nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
AES and SEM characterization of anodized aluminum alloy adherends for adhesive bonding application
|
Solomon, J.S. |
|
1980 |
4 |
3-4 |
p. 307-323 17 p. |
artikel |
2 |
Application of XPS to the study of polymer-metal interface phenomena
|
van Ooij, W.J. |
|
1980 |
4 |
3-4 |
p. 324-339 16 p. |
artikel |
3 |
Applications of surface analysis techniques to studies of adhesion
|
Baun, W.L. |
|
1980 |
4 |
3-4 |
p. 291-306 16 p. |
artikel |
4 |
A study of oxide composition and corrosion susceptibility of two heat treated Fe-Cr alloys using Auger electron spectroscopy
|
Buczek, D. |
|
1980 |
4 |
3-4 |
p. 518-530 13 p. |
artikel |
5 |
Author index
|
|
|
1980 |
4 |
3-4 |
p. 556-559 4 p. |
artikel |
6 |
Characterization of electronic devices and materials by surface-sensitive analytical techniques
|
Holloway, P.H. |
|
1980 |
4 |
3-4 |
p. 410-444 35 p. |
artikel |
7 |
Characterization of ion implants in GaAs by AES and GDOS
|
Park, Y.S. |
|
1980 |
4 |
3-4 |
p. 445-455 11 p. |
artikel |
8 |
Characterization of TiH x and TiD0.9 surfaces: AES, ELS, SIMS and XPS studies
|
Lamartine, B.C. |
|
1980 |
4 |
3-4 |
p. 537-555 19 p. |
artikel |
9 |
Characterization of tungsten impregnated dispenser cathodes using ISS and SIMS
|
Baun, W.L. |
|
1980 |
4 |
3-4 |
p. 374-384 11 p. |
artikel |
10 |
Chromate film used for chemical corrosion control on gold-plated PCB connectors
|
Shafrin, E.G. |
|
1980 |
4 |
3-4 |
p. 456-465 10 p. |
artikel |
11 |
ESCA characterization of the oxide tunneling barriers in niobium based superconductive tunnel junctions
|
Karulkar, Pramod C. |
|
1980 |
4 |
3-4 |
p. 282-290 9 p. |
artikel |
12 |
Graphite fiber surface analysis by X-ray photoelectron spectroscopy and polar/dispersive free energy analysis
|
Hammer, G.E. |
|
1980 |
4 |
3-4 |
p. 340-355 16 p. |
artikel |
13 |
Investigation of BaTiO3 and Gd2(MoO4)3 crystal surfaces by complementary AES and ISS techniques
|
Tongson, L.L. |
|
1980 |
4 |
3-4 |
p. 263-270 8 p. |
artikel |
14 |
Ion scattering characterization of the oxidation of thin copper films on gold substrates
|
Miller, A.C. |
|
1980 |
4 |
3-4 |
p. 481-491 11 p. |
artikel |
15 |
Measurement of low energy secondary electron distributions using a double-pass cylindrical mirror analyzer
|
Chase, R.E. |
|
1980 |
4 |
3-4 |
p. 271-281 11 p. |
artikel |
16 |
Photoacoustic spectroscopy studies on optical coatings and materials
|
Fernelius, Nils C. |
|
1980 |
4 |
3-4 |
p. 401-409 9 p. |
artikel |
17 |
Recent progress in quantification of surface analysis techniques
|
Powell, C.J. |
|
1980 |
4 |
3-4 |
p. 492-509 18 p. |
artikel |
18 |
Studies of oxide films on an Fe 50%/Ni 50% alloy using AES
|
Wittberg, T.N. |
|
1980 |
4 |
3-4 |
p. 531-536 6 p. |
artikel |
19 |
Subject index
|
|
|
1980 |
4 |
3-4 |
p. 560-569 10 p. |
artikel |
20 |
Surface spacings from the secondary electron yield
|
Park, Robert L. |
|
1980 |
4 |
3-4 |
p. 250-262 13 p. |
artikel |
21 |
Surface studies by photoemission of the laves phases UAl2 and UCo2
|
Naegele, J.R. |
|
1980 |
4 |
3-4 |
p. 510-517 8 p. |
artikel |
22 |
Surface studies of the Medicus nickel matrix cathode
|
Pantano Jr., C.G. |
|
1980 |
4 |
3-4 |
p. 385-400 16 p. |
artikel |
23 |
Symposium on applied surface analysis
|
Grant, J.T. |
|
1980 |
4 |
3-4 |
p. 249- 1 p. |
artikel |
24 |
The application of Raman spectroscopy to the study of adsorbed molecules on alumina surfaces
|
Yaney, Perry Pappas |
|
1980 |
4 |
3-4 |
p. 356-373 18 p. |
artikel |
25 |
The use of prompt nuclear reactions and resonant alpha scattering in the study of α and β brass oxidation
|
Maroie, S. |
|
1980 |
4 |
3-4 |
p. 466-480 15 p. |
artikel |