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                             25 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 AES and SEM characterization of anodized aluminum alloy adherends for adhesive bonding application Solomon, J.S.
1980
4 3-4 p. 307-323
17 p.
artikel
2 Application of XPS to the study of polymer-metal interface phenomena van Ooij, W.J.
1980
4 3-4 p. 324-339
16 p.
artikel
3 Applications of surface analysis techniques to studies of adhesion Baun, W.L.
1980
4 3-4 p. 291-306
16 p.
artikel
4 A study of oxide composition and corrosion susceptibility of two heat treated Fe-Cr alloys using Auger electron spectroscopy Buczek, D.
1980
4 3-4 p. 518-530
13 p.
artikel
5 Author index 1980
4 3-4 p. 556-559
4 p.
artikel
6 Characterization of electronic devices and materials by surface-sensitive analytical techniques Holloway, P.H.
1980
4 3-4 p. 410-444
35 p.
artikel
7 Characterization of ion implants in GaAs by AES and GDOS Park, Y.S.
1980
4 3-4 p. 445-455
11 p.
artikel
8 Characterization of TiH x and TiD0.9 surfaces: AES, ELS, SIMS and XPS studies Lamartine, B.C.
1980
4 3-4 p. 537-555
19 p.
artikel
9 Characterization of tungsten impregnated dispenser cathodes using ISS and SIMS Baun, W.L.
1980
4 3-4 p. 374-384
11 p.
artikel
10 Chromate film used for chemical corrosion control on gold-plated PCB connectors Shafrin, E.G.
1980
4 3-4 p. 456-465
10 p.
artikel
11 ESCA characterization of the oxide tunneling barriers in niobium based superconductive tunnel junctions Karulkar, Pramod C.
1980
4 3-4 p. 282-290
9 p.
artikel
12 Graphite fiber surface analysis by X-ray photoelectron spectroscopy and polar/dispersive free energy analysis Hammer, G.E.
1980
4 3-4 p. 340-355
16 p.
artikel
13 Investigation of BaTiO3 and Gd2(MoO4)3 crystal surfaces by complementary AES and ISS techniques Tongson, L.L.
1980
4 3-4 p. 263-270
8 p.
artikel
14 Ion scattering characterization of the oxidation of thin copper films on gold substrates Miller, A.C.
1980
4 3-4 p. 481-491
11 p.
artikel
15 Measurement of low energy secondary electron distributions using a double-pass cylindrical mirror analyzer Chase, R.E.
1980
4 3-4 p. 271-281
11 p.
artikel
16 Photoacoustic spectroscopy studies on optical coatings and materials Fernelius, Nils C.
1980
4 3-4 p. 401-409
9 p.
artikel
17 Recent progress in quantification of surface analysis techniques Powell, C.J.
1980
4 3-4 p. 492-509
18 p.
artikel
18 Studies of oxide films on an Fe 50%/Ni 50% alloy using AES Wittberg, T.N.
1980
4 3-4 p. 531-536
6 p.
artikel
19 Subject index 1980
4 3-4 p. 560-569
10 p.
artikel
20 Surface spacings from the secondary electron yield Park, Robert L.
1980
4 3-4 p. 250-262
13 p.
artikel
21 Surface studies by photoemission of the laves phases UAl2 and UCo2 Naegele, J.R.
1980
4 3-4 p. 510-517
8 p.
artikel
22 Surface studies of the Medicus nickel matrix cathode Pantano Jr., C.G.
1980
4 3-4 p. 385-400
16 p.
artikel
23 Symposium on applied surface analysis Grant, J.T.
1980
4 3-4 p. 249-
1 p.
artikel
24 The application of Raman spectroscopy to the study of adsorbed molecules on alumina surfaces Yaney, Perry Pappas
1980
4 3-4 p. 356-373
18 p.
artikel
25 The use of prompt nuclear reactions and resonant alpha scattering in the study of α and β brass oxidation Maroie, S.
1980
4 3-4 p. 466-480
15 p.
artikel
                             25 gevonden resultaten
 
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