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                             44 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Adverts-6 2001
4 6 p. IX-XII
nvt p.
artikel
2 Applications and processing of SiGe and SiGe:C for high-speed HBT devices Meyer, D.J.
2001
4 6 p. 529-533
5 p.
artikel
3 Author index-auto generate 2001
4 6 p. I-III
nvt p.
artikel
4 Characterization of GaN films etched using reactive ion etching technique by secondary ion mass spectrometry Naoi, Y.
2001
4 6 p. 555-558
4 p.
artikel
5 Crystal growth of aluminum nitride under high pressure of nitrogen Boćkowski, M.
2001
4 6 p. 543-548
6 p.
artikel
6 Dependence of electrical and optical properties of ZnO films on substrate temperature Xu, X.L.
2001
4 6 p. 617-620
4 p.
artikel
7 Detailed structural analysis of semiconductors with X-ray scattering Fewster, Paul F.
2001
4 6 p. 475-481
7 p.
artikel
8 Dielectric tunable properties of (Ba1−x Sr x)TiO3 thin films on LaAlO3 substrate Wu, Wenbiao
2001
4 6 p. 673-678
6 p.
artikel
9 Dislocation scattering in n-GaN Choi, H.W.
2001
4 6 p. 567-570
4 p.
artikel
10 DLTS characterisation of InGaAlP films grown using different V/III ratios Lim, H.F.
2001
4 6 p. 625-629
5 p.
artikel
11 Effect of H+ implantation on the structural properties of GaN Senthil Kumar, M.
2001
4 6 p. 585-589
5 p.
artikel
12 Electroluminescence from Au/Si/SiO2/p-Si structure Ma, S.Y.
2001
4 6 p. 661-663
3 p.
artikel
13 Electronic structure of GaAs1−x N x alloys Tzu-Lin Lim, Adele
2001
4 6 p. 577-580
4 p.
artikel
14 GaAs-based materials for heterojunction bipolar transistor's: reliability results and MMIC applications di Forte-Poisson, M.A.
2001
4 6 p. 503-511
9 p.
artikel
15 GaN-based optoelectronic devices on sapphire and Si substrates Umeno, Masayoshi
2001
4 6 p. 459-466
8 p.
artikel
16 High-frequency performance of metamorphic InP/In0.53Ga0.47As/InP DHBT in common base configuration on GaAs substrates Xiong, Yong Zhong
2001
4 6 p. 647-649
3 p.
artikel
17 High-resolution X-ray diffraction study of strained InGaAsP/InP multiple quantum well structures grown using all solid sources Sun, L.
2001
4 6 p. 631-636
6 p.
artikel
18 Impurity-free intermixing in compressively strained InGaAsP multiple quantum well structures Teng, J.H.
2001
4 6 p. 621-624
4 p.
artikel
19 Influence of doping on the dynamical properties of III–V–N by Raman scattering, infrared absorption and model calculations Talwar, Devki N.
2001
4 6 p. 513-520
8 p.
artikel
20 Influence of iron concentration on its structural position in KNbO3 lattice Cherney, N.V.
2001
4 6 p. 669-672
4 p.
artikel
21 Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates Feng, Z.C.
2001
4 6 p. 571-576
6 p.
artikel
22 InP quantum dots in (100) GaP: Growth and luminescence Masselink, W.T.
2001
4 6 p. 497-501
5 p.
artikel
23 Lift-off and re-growth of ZnSSe epilayer Lee, Ming-Kwei
2001
4 6 p. 607-610
4 p.
artikel
24 LiInS2: A new nonlinear crystal for the mid-IR Isaenko, L.
2001
4 6 p. 665-668
4 p.
artikel
25 Local vibrational modes in Gamma-irradiated GaN grown by metal-organic chemical vapor deposition Sun, W.H.
2001
4 6 p. 559-562
4 p.
artikel
26 Materials and technology issues for SiGe heterojunction bipolar transistors Ashburn, Peter
2001
4 6 p. 521-527
7 p.
artikel
27 Materials engineering of advanced device structures by heteroepitaxy of large misfit systems Ploog, Klaus H.
2001
4 6 p. 451-457
7 p.
artikel
28 MBE-grown ZnSSe thin films on ITO substrates for liquid-crystal light valve applications Shen, D.
2001
4 6 p. 611-616
6 p.
artikel
29 MOCVD technology in research, development and mass production Juergensen, H.
2001
4 6 p. 467-474
8 p.
artikel
30 [No title] Ramam, Akkipeddi
2001
4 6 p. 449-
1 p.
artikel
31 Novel In0.52Al0.48As/In0.53Ga0.47As metamorphic high electron mobility transistors on GaAs substrate with In x Ga1−x P graded buffer layers Yuan, K.
2001
4 6 p. 641-645
5 p.
artikel
32 Observation of compensation in GaN films grown by metalorganic chemical vapor deposition Chen, P.
2001
4 6 p. 591-594
4 p.
artikel
33 Optical characterization of as-prepared and rapid thermal oxidized partially strain compensated Si1−x−y Ge x C y films Feng, W.
2001
4 6 p. 655-659
5 p.
artikel
34 Optimization of compositionally graded In x Ga1−x P metamorphic buffer layers grown by solid source molecular beam epitaxy Yuan, K
2001
4 6 p. 637-640
4 p.
artikel
35 Photoluminescence of AlGaAs alloy grown by LP-MOVPE at different temperatures using TBA in N2 ambient Tang, X.H.
2001
4 6 p. 651-654
4 p.
artikel
36 Preparation and characterization of oriented III–V nitride thin films by nebulized spray pyrolysis Raju, A.R.
2001
4 6 p. 549-553
5 p.
artikel
37 Raman scattering study of a GaAsN epitaxial layer Yu, G.Y.
2001
4 6 p. 581-584
4 p.
artikel
38 Recent developments in spectroscopy of quantum structures Arora, B.M.
2001
4 6 p. 489-495
7 p.
artikel
39 Screw and edge dislocations-induced internal strain around micropipes of 6H-SiC single crystals Ohsato, H.
2001
4 6 p. 483-487
5 p.
artikel
40 Seeded growth of GaN at high N2 pressure on (0001) polar surfaces of GaN single crystalline substrates Grzegory, I.
2001
4 6 p. 535-541
7 p.
artikel
41 Study of electrically active defects in n-GaN layer Soh, C.B.
2001
4 6 p. 595-600
6 p.
artikel
42 Subject index-auto generate 2001
4 6 p. V-VII
nvt p.
artikel
43 Utilization of optical and electrical peculiarities of partially compensated zinc selenide Prokesch, M.
2001
4 6 p. 601-605
5 p.
artikel
44 Valence band structures and optical transitions of Ga1−x In x N yAs1−y/GaAs compressively strained quantum wells Fan, W.J.
2001
4 6 p. 563-566
4 p.
artikel
                             44 gevonden resultaten
 
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