| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
About using double multilayer monochromators in reflectometry
|
Syromyatnikov, V.G.
|
|
1998
|
248 |
1-4 |
p. 377-380
4 p.
|
artikel
|
| 2 |
ADAM, the new reflectometer at the ILL
|
Schreyer, A
|
|
1998
|
248 |
1-4 |
p. 349-354
6 p.
|
artikel
|
| 3 |
A high-resolution synchrotron X-ray scattering study of the surface and interface structures of YBa2Cu3O x thin films
|
Lin, W.J
|
|
1998
|
248 |
1-4 |
p. 56-61
6 p.
|
artikel
|
| 4 |
An X-ray diffraction study of direct-bonded silicon interfaces: A model semiconductor grain boundary
|
Howes, P.B.
|
|
1998
|
248 |
1-4 |
p. 74-78
5 p.
|
artikel
|
| 5 |
A white beam neutron spin splitter
|
Krist, Thomas
|
|
1998
|
248 |
1-4 |
p. 372-376
5 p.
|
artikel
|
| 6 |
Binary phase diagram of monolayers of simple 1,2-diol derivatives
|
DeWolf, C.
|
|
1998
|
248 |
1-4 |
p. 199-203
5 p.
|
artikel
|
| 7 |
Comparison between macroscopic and microscopic measurements of the shear elastic constant of alcohol monolayers at the air–water interface
|
Zakri, C
|
|
1998
|
248 |
1-4 |
p. 208-210
3 p.
|
artikel
|
| 8 |
Depth-dependent investigation of the distribution of the spin density waves in thin chromium films with surface X-ray and neutron scattering
|
Bödeker, P.
|
|
1998
|
248 |
1-4 |
p. 115-120
6 p.
|
artikel
|
| 9 |
Determination of the magnetic field penetration depth in YBa2Cu3O7 superconducting films by polarized neutron reflectometry
|
Lauter-Pasyuk, V.
|
|
1998
|
248 |
1-4 |
p. 166-170
5 p.
|
artikel
|
| 10 |
Dewetting of thin polymer films: an X-ray scattering study
|
Müller-Buschbaum, P.
|
|
1998
|
248 |
1-4 |
p. 229-237
9 p.
|
artikel
|
| 11 |
Energy-dispersive surface X-ray scattering study of thin ceria overlayer on zirconia: Structural evolution with temperature
|
Dmowski, W.
|
|
1998
|
248 |
1-4 |
p. 95-100
6 p.
|
artikel
|
| 12 |
Epitaxial clusters studied by synchrotron X-ray diffraction and scanning tunneling microscopy
|
Nielsen, M.
|
|
1998
|
248 |
1-4 |
p. 1-8
8 p.
|
artikel
|
| 13 |
Fe/Au multilayer growth fronts: Comparison of X-ray diffuse scattering results with atomic-force microscopy profiles
|
Paniago, R.
|
|
1998
|
248 |
1-4 |
p. 39-47
9 p.
|
artikel
|
| 14 |
Grazing incidence diffraction by epitaxial multilayered gratings
|
Baumbach, G.T
|
|
1998
|
248 |
1-4 |
p. 343-348
6 p.
|
artikel
|
| 15 |
High resolution X-ray scattering investigation of Pt/LaF3/Si(111) structures
|
Fanchenko, S.S
|
|
1998
|
248 |
1-4 |
p. 48-52
5 p.
|
artikel
|
| 16 |
High temperature neutron reflection spectroscopy of liquid metal/ceramic interfaces
|
Edwards, R.T.
|
|
1998
|
248 |
1-4 |
p. 316-321
6 p.
|
artikel
|
| 17 |
Hydrogen segregation at the Al/Si(111) interface
|
Felcher, G.P.
|
|
1998
|
248 |
1-4 |
p. 90-94
5 p.
|
artikel
|
| 18 |
Index
|
|
|
1998
|
248 |
1-4 |
p. 411-412
2 p.
|
artikel
|
| 19 |
Index
|
|
|
1998
|
248 |
1-4 |
p. 413-414
2 p.
|
artikel
|
| 20 |
In situ fixed angle X-ray reflectivity study of sputter-deposited amorphous LaNiO3 thin film on Si substrate
|
Lee, Chih-Hao
|
|
1998
|
248 |
1-4 |
p. 109-114
6 p.
|
artikel
|
| 21 |
Investigating liquid surfaces down to the nanometer scale using grazing incidence X-ray scattering
|
Fradin, C.
|
|
1998
|
248 |
1-4 |
p. 310-315
6 p.
|
artikel
|
| 22 |
Investigation of strain relaxation in GaInAs/GaAs superlattices by X-ray diffuse scattering
|
Ulyanenkov, A
|
|
1998
|
248 |
1-4 |
p. 25-30
6 p.
|
artikel
|
| 23 |
Investigation of the vertical molecular exchange in a complex organic multilayer system
|
Englisch, U.
|
|
1998
|
248 |
1-4 |
p. 258-262
5 p.
|
artikel
|
| 24 |
Liquid-like interfacial correlation in LB films
|
Sanyal, M.K.
|
|
1998
|
248 |
1-4 |
p. 217-222
6 p.
|
artikel
|
| 25 |
Magnetic anisotropy and exchange biasing in heterojunctions studied by transverse magnetic circular X-ray dichroism
|
van der Laan, G
|
|
1998
|
248 |
1-4 |
p. 121-126
6 p.
|
artikel
|
| 26 |
Measurement of the magnetism of a single atomic plane with X-ray diffraction
|
Ferrer, S.
|
|
1998
|
248 |
1-4 |
p. 9-13
5 p.
|
artikel
|
| 27 |
Microphase-separated interface of a two-component triblock copolymer with a lamellar structure
|
Torikai, Naoya
|
|
1998
|
248 |
1-4 |
p. 284-288
5 p.
|
artikel
|
| 28 |
Neutron double multilayer monochromator-polarizer Co/Ti
|
Syromyatnikov, V.G
|
|
1998
|
248 |
1-4 |
p. 355-357
3 p.
|
artikel
|
| 29 |
Neutron reflection studies of titanium segregation to metal–ceramic interfaces
|
Derby, Brian
|
|
1998
|
248 |
1-4 |
p. 304-309
6 p.
|
artikel
|
| 30 |
Neutron reflectivity studies of composite nanoparticle – copolymer thin films
|
Lauter-Pasyuk, V
|
|
1998
|
248 |
1-4 |
p. 243-245
3 p.
|
artikel
|
| 31 |
Neutron reflectivity study of a chemically end-grafted polystyrene brush in a binary solvent mixture
|
Satija, S.K.
|
|
1998
|
248 |
1-4 |
p. 204-207
4 p.
|
artikel
|
| 32 |
Neutron scattering studies of the structure and dynamics of methane absorbed on MgO(100) surfaces
|
Larese, J.Z.
|
|
1998
|
248 |
1-4 |
p. 297-303
7 p.
|
artikel
|
| 33 |
Non-specular spin-flipped neutron reflectivity from a cobalt film on glass
|
Fredrikze, Henk
|
|
1998
|
248 |
1-4 |
p. 157-162
6 p.
|
artikel
|
| 34 |
Non-specular X-ray reflection from sputtered Ni3Al/Ni multilayers
|
Tixier, S.
|
|
1998
|
248 |
1-4 |
p. 31-33
3 p.
|
artikel
|
| 35 |
On the growth process of a layered material on a covalent substrate: GaSe/Si
|
Jedrecy, Nathalie
|
|
1998
|
248 |
1-4 |
p. 67-73
7 p.
|
artikel
|
| 36 |
On the interface strain distribution in Si-on-sapphire system
|
Gartstein, E
|
|
1998
|
248 |
1-4 |
p. 79-82
4 p.
|
artikel
|
| 37 |
On the reflectivity of reactively sputtered Ni/Ti multilayers
|
Senthil Kumar, M
|
|
1998
|
248 |
1-4 |
p. 53-55
3 p.
|
artikel
|
| 38 |
Ordering of diblock PS-PBMA thin films: An X-ray reflectivity study
|
Vignaud, G
|
|
1998
|
248 |
1-4 |
p. 250-257
8 p.
|
artikel
|
| 39 |
Organic monolayers: Interface between 8CB liquid crystals and MoS2 monocrystal
|
Lacaze, E.
|
|
1998
|
248 |
1-4 |
p. 246-249
4 p.
|
artikel
|
| 40 |
Penetration depth of YBa2Cu3O7 measured by polarised neutron reflectometry
|
Reynolds, J.M
|
|
1998
|
248 |
1-4 |
p. 163-165
3 p.
|
artikel
|
| 41 |
Phase behaviour of a methyl branched phosphatidylethanolamine in two and three-dimensional systems
|
Bringezu, F.
|
|
1998
|
248 |
1-4 |
p. 211-216
6 p.
|
artikel
|
| 42 |
Phase determination and inversion in specular neutron reflectometry
|
Majkrzak, C.F.
|
|
1998
|
248 |
1-4 |
p. 338-342
5 p.
|
artikel
|
| 43 |
Resonant X-ray magnetic scattering from the twisted states of an Fe/Gd multilayer
|
Hashizume, H
|
|
1998
|
248 |
1-4 |
p. 133-139
7 p.
|
artikel
|
| 44 |
Resonant X-ray reflectivity measurements of a magnetic multilayer [Gd/Fe]10
|
Lee, D.R.
|
|
1998
|
248 |
1-4 |
p. 146-151
6 p.
|
artikel
|
| 45 |
SANS investigations of benzene adsorption on porous silica gel
|
Ramsay, John D.F.
|
|
1998
|
248 |
1-4 |
p. 322-326
5 p.
|
artikel
|
| 46 |
Sensitivity of magnetic X-ray dichroism for chemical order in MBE-grown FEPD layers
|
Kamp, P
|
|
1998
|
248 |
1-4 |
p. 127-132
6 p.
|
artikel
|
| 47 |
Some improvements and extensions of the application of specular neutron reflection to the study of interfaces
|
Li, Z.X.
|
|
1998
|
248 |
1-4 |
p. 171-183
13 p.
|
artikel
|
| 48 |
Specular and non-specular X-ray reflection from inorganic and organic multilayers
|
de Boer, D.K.G
|
|
1998
|
248 |
1-4 |
p. 274-279
6 p.
|
artikel
|
| 49 |
Strain relaxation in thin films of Cu grown on Ni(001)
|
Berg Rasmussen, Frank
|
|
1998
|
248 |
1-4 |
p. 34-38
5 p.
|
artikel
|
| 50 |
Structural and magnetic properties of ion beam sputtered NiMnSb films
|
Schlomka, J.-P.
|
|
1998
|
248 |
1-4 |
p. 140-145
6 p.
|
artikel
|
| 51 |
Structural characterisation of a GaAs surface wire structure by triple axis X-ray grazing incidence diffraction
|
Darowski, N.
|
|
1998
|
248 |
1-4 |
p. 104-108
5 p.
|
artikel
|
| 52 |
Structure studies of a phospholipid monolayer coupled to dextran sulfate
|
de Meijere, K.
|
|
1998
|
248 |
1-4 |
p. 269-273
5 p.
|
artikel
|
| 53 |
Surface activity of modified dendrimers at high compression
|
Kirton, G.F
|
|
1998
|
248 |
1-4 |
p. 184-190
7 p.
|
artikel
|
| 54 |
Surface and interfacial magnetic diffuse scattering
|
Takeda, Masayasu
|
|
1998
|
248 |
1-4 |
p. 14-24
11 p.
|
artikel
|
| 55 |
Surface effects in displacive phase transformations studied by X-ray specular reflectivity
|
Klemradt, U.
|
|
1998
|
248 |
1-4 |
p. 83-89
7 p.
|
artikel
|
| 56 |
Surface morphology by reflectivity of coherent X-rays
|
Robinson, I.K.
|
|
1998
|
248 |
1-4 |
p. 387-394
8 p.
|
artikel
|
| 57 |
Surface profiles from polarization measurements in neutron reflectometry
|
Lipperheide, R.
|
|
1998
|
248 |
1-4 |
p. 366-371
6 p.
|
artikel
|
| 58 |
Surfaces of tricontinuous structure formed by an ABC triblock copolymer in bulk
|
Matsushita, Yushu
|
|
1998
|
248 |
1-4 |
p. 238-242
5 p.
|
artikel
|
| 59 |
Synchrotron X-ray reflectivity study of Co/Cu multilayer structure
|
Tang, C.C.
|
|
1998
|
248 |
1-4 |
p. 395-398
4 p.
|
artikel
|
| 60 |
Texture determination by energy-dispersive XRD
|
Player, M.A.
|
|
1998
|
248 |
1-4 |
p. 405-410
6 p.
|
artikel
|
| 61 |
The Bayesian approach to reflectivity data
|
Sivia, D.S.
|
|
1998
|
248 |
1-4 |
p. 327-337
11 p.
|
artikel
|
| 62 |
The interface structure of thin liquid hexane films
|
Doerr, A.K
|
|
1998
|
248 |
1-4 |
p. 263-268
6 p.
|
artikel
|
| 63 |
The structure and composition of mixed cationic and non-ionic surfactant layers adsorbed at the hydrophilic silicon surface
|
Penfold, J.
|
|
1998
|
248 |
1-4 |
p. 223-228
6 p.
|
artikel
|
| 64 |
The structure of block copolymers at the fluid/fluid interface
|
Clifton, B.J.
|
|
1998
|
248 |
1-4 |
p. 289-296
8 p.
|
artikel
|
| 65 |
Thinning transitions and fluctuations of freely suspended smectic-A films as studied by specular and diffuse X-ray scattering
|
Mol, E.A.L.
|
|
1998
|
248 |
1-4 |
p. 191-198
8 p.
|
artikel
|
| 66 |
X-Ray and neutron reflectivity investigations of Co/Cu multilayers
|
Joyce, D.E.
|
|
1998
|
248 |
1-4 |
p. 152-156
5 p.
|
artikel
|
| 67 |
X-ray diffraction and reflectometry studies of porous silicon:
|
Chamard, V
|
|
1998
|
248 |
1-4 |
p. 101-103
3 p.
|
artikel
|
| 68 |
X-Ray diffraction under surface acoustic wave excitation
|
Sauer, W.
|
|
1998
|
248 |
1-4 |
p. 358-365
8 p.
|
artikel
|
| 69 |
X-ray reflection and diffuse scattering from sputtered gold films
|
Schug, C.
|
|
1998
|
248 |
1-4 |
p. 62-66
5 p.
|
artikel
|
| 70 |
X-ray reflection by multilayer surface gratings
|
Mikulı́k, Petr
|
|
1998
|
248 |
1-4 |
p. 381-386
6 p.
|
artikel
|
| 71 |
X-ray reflectivity study of fine structure of thin polymer films and polymer assembly at interface
|
Yamaoka, H
|
|
1998
|
248 |
1-4 |
p. 280-283
4 p.
|
artikel
|
| 72 |
X-ray scattering with partial coherent radiation: The exact relationship between “resolution” and “coherence”
|
Tolan, M.
|
|
1998
|
248 |
1-4 |
p. 399-404
6 p.
|
artikel
|
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