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                             16 results found
no title author magazine year volume issue page(s) type
1 Characterization of the perfection of large single crystals by means of γ-ray diffractometry Schneider, Jochen R.
1987
14 C p. 315-365
51 p.
article
2 Compound index 1987
14 C p. 513-514
2 p.
article
3 Diffuse x-ray scattering from crystals Jagodzinski, Heinz
1987
14 C p. 47-102
56 p.
article
4 Editorial Krishna, P.
1987
14 C p. vii-
1 p.
article
5 Editorial Board 1987
14 C p. iii-
1 p.
article
6 Real-time and stroboscopic topography Tanner, B.K.
1987
14 C p. 403-424
22 p.
article
7 Recent methods and applications of x-ray fluorescence analysis Mantler, M.
1987
14 C p. 213-261
49 p.
article
8 Single crystal diffraction studies of stacking faults in close-packed structures Sebastian, M.T.
1987
14 C p. 103-183
81 p.
article
9 Single crystal x-ray diffraction studies of materials at high temperature Schulz, H.
1987
14 C p. 303-314
12 p.
article
10 Some applications of pattern fitting to powder diffraction data Langford, J.I.
1987
14 C p. 185-211
27 p.
article
11 Subject index 1987
14 C p. 507-512
6 p.
article
12 The simulation of x-ray topographic images Epelboin, Y.
1987
14 C p. 465-506
42 p.
article
13 The x ray anomalous dispersion corrections and their use for the characterization of materials Creagh, D.C.
1987
14 C p. 1-46
46 p.
article
14 X-Ray diffraction on single crystals at high pressure Ahsbahs, H.
1987
14 C p. 263-302
40 p.
article
15 X-ray topographic studies of phase transition in crystals; the α-β transition of quartz Kato, N.
1987
14 C p. 425-464
40 p.
article
16 X-ray topography of twinned crystals Klapper, H.
1987
14 C p. 367-401
35 p.
article
                             16 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands