| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Carrier Lifetimes of Iodine-Doped CdMgTe/CdSeTe Double Heterostructures Grown by Molecular Beam Epitaxy
|
Sohal, S.
|
|
2017
|
46 |
9 |
p. 5361-5366
|
artikel
|
| 2 |
Characterization of HgCdTe Films Grown on Large-Area CdZnTe Substrates by Molecular Beam Epitaxy
|
Arkun, F. Erdem
|
|
2017
|
46 |
9 |
p. 5374-5378
|
artikel
|
| 3 |
Characterization of n-Type and p-Type Long-Wave InAs/InAsSb Superlattices
|
Brown, A. E.
|
|
2017
|
46 |
9 |
p. 5367-5373
|
artikel
|
| 4 |
Determining and Controlling the Magnesium Composition in CdTe/CdMgTe Heterostructures
|
LeBlanc, E. G.
|
|
2017
|
46 |
9 |
p. 5379-5385
|
artikel
|
| 5 |
Development and Production of Array Barrier Detectors at SCD
|
Klipstein, P. C.
|
|
2017
|
46 |
9 |
p. 5386-5393
|
artikel
|
| 6 |
Diffusion Mechanism for Arsenic in Intrinsic and Extrinsic Conditions in HgCdTe
|
Grenouilloux, T.
|
|
2017
|
46 |
9 |
p. 5394-5399
|
artikel
|
| 7 |
Dr. Herbert Frank Schaake: In Memoriam
|
Mitra, Pradip
|
|
2017
|
46 |
9 |
p. 5359-5360
|
artikel
|
| 8 |
Dry Etching Characteristics of MOVPE-Grown CdTe Epilayers in CH4, H2, Ar ECR Plasmas
|
Yasuda, K.
|
|
2017
|
46 |
9 |
p. 5400-5404
|
artikel
|
| 9 |
Empirical Study of the Disparity in Radiation Tolerance of the Minority-Carrier Lifetime Between II–VI and III–V MWIR Detector Technologies for Space Applications
|
Jenkins, Geoffrey D.
|
|
2017
|
46 |
9 |
p. 5405-5410
|
artikel
|
| 10 |
Foreword
|
Sivananthan, S.
|
|
2017
|
46 |
9 |
p. 5357-5358
|
artikel
|
| 11 |
HgTe Quantum Dots for Near-, Mid-, and Long-Wavelength IR Devices
|
Palosz, W.
|
|
2017
|
46 |
9 |
p. 5411-5417
|
artikel
|
| 12 |
Impact of CdZnTe Substrates on MBE HgCdTe Deposition
|
Benson, J. D.
|
|
2017
|
46 |
9 |
p. 5418-5423
|
artikel
|
| 13 |
Iodine Doping of CdTe and CdMgTe for Photovoltaic Applications
|
Ogedengbe, O. S.
|
|
2017
|
46 |
9 |
p. 5424-5429
|
artikel
|
| 14 |
MCT: A UK Retrospective—Reminiscences of a Crystal Grower
|
Capper, Peter
|
|
2017
|
46 |
9 |
p. 5430-5441
|
artikel
|
| 15 |
Micro-diffraction Investigation of Localized Strain in Mesa-etched HgCdTe Photodiodes
|
Tuaz, Aymeric
|
|
2017
|
46 |
9 |
p. 5442-5447
|
artikel
|
| 16 |
Progress of MCT Detector Technology at AIM Towards Smaller Pitch and Lower Dark Current
|
Eich, D.
|
|
2017
|
46 |
9 |
p. 5448-5457
|
artikel
|
| 17 |
Simulation of Small-Pitch HgCdTe Photodetectors
|
Vallone, Marco
|
|
2017
|
46 |
9 |
p. 5458-5470
|
artikel
|
| 18 |
The Numerical–Experimental Enhanced Analysis of HOT MCT Barrier Infrared Detectors
|
Jóźwikowski, K.
|
|
2017
|
46 |
9 |
p. 5471-5478
|
artikel
|
| 19 |
Variable-Field Hall Effect Analysis of HgCdTe Epilayers with Very Low Doping Density
|
Easley, Justin
|
|
2017
|
46 |
9 |
p. 5479-5483
|
artikel
|
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