analysis of hydrogenated amorphous silicon using superimposed deuterium implant standards Williams, Peter
1983
201-210 1-3 p. 299-302
4 p.
artikel
544 Quantum beat study of the He+ beam-carbon foil interaction Denis, A.
1982
201-210 1-3 p. 363-367
5 p.
artikel
545 Radiation damage in InSb single crystals by α-particle bombardment Friedland, E.
1983
201-210 1-3 p. 658-662
5 p.
artikel
546 Radiation damage of the HEAO C-1 germanium detectors Mahoney, W.A.
1981
201-210 1-3 p. 449-458
10 p.
artikel
547 Radiation from an electron moving in a “short” magnet Bagrov, V.G.
1983
201-210 1-3 p. 167-169
3 p.
artikel
548 Radiation from axially channeled electrons at low energies Komaki, K.
1982
201-210 1-3 p. 243-246
4 p.
artikel
549 Radiation from 10 GeV positrons channeled in silicon crystals Filatova, N.A.
1982
201-210 1-3 p. 239-241
3 p.
artikel
550 Radiation from planar channeled electrons at high energies Pathak, Anand P.
1982
201-210 1-3 p. 251-253
3 p.
artikel
551 Radon concentration and exhalation measurement with a semiconductor detector and an electrostatic precipitator working in a closed circulation system Wójcik, Marcin
1983
201-210 1-3 p. 393-402
10 p.
artikel
552 Radon/thoron detection properties of a CR-39 plastic track detector Khan, Hameed A.
1981
201-210 1-3 p. 401-405
5 p.
artikel
553 Range distributions of energetic ions Cowern, N.E.B.
1982
201-210 1-3 p. 101-104
4 p.
artikel
554 Ranges of 3He and 6Li in various solids Fink, D.
1982
201-210 1-3 p. 105-111
7 p.
artikel
555 Ranges of some 20–100 keV light ions in Si and Ge Paltemaa, R.
1983
201-210 1-3 p. 785-789
5 p.
artikel
556 Ranges, reflection and secondary electron emission for keV hydrogen ions incident on solid N2 Børgesen, Peter
1983
201-210 1-3 p. 517-528
12 p.
artikel
557 Rare isotope detection with tandem accelerators Rucklidge, J.C.
1981
201-210 1-3 p. 1-9
9 p.
artikel
558 Raytracing facilities at Daresbury laboratory Hubbard, David J.
1983
201-210 1-3 p. 319-326
8 p.
artikel
559 RBS measurements of compositional change of alloys induced by ion bombardment Nakamura, H.
1981
201-210 1-3 p. 119-123
5 p.
artikel
560 Real-time video imaging of synchrotron X-ray topographs: Moving multiple diffraction stripes Tuomi, Turkka
1983
201-210 1-3 p. 697-700
4 p.
artikel
561 Real-time X-ray diffraction using synchrotron radiation: System characterization and applications Caffrey, Martin
1983
201-210 1-3 p. 495-510
16 p.
artikel
562 Recent advances in topography instrumentation Miltat, Jacques
1983
201-210 1-3 p. 685-690
6 p.
artikel
563 Rediscovering the gas-filled photodiode Sauli, F.
1982
201-210 1-3 p. 601-604
4 p.
artikel
564 Refined universal potentials in atomic collisions Biersack, J.P.
1982
201-210 1-3 p. 93-100
8 p.
artikel
565 Removal of interference effect in the calculation of photonuclear cross-sections Ahsan, M.H.
1983
201-210 1-3 p. 333-335
3 p.
artikel
566 Resonant coherent excitation of fast heavy ions in crystals Moak, C.D.
1982
201-210 1-3 p. 327-336
10 p.
artikel
567 Response characteristics of cellulose nitrate track-detectors to radon and radon-daughter mixtures Knöfel, T.M.J.
1983
201-210 1-3 p. 387-392
6 p.
artikel
568 Reversibility effects in disordered and ordered solids leading to scattered-ion yield enhancements near 180° Appleton, B.R.
1981
201-210 1-3 p. 507-515
9 p.
artikel
569 Review on kinetic ion-electron emission from solid metallic targets Benazeth, N.
1982
201-210 1-3 p. 405-413
9 p.
artikel
570 Revised theory of pierce-type electron guns Sar-El, H.Z.
1982
201-210 1-3 p. 21-33
13 p.
artikel
571 Roman Laubert 1938–1981 Brandt, Werner
1982
201-210 1-3 p. 391-393
3 p.
artikel
572 Round Robin comparison of low energy ion scattering by ESA, time-of-flight, stripping technique and computer simulation Buck, T.M.
1982
201-210 1-3 p. 649-653
5 p.
artikel
573 Rutherford backscattering analysis of multilayered CrNi structures to be used for sputtering standards Simons, Donald G.
1983
201-210 1-3 p. 585-588
4 p.
artikel
574 Rutherford backscattering analysis of silicide formation in MoSi structures by ion implantation Inada, T.
1983
201-210 1-3 p. 567-572
6 p.
artikel
575 Rutherford backscattering and channeling analysis of epitaxial, low-mass films on high-mass substrates Golecki, I.
1983
201-210 1-3 p. 63-66
4 p.
artikel
576 Sagittal focusing of synchrotron radiation Batterman, Boris W.
1983
201-210 1-3 p. 327-331
5 p.
artikel
577 Scanning MeV-ion microprobe for light and heavy ions Lefevre, H.W.
1983
201-210 1-3 p. 39-42
4 p.
artikel
578 Scattering of low-energy Li+ and He+ ions from clean and oxygen covered Ni(110) surfaces Englert, W.
1982
201-210 1-3 p. 663-666
4 p.
artikel
579 Schlieren diagnostics of the Los Alamos hypersonic gas target neutron generator Haasz, A.A.
1981
201-210 1-3 p. 331-342
12 p.
artikel
580 Scintillation light from liquid argon and its use in a new hybrid detector Berset, J.C.
1982
201-210 1-3 p. 133-140
8 p.
artikel
581 Search for an influence of the measuring method on stopping cross section data near the maximum Semrad, D.
1983
201-210 1-3 p. 811-816
6 p.
artikel
582 Secondary electron emission from gold bombarded with H+, H2 +, H3 +, He+, and HeH+ Veje, E.
1982
201-210 1-3 p. 433-436
4 p.
artikel
583 Secondary fluorescence induced in elements in the mumeter vicinity of ion muprobe spots in PIXE experiments Heck, D.
1981
201-210 1-3 p. 579-582
4 p.
artikel
584 Secondary ion imaging in the scanning ion microscope Levi-Setti, Riccardo
1983
201-210 1-3 p. 368-374
7 p.
artikel
585 Secondary ion mass spectrometry and its relation to high-energy ion beam analysis techniques Magee, Charles W.
1981
201-210 1-3 p. 297-307
11 p.
artikel
586 Secondary ion mass spectrometry: High-mass molecular and cluster ions Colton, Richard J.
1983
201-210 1-3 p. 276-286
11 p.
artikel
587 Self-assembly of microtubule protein studied by time-resolved X-ray scattering using temperature jump and stopped flow Renner, W.
1983
201-210 1-3 p. 535-540
6 p.
artikel
588 Selfconsistent fit of spectra Urwank, Peter
1982
201-210 1-3 p. 329-337
9 p.
artikel
589 Self-ion sputtering yields for copper, nickel, and aluminum Allas, R.G.
1982
201-210 1-3 p. 615-619
5 p.
artikel
590 Self sputtering on cobalt single crystals Johansen, A.
1983
201-210 1-3 p. 737-741
5 p.
artikel
591 Semiconductor analysis with a channeled helium microbeam Ingarfield, S.A.
1981
201-210 1-3 p. 521-526
6 p.
artikel
592 Semiconductor telescope spectrometer for beta-ray spectra Trzaska, W.
1983
201-210 1-3 p. 221-225
5 p.
artikel
593 Sensitivity amplication by sample preconcentration in ion beam analysis Annegarn, H.J.
1983
201-210 1-3 p. 33-38
6 p.
artikel
594 Shape of the target region affected by the cascade recoils Andreadis, T.D.
1983
201-210 1-3 p. 747-750
4 p.
artikel
595 Sharp-line and broad-continuum radiation from electrons channeled in diamond Gouanere, M.
1982
201-210 1-3 p. 225-228
4 p.
artikel
596 Simplified criteria for bunched beam instability due to rf cavities Suzuki, Toshio
1982
201-210 1-3 p. 45-55
11 p.
artikel
597 SIMS analysis of silicon on insulator structures formed by high-dose O+ implantation into silicon Kilner, J.A.
1983
201-210 1-3 p. 573-578
6 p.
artikel
598 SIMS micro-analysis with a gallium ion microprobe Bayly, A.R.
1983
201-210 1-3 p. 375-382
8 p.
artikel
599 Simulation of dynamic changes in near-surface composition during ion bombardment Roush, M.L.
1981
201-210 1-3 p. 135-140
6 p.
artikel
600 Simulation of recoil mixing in solids produced by energetic atom beams Roush, M.L.
1982
201-210 1-3 p. 611-613
3 p.
artikel
601 Simultaneous high depth resolution profiling of carbon and oxygen Gossett, C.R.
1983
201-210 1-3 p. 149-153
5 p.
artikel
602 Simultaneous operation of a liquid argon detector as bubble chamber and calorimeter Berset, J.C.
1982
201-210 1-3 p. 141-151
11 p.
artikel
603 Simultaneous treatment of betatron and synchrotron motions in circular accelerators Corsten, C.J.A.
1983
201-210 1-3 p. 37-46
10 p.
artikel
604 Size effect of powdered sample on EXAFS amplitude Lu, Kun-quan
1983
201-210 1-3 p. 475-478
4 p.
artikel
605 Slowing down of neutrons from a pulsed, point, monoenergetic source in a hydrogenous medium Golub, Robert
1983
201-210 1-3 p. 349-357
9 p.
artikel
606 Small angle multiple scattering of ions for the Moliere potential Smith, Andrew E.
1981
201-210 1-3 p. 500-506
7 p.
artikel
607 Small angle X-ray scattering study of phase separation in glasses using a new position sensitive detector Bras, Serge
1983
201-210 1-3 p. 489-494
6 p.
artikel
608 Soft X-ray and vacuum ultraviolet beamlines at the national synchrotron light source 700 MeV storage ring Williams, Gwyn P.
1983
201-210 1-3 p. 37-42
6 p.
artikel
609 Some applications of a general theory on coupling between transverse and longitudinal oscillation modes in circular accelerators Corsten, C.J.A.
1983
201-210 1-3 p. 47-51
5 p.
artikel
610 Some aspects of the interaction of light ions with D2O ice crystals Berger, R.
1982
201-210 1-3 p. 181-185
5 p.
artikel
611 Some electrochemical etching studies on the registration of alpha particle tracks in polycarbonate Sohrabi, M.
1981
201-210 1-3 p. 407-413
7 p.
artikel
612 Some optimization considerations in chopper inelastic neutron scattering experiments Kimura, Motoharu
1982
201-210 1-3 p. 537-545
9 p.
artikel
613 Some properties of the relocation function in ion beam collisional mixing Roosendaal, H.E.
1983
201-210 1-3 p. 673-678
6 p.
artikel
614 SOXS — A computer code for the synthesis of X-ray spectra Clayton, E.
1981
201-210 1-3 p. 573-577
5 p.
artikel
615 Sputtering from elastic-collision spikes - spherical geometry Claussen, C.
1982
201-210 1-3 p. 567-571
5 p.
artikel
616 Sputtering induced surface composition changes in copper-palladium alloys Sundararaman, M.
1981
201-210 1-3 p. 289-292
4 p.
artikel
617 Sputtering mechanisms of compound solids Szymoński, Marek
1982
201-210 1-3 p. 523-531
9 p.
artikel
618 Sputtering of ionic clusters from KCl, NaCl and LiF Kerestes, Z.L.
1981
201-210 1-3 p. 259-267
9 p.
artikel
619 Sputtering of multicomponent materials: Elements of a theory Sigmund, P.
1982
201-210 1-3 p. 541-548
8 p.
artikel
620 Sputtering yield measurements on single crystal cobalt Chernysh, V.S.
1981
201-210 1-3 p. 253-258
6 p.
artikel
621 SSRL beam line wunder: Design and planning Bachrach, R.Z.
1983
201-210 1-3 p. 105-112
8 p.
artikel
622 Stigmatic coma free VUV devices for high resolution line profiles measurements Pouey, M.
1983
201-210 1-3 p. 291-295
5 p.
artikel
623 Stopping of 1–2 keV/amu hydrogen ions in solid N2 Børgensen, Peter
1982
201-210 1-3 p. 71-74
4 p.
artikel
624 Stopping powers for 20–140 keV H+ and He+ on Ni, Ag and Au Thompson, D.A.
1981
201-210 1-3 p. 469-474
6 p.
artikel
625 Stopping powers of metallic elements for 6.75 MeV protons Ishiwari, R.
1982
201-210 1-3 p. 61-65
5 p.
artikel
626 Stopping power values of C, Al, Si, Ni, Ag, and A for 3He ions Santry, D.C.
1981
201-210 1-3 p. 517-521
5 p.
artikel
627 Stopping ratios for 30–330 keV light ions in materials with 57⩽Z 2⩽83 Krist, Th.
1983
201-210 1-3 p. 821-826
6 p.
artikel
628 Storage ring free electron lasers: Experimental progress and future prospects Deacon, David A.G.
1983
201-210 1-3 p. 171-176
6 p.
artikel
629 Stroboscopic method of electro-optical picosecond-resolution chronography and its application in synchrotron radiation experiments Zinin, E.I.
1983
201-210 1-3 p. 439-441
3 p.
artikel
630 Stroboscopic synchrotron-X-radiation topography and its application to the imaging of travelling surface acoustic waves Goddard, P.A.
1983
201-210 1-3 p. 705-710
6 p.
artikel
631 Stroboscopic topography with nanoseconds time resolution Glüer, C.-C.
1983
201-210 1-3 p. 701-704
4 p.
artikel
632 Strong molecular effects in zero degree electron emission from molecular ions after solid foil interaction Latz, R.
1982
201-210 1-3 p. 315-317
3 p.
artikel
633 Structure analysis of solid surfaces by multiple scattering of low energy ions Algra, A.J.
1982
201-210 1-3 p. 515-522
8 p.
artikel
634 Studies of Li, B and N in ancient oriental pottery and modern ceramic materials by means of (n, p) and (n, α) spectrometry Fink, D.
1981
201-210 1-3 p. 408-413
6 p.
artikel
635 Study of a method for the resolution of left-right ambiguities in drift chambers Palladino, V.
1983
201-210 1-3 p. 163-166
4 p.
artikel
636 Study of beam-foil excitations of gallium and thallium Lindgård, A.
1982
201-210 1-3 p. 373-375
3 p.
artikel
637 Study of molecular effects in atom-solid interactions Astner, G.
1982
201-210 1-3 p. 319-322
4 p.
artikel
638 Study of silicon layer implanted with iron Thailamani, L.E.
1981
201-210 1-3 p. 87-90
4 p.
artikel
639 Study of the matrix effect in the secondary ion emission of aluminium-zinc alloys van Craen, M.
1981
201-210 1-3 p. 313-317
5 p.
artikel
640 Subdivision of a graded-density cathode Gilvin, P.J.
1981
201-210 1-3 p. 595-597
3 p.
artikel
641 Subject index 1983
201-210 1-3 p. 567-569
3 p.
artikel
642 Subject index 1982
201-210 1-3 p. 625-628
4 p.
artikel
643 Subject index 1981
201-210 1-3 p. 611-614
4 p.
artikel
644 Superlumi: A high flux VUV spectroscopic device for luminescence measurement Gürtler, Peter
1983
201-210 1-3 p. 835-839
5 p.
artikel
645 Surface analysis using scattered primary and recoiled secondary neutrals and ions by TOF and ESA techniques Wayne Rabalais, J.
1983
201-210 1-3 p. 719-726
8 p.
artikel
646 Surface disruption as an observable factor in the energy distribution of sputtered particles Roosendaal, H.E.
1982
201-210 1-3 p. 579-581
3 p.
artikel
647 Surface modification using MeV ion beams Tombrello, T.A.
1983
201-210 1-3 p. 679-683
5 p.
artikel
648 Surface normal velocity distribution of sputtered Zr-atoms for light-ion irradiation Bay, H.L.
1982
201-210 1-3 p. 555-559
5 p.
artikel
649 Surface structural determination of UO2(111) using MeV ions Thompson, K.A.
1983
201-210 1-3 p. 475-479
5 p.
artikel
650 Surface structure analysis from low-energy ion backscattering angular distributions Williams, R.Stanley
1983
201-210 1-3 p. 235-240
6 p.
artikel
651 Surface wake correlations of the ion and of two ions Ohtsuki, Y.H.
1982
201-210 1-3 p. 35-38
4 p.
artikel
652 Sur une methode d'etude de la dynamique des particules traversant L'espace accelerateur d'un cyclotron Thouroude, D.
1983
201-210 1-3 p. 53-59
7 p.
artikel
653 Survival probability in small angle scattering of low energy alkali ions from alkali covered metal surfaces Nešković, N.
1982
201-210 1-3 p. 677-679
3 p.
artikel
654 Synchrotron X-ray diffraction applied to the study of physisorbed monolayers Nielsen, M.
1983
201-210 1-3 p. 549-554
6 p.
artikel
655 Synchrotron X-ray diffraction study of liquid surfaces Als-Nielsen, J.
1983
201-210 1-3 p. 545-548
4 p.
artikel
656 Synchrotron X-ray topography site at HASYLAB Bradaczek, H.
1983
201-210 1-3 p. 719-721
3 p.
artikel
657 Target preparation for radiocarbon dating by tandem accelerator mass spectrometry Jull, A.J.T.
1983
201-210 1-3 p. 509-514
6 p.
artikel
658 Target thickness dependence of projectile K X-ray emission in fast heavy ion bombardments on carbon foils Shima, Kunihiro
1982
201-210 1-3 p. 353-356
4 p.
artikel
659 Techniques for the compositional and chemical state analysis of surfaces and thin films Reuter, W.
1983
201-210 1-3 p. 391-399
9 p.
artikel
660 Temperature dependence and the surface peaks in MeV ion backscattering spectra Jackson, D.P.
1982
201-210 1-3 p. 143-146
4 p.
artikel
661 Thallium formate heavy liquid counter “Helicon” as a total absorption calorimeter Kusumegi, Asao
1981
201-210 1-3 p. 83-86
4 p.
artikel
662 The analysis for light elements of hard gold electrodeposits Bentley, A.J.
1983
201-210 1-3 p. 555-558
4 p.
artikel
663 The angular distribution of material sputtered from AgAu and CuPt by 20–80 keV argon Andersen, H.H.
1981
201-210 1-3 p. 241-244
4 p.
artikel
664 The application of synchrotron radiation to non-invasive angiography Hughes, E.B.
1983
201-210 1-3 p. 665-675
11 p.
artikel
665 The application of the electron-cyclotron resonance source to Lamb-shift polarized ion sources Clegg, T.B.
1983
201-210 1-3 p. 5-12
8 p.
artikel
666 The atomic string potential: An ab initio calculation Cruz, S.A.
1981
201-210 1-3 p. 479-489
11 p.
artikel
667 The background in detectors caused by sea level cosmic rays Ziegler, J.F.
1981
201-210 1-3 p. 419-424
6 p.
artikel
668 The 12 C(α,α)12 C nuclear resonance at 4.26 MeV and its application in RBS analysis of carbon content in thin films Östling, M.
1983
201-210 1-3 p. 439-444
6 p.
artikel
669 The central drift chamber for the high resolution spectrometer at PEP Rubin, D.
1982
201-210 1-3 p. 119-127
9 p.
artikel
670 The characteristics of the radiation from planar channeled positrons through crystals such as NaCl and CaF2 Fedyanin, V.K.
1982
201-210 1-3 p. 247-249
3 p.
artikel
671 The “Coulomb-explosion” technique for determining geometrical structures of molecular ions Gemmel, Donald S.
1981
201-210 1-3 p. 425-431
7 p.
artikel
672 The creation and annihilation of vacancy-solute complexes during irradiation of Ni(In) and Ni(Au) crystals Howe, L.M.
1983
201-210 1-3 p. 663-668
6 p.
artikel
673 The creation of surface damage by ion-beam bombardment Harrison Jr., D.E.
1983
201-210 1-3 p. 727-736
10 p.
artikel
674 The dependence on ion current density of the alignment of HeI 3d1D after beam-foil interaction Winter, H.
1982
201-210 1-3 p. 357-361
5 p.
artikel
675 The depth and angular dependence of the mid-channel flux of He ions in Al crystals Swanson, M.L.
1982
201-210 1-3 p. 139-142
4 p.
artikel
676 The depth profile of high-dose low-mass ions implanted into higher mass substrate by RBS analysis Yin Shi-duan,
1981
201-210 1-3 p. 147-150
4 p.
artikel
677 The determination of the oxygen self-diffusion and gas-solid exchange coefficients for stabilized zirconia by SIMS Tannhauser, D.S.
1983
201-210 1-3 p. 504-508
5 p.
artikel
678 The development of strong 57Co Mössbauer sources for scattering experiments of 57Fe I. The production of large activities of 57Co at the compact cyclotron at Munich Huenges, E.
1982
201-210 1-3 p. 527-531
5 p.
artikel
679 The dissociation of nitrogen molecular ions at clean and adsorbate covered surfaces Heiland, W.
1982
201-210 1-3 p. 667-669
3 p.
artikel
680 The distribution of trace elements in mature wheat seed using the Melbourne proton microprobe Mazzolini, A.P.
1981
201-210 1-3 p. 583-589
7 p.
artikel
681 The double crystal X-ray camera at Daresbury laboratory Bowen, D.K.
1983
201-210 1-3 p. 725-729
5 p.
artikel
682 The effect of incidence angle on ion bombardment induced surface topography development on single crystal copper Carter, G.
1982
201-210 1-3 p. 509-514
6 p.
artikel
683 The effect of oxygen adsorption on CuNi alloys during irradiation studied by SIMS, SIPS and ISS Loxton, C.M.
1983
201-210 1-3 p. 340-346
7 p.
artikel
684 The effect of the angle of incidence on secondary ion yields of oxygen-bombarded solids Wittmaack, K.
1983
201-210 1-3 p. 307-311
5 p.
artikel
685 The effect of wavelength shifters on water cherenkov detectors Badino, Giovanni
1981
201-210 1-3 p. 587-589
3 p.
artikel
686 The effects of temperature and crystal defects on electron channeling radiation Swent, R.L.
1982
201-210 1-3 p. 235-237
3 p.
artikel
687 The erosion of frozen argon by swift helium ions Besenbacher, F.
1981
201-210 1-3 p. 221-234
14 p.
artikel
688 The estimation of differential counting measurements of positive quantities with relatively large statistical errors Vincent, C.H.
1982
201-210 1-3 p. 307-315
9 p.
artikel
689 The French AEC nuclear microprobe: Description and first application examples Engelmann, Charles
1983
201-210 1-3 p. 209-216
8 p.
artikel
690 The Göttingen X-ray microscopes Niemann, B.
1983
201-210 1-3 p. 367-371
5 p.
artikel
691 The Hefei Synchrotron Radiation Laboratory (HESYRL): An 800 MeV electron storage ring and its synchrotron radiation experiment area Zhong-mou, Bao
1983
201-210 1-3 p. 19-22
4 p.
artikel
692 The importance of projectile ionisation in studies of forward electron ejection from solid targets Cranage, Richard W.
1982
201-210 1-3 p. 419-422
4 p.
artikel
693 The influence of atomic mixing on SIMS depth profiling of thin buried layers King, B.V.
1983
201-210 1-3 p. 687-690
4 p.
artikel
694 The interpretation of molecular-ion dissociation experiments Plesser, Itzhak
1982
201-210 1-3 p. 269-275
7 p.
artikel
695 The light element impurity content of self-supporting carbon foils Sofield, C.J.
1982
201-210 1-3 p. 509-514
6 p.
artikel
696 The Los Alamos nuclear microprobe with a superconducting solenoid final lens Maggiore, C.J.
1981
201-210 1-3 p. 199-203
5 p.
artikel
697 The low energy well enriched kaon beam K2 at the KEK 12 GeV proton synchrotron Yamamoto, A.
1982
201-210 1-3 p. 35-43
9 p.
artikel
698 The magnetic system of an optical klystron using SmCo permanent magnets Kornyukhin, G.A.
1983
201-210 1-3 p. 189-191
3 p.
artikel
699 The mass separation and collection of ions having large angular and energy spreads emitted from pulsed plasma sources Paiss, Yehuda
1981
201-210 1-3 p. 7-11
5 p.
artikel
700 The naval research laboratory materials analysis beam line at the national synchrotron light source Kirkland, J.P.
1983
201-210 1-3 p. 49-54
6 p.
artikel
701 The 14N (d, p0)15 reaction for measurements of nitrogen depth distributions in single seeds of wheat Gönczi, L.
1982
201-210 1-3 p. 577-585
9 p.
artikel
702 Theory of charge states in sputtering Sroubek, Z.
1982
201-210 1-3 p. 533-539
7 p.
artikel
703 Theory of sputtering and comparison to experimental data Yamamura, Y.
1982
201-210 1-3 p. 515-522
8 p.
artikel
704 The PIGME method for fluorine determination Bird, J.R.
1983
201-210 1-3 p. 525-528
4 p.
artikel
705 The plastic ball spectrometer: An electronic 4τ detector with particle identification Baden, A.
1982
201-210 1-3 p. 189-211
23 p.
artikel
706 The preparation of large area uranium target layers for a multiple parallel plate fission detector Ries, H.
1981
201-210 1-3 p. 373-376
4 p.
artikel
707 The quarter wave resonator as a superconducting linac element Ben-Zvi, I.
1983
201-210 1-3 p. 73-79
7 p.
artikel
708 The radiometric laboratory of PTB at BESSY Kühne, M.
1983
201-210 1-3 p. 399-403
5 p.
artikel
709 The response function of large NaI detectors to high energy photons Corvisiero, P.
1981
201-210 1-3 p. 291-297
7 p.
artikel
710 The response of an isobutane filled ion chamber to heavy ions James, A.N.
1983
201-210 1-3 p. 545-553
9 p.
artikel
711 The role of charge-exchange in energy-loss straggling Sofield, C.J.
1981
201-210 1-3 p. 462-468
7 p.
artikel
712 The scaling laws of a cold gas-blanket experiment Kuthy, A.
1981
201-210 1-3 p. 343-350
8 p.
artikel
713 The scattering of keV H and He ions from tungsten and tungsten oxide Jackson, D.P.
1982
201-210 1-3 p. 671-675
5 p.
artikel
714 The SRS program library Pantos, Emmanuel
1983
201-210 1-3 p. 449-459
11 p.
artikel
715 The stopping power of gold in the Bethe region Andersen, H.H.
1981
201-210 1-3 p. 475-478
4 p.
artikel
716 The study of the neutral hydrogen component in the break-up of OH+ Faibis, A.
1982
201-210 1-3 p. 299-302
4 p.
artikel
717 The two-atom model in enhanced ion backscattering near 180° scattering angles Oen, Ordean S.
1982
201-210 1-3 p. 87-91
5 p.
artikel
718 The UH-nuclei cosmic ray detector on the third high energy astronomy observatory Binns, W.R.
1981
201-210 1-3 p. 415-426
12 p.
artikel
719 The use of accelerators for arhaeological dating Donahue, D.J.
1983
201-210 1-3 p. 425-429
5 p.
artikel
720 The use of H2 + and H3 + molecular ions as bombarding particles Anttila, A.
1981
201-210 1-3 p. 601-602
2 p.
artikel
721 The use of He microbeams for light element X-ray analysis of biological tissue Sealock, R.M.
1983
201-210 1-3 p. 217-220
4 p.
artikel
722 The use of ion beam analysis in biological sciences Deconninck, G.
1981
201-210 1-3 p. 543-550
8 p.
artikel
723 The velocity dependence of secondary ion fields Vasile, M.J.
1983
201-210 1-3 p. 319-323
5 p.
artikel
724 The vertex and large angle detectors of a spectrometer system for high energy muon physics Albanese, J.P.
1983
201-210 1-3 p. 111-124
14 p.
artikel
725 The X-ray-interferometer for high resolution measurement of anomalous dispersion at HASYLAB Bonse, U.
1983
201-210 1-3 p. 603-604
2 p.
artikel
726 Thin-film cryogenic accelerator targets Becchetti, F.D.
1982
201-210 1-3 p. 93-95
3 p.
artikel
727 Time domain noise calculation for the common base current amplifier configuration Hrisoho, A.
1981
201-210 1-3 p. 207-213
7 p.
artikel
728 Time-of-flight atom-probe field ion microscope analysis of thin films: Surface segregation of alloys and early stages of silicide formation Tsong, T.T.
1983
201-210 1-3 p. 383-390
8 p.
artikel
729 Time of flight spectrometry in heavy ion backscattering analysis Chevarier, A.
1983
201-210 1-3 p. 1-5
5 p.
artikel
730 Time-of-flight system for profiling recoiled light elements Groleau, R.
1983
201-210 1-3 p. 11-15
5 p.
artikel
731 Time-of-flight system for slow heavy ions Lennard, W.N.
1982
201-210 1-3 p. 565-570
6 p.
artikel
732 Time resolved spectroscopy using synchrotron radiation Munro, I.H.
1983
201-210 1-3 p. 819-834
16 p.
artikel
733 Timing coincidence studies with fast photomultipliers Raoof, Mohammad Abdul
1981
201-210 1-3 p. 215-218
4 p.
artikel
734 Trace element detection by high energy heavy ion induced X-ray emission Scheer, J.
1981
201-210 1-3 p. 565-566
2 p.
artikel
735 Track fitting and resolution with digital detectors Duerdoth, I.
1982
201-210 1-3 p. 291-297
7 p.
artikel
736 Transverse beam cavity interaction. Part I: Short range forces Weiland, T.
1983
201-210 1-3 p. 13-21
9 p.
artikel
737 Transverse wakefield calculations Aharonian, G.
1983
201-210 1-3 p. 23-35
13 p.
artikel
738 Trapping and release of implanted D/H ions in fused silica Arnold, G.W.
1982
201-210 1-3 p. 491-495
5 p.
artikel
739 Two-coordinate X-ray detector Baru, S.E.
1983
201-210 1-3 p. 445-447
3 p.
artikel
740 Two-dimensional curve fitting in counting experiments Awaya, Takashi
1983
201-210 1-3 p. 311-317
7 p.
artikel
741 Ultra-high vacuum heating camera for in situ synchrotron radiation X-ray topographic studies Gastaldi, J.
1983
201-210 1-3 p. 723-724
2 p.
artikel
742 Uncertainties in theoretical thick target PIXE yields Clayton, E.
1981
201-210 1-3 p. 567-572
6 p.
artikel
743 Uncertainties in thick-target PIXE analysis Campbell, J.L.
1983
201-210 1-3 p. 427-439
13 p.
artikel
744 Undulator radiation of relativistic electrons Nikitin, M.M.
1983
201-210 1-3 p. 157-161
5 p.
artikel
745 Undulator studies at SSRL Winick, H.
1983
201-210 1-3 p. 127-137
11 p.
artikel
746 Un mecanisme d'arret de la formation des cloques impliquant la croissance des bulles dans les metaux irradies par des ions helium Saint-Jacques, R.G.
1982
201-210 1-3 p. 471-476
6 p.
artikel
747 Upper limit of peak area Helene, O.
1983
201-210 1-3 p. 319-322
4 p.
artikel
748 Use of a position sensitive detector for data acquisition of synchrotron X-ray diffraction from adsorbed gas monolayers on graphite Bohr, J.
1983
201-210 1-3 p. 555-558
4 p.
artikel
749 Use of ion beam analysis in metal modification by means of ion implantation Hubler, G.K.
1981
201-210 1-3 p. 101-113
13 p.
artikel
750 Use of ion beam techniques for studying the leaching properties of lead implanted silicates Della Mea, G.
1983
201-210 1-3 p. 493-499
7 p.
artikel
751 Use of ISS and doubly charged secondary ions to monitor surface composition during SIMS analyses Reed, David A.
1983
201-210 1-3 p. 324-326
3 p.
artikel
752 VUV and soft X-ray monochromators for use with synchrotron radiation Saile, V.
1983
201-210 1-3 p. 199-213
15 p.
artikel
753 VUV-standard for beam experiments Flaig, H.-J.
1983
201-210 1-3 p. 405-407
3 p.
artikel
754 Wear traces and patination on Danish flint artefacts Andersen, Hans Henrik
1983
201-210 1-3 p. 468-474
7 p.
artikel
755 Wiggler and undulator magnets — A review Brown, G.
1983
201-210 1-3 p. 65-77
13 p.
artikel
756 Wiggler, undulator and free electron laser radiation sources development at the national synchrotron light source Hsieh, H.
1983
201-210 1-3 p. 79-90
12 p.
artikel
757 X-ray beam line at the NSLS for X-ray absorption studies in material science Sayers, Dale E.
1983
201-210 1-3 p. 631-635
5 p.
artikel
758 X-ray diffraction and scattering on disordered systems using synchrotron radiation Koch, M.H.J.
1983
201-210 1-3 p. 461-469
9 p.
artikel
759 X-ray diffuse scattering study of the organic conductor: DBTTFTCNQCl2 Mortensen, Kell
1983
201-210 1-3 p. 559-562
4 p.
artikel
760 X-ray fluorescence analysis with synchrotron radiation Knöchel, A.
1983
201-210 1-3 p. 659-663
5 p.
artikel
761 X-ray fluorescence spectroscopy Deslattes, Richard D.
1983
201-210 1-3 p. 655-658
4 p.
artikel
762 X-ray microscopy Schmahl, Günter
1983
201-210 1-3 p. 361-365
5 p.
artikel
763 X-ray mirror surfaces evaluated by an X-ray topographical technique Mancini, D.C.
1983
201-210 1-3 p. 263-272
10 p.
artikel
764 X-ray optics and spectral brightness of the superconducting SRS wiggler Greaves, G.N.
1983
201-210 1-3 p. 139-142
4 p.
artikel
765 Z-oscillations in channeling stopping power Pathak, Anand P.
1982
201-210 1-3 p. 31-34
4 p.
artikel
766 Z 2 stopping power oscillations as derived from range measurements Fink, D.
1983
201-210 1-3 p. 817-820
4 p.
artikel
                             766 gevonden resultaten
 
 Koninklijke Bibliotheek - Nationale Bibliotheek van Nederland