nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Characterization of the perfection of large single crystals by means of γ-ray diffractometry
|
Schneider, Jochen R. |
|
1987 |
14 |
C |
p. 315-365 51 p. |
artikel |
2 |
Compound index
|
|
|
1987 |
14 |
C |
p. 513-514 2 p. |
artikel |
3 |
Diffuse x-ray scattering from crystals
|
Jagodzinski, Heinz |
|
1987 |
14 |
C |
p. 47-102 56 p. |
artikel |
4 |
Editorial
|
Krishna, P. |
|
1987 |
14 |
C |
p. vii- 1 p. |
artikel |
5 |
Editorial Board
|
|
|
1987 |
14 |
C |
p. iii- 1 p. |
artikel |
6 |
Real-time and stroboscopic topography
|
Tanner, B.K. |
|
1987 |
14 |
C |
p. 403-424 22 p. |
artikel |
7 |
Recent methods and applications of x-ray fluorescence analysis
|
Mantler, M. |
|
1987 |
14 |
C |
p. 213-261 49 p. |
artikel |
8 |
Single crystal diffraction studies of stacking faults in close-packed structures
|
Sebastian, M.T. |
|
1987 |
14 |
C |
p. 103-183 81 p. |
artikel |
9 |
Single crystal x-ray diffraction studies of materials at high temperature
|
Schulz, H. |
|
1987 |
14 |
C |
p. 303-314 12 p. |
artikel |
10 |
Some applications of pattern fitting to powder diffraction data
|
Langford, J.I. |
|
1987 |
14 |
C |
p. 185-211 27 p. |
artikel |
11 |
Subject index
|
|
|
1987 |
14 |
C |
p. 507-512 6 p. |
artikel |
12 |
The simulation of x-ray topographic images
|
Epelboin, Y. |
|
1987 |
14 |
C |
p. 465-506 42 p. |
artikel |
13 |
The x ray anomalous dispersion corrections and their use for the characterization of materials
|
Creagh, D.C. |
|
1987 |
14 |
C |
p. 1-46 46 p. |
artikel |
14 |
X-Ray diffraction on single crystals at high pressure
|
Ahsbahs, H. |
|
1987 |
14 |
C |
p. 263-302 40 p. |
artikel |
15 |
X-ray topographic studies of phase transition in crystals; the α-β transition of quartz
|
Kato, N. |
|
1987 |
14 |
C |
p. 425-464 40 p. |
artikel |
16 |
X-ray topography of twinned crystals
|
Klapper, H. |
|
1987 |
14 |
C |
p. 367-401 35 p. |
artikel |