| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Applications of STEM-EELS to complex oxides
|
Gázquez, Jaume
|
|
2017
|
65 |
C |
p. 49-63
|
artikel
|
| 2 |
Atomically resolved mapping of EELS fine structures
|
Gloter, Alexandre
|
|
2017
|
65 |
C |
p. 2-17
|
artikel
|
| 3 |
Correlative microscopy analyses of thin-film solar cells at multiple scales
|
Abou-Ras, Daniel
|
|
2017
|
65 |
C |
p. 35-43
|
artikel
|
| 4 |
Crystallization properties of Sb-rich GeSbTe alloys by in-situ morphological and electrical analysis
|
D’Arrigo, G.
|
|
2017
|
65 |
C |
p. 100-107
|
artikel
|
| 5 |
Crystal structure assessment of Ge-Sb-Te nanowires
|
Lazzarini, Laura
|
|
2017
|
65 |
C |
p. 77-87
|
artikel
|
| 6 |
Effects of VLS and VS mechanisms during shell growth in GaAs-AlGaAs core-shell nanowires investigated by transmission electron microscopy
|
Scuderi, Mario
|
|
2017
|
65 |
C |
p. 108-112
|
artikel
|
| 7 |
Electron-optical sectioning for three-dimensional imaging of crystal defect structures
|
Nellist, Peter D.
|
|
2017
|
65 |
C |
p. 18-23
|
artikel
|
| 8 |
Material Science in Semiconductor Processing☆
|
Nicotra, Giuseppe
|
|
2017
|
65 |
C |
p. 1
|
artikel
|
| 9 |
On the chemical homogeneity of InxGa1−xN alloys – Electron microscopy at the edge of technical limits
|
Specht, Petra
|
|
2017
|
65 |
C |
p. 24-34
|
artikel
|
| 10 |
Plasmon spectroscopy of graphene and other two-dimensional materials with transmission electron microscopy
|
Politano, Antonio
|
|
2017
|
65 |
C |
p. 88-99
|
artikel
|
| 11 |
Simultaneous DualEELS and EDS analysis across the ohmic contact region in 3D NAND storage and FinFET electronic devices
|
Longo, P.
|
|
2017
|
65 |
C |
p. 44-48
|
artikel
|
| 12 |
Understanding individual defects in CdTe thin-film solar cells via STEM: From atomic structure to electrical activity
|
Li, Chen
|
|
2017
|
65 |
C |
p. 64-76
|
artikel
|
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