| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Editorial Board
|
|
|
2012
|
43 |
4 |
p. CO2-
1 p.
|
artikel
|
| 2 |
Evaluation of probe size in STEM imaging at 30 and 60kV
|
Sasaki, Takeo
|
|
2012
|
43 |
4 |
p. 551-556
6 p.
|
artikel
|
| 3 |
Experimental study of annular bright field (ABF) imaging using aberration-corrected scanning transmission electron microscopy (STEM)
|
Okunishi, Eiji
|
|
2012
|
43 |
4 |
p. 538-544
7 p.
|
artikel
|
| 4 |
Imaging from atomic structure to electronic structure
|
Xu, Qiang
|
|
2012
|
43 |
4 |
p. 524-531
8 p.
|
artikel
|
| 5 |
Model-based electron microscopy: From images toward precise numbers for unknown structure parameters
|
Van Aert, S.
|
|
2012
|
43 |
4 |
p. 509-515
7 p.
|
artikel
|
| 6 |
On the structure of bimetallic noble metal nanoparticles as revealed by aberration corrected scanning transmission electron microscopy (STEM)
|
Mayoral, Alvaro
|
|
2012
|
43 |
4 |
p. 557-564
8 p.
|
artikel
|
| 7 |
Optimum correction conditions for aberration-corrected HRTEM SiC dumbbells chemical imaging
|
Texier, Michaël
|
|
2012
|
43 |
4 |
p. 516-523
8 p.
|
artikel
|
| 8 |
Performance and early applications of a versatile double aberration-corrected JEOL-2200FS FEG TEM/STEM at Aalto University
|
Jiang, Hua
|
|
2012
|
43 |
4 |
p. 545-550
6 p.
|
artikel
|
| 9 |
Preface
|
Calderon, Hector A.
|
|
2012
|
43 |
4 |
p. 503-
1 p.
|
artikel
|
| 10 |
Progress and problems for atomic-resolution electron microscopy
|
Smith, David J.
|
|
2012
|
43 |
4 |
p. 504-508
5 p.
|
artikel
|
| 11 |
Spatial resolution and radiation damage in quantitative high-resolution STEM-EEL spectroscopy in oxides
|
Houben, L.
|
|
2012
|
43 |
4 |
p. 532-537
6 p.
|
artikel
|
Tijdschrift beschrijving