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Journal description
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Details for article 8 of 25 found articles
| Title: |
Characterization of TiH x and TiD0.9 surfaces: AES, ELS, SIMS and XPS studies |
| Author: |
Lamartine, B.C. Haas, T.W. Solomon, J.S. |
| Appeared in: |
Applications of surface science |
| Paging: | Volume 4 (1980) nr. 3-4 pages 19 p. |
| Year: |
1980 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 25 found articles
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