| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Ab initio calculations of the atomic and electronic structure of layered Ba0.5Sr0.5TiO3 structures
|
Piskunov, S.
|
|
2005
|
118 |
1-3 |
p. 15-18
4 p.
|
artikel
|
| 2 |
Agglomeration characteristic of particles in alumina slurry by addition of chemicals and milling process for Cu CMP
|
Choi, Min-Ho
|
|
2005
|
118 |
1-3 |
p. 306-309
4 p.
|
artikel
|
| 3 |
Application of tungsten slurry for copper-chemical mechanical polishing
|
Seo, Yong-Jin
|
|
2005
|
118 |
1-3 |
p. 285-288
4 p.
|
artikel
|
| 4 |
A systematic study of the chemical etching process on periodically poled lithium niobate structures
|
Argiolas, N.
|
|
2005
|
118 |
1-3 |
p. 150-154
5 p.
|
artikel
|
| 5 |
Atomic layer deposition rate, phase composition and performance of HfO2 films on noble metal and alkoxylated silicon substrates
|
Kukli, Kaupo
|
|
2005
|
118 |
1-3 |
p. 112-116
5 p.
|
artikel
|
| 6 |
author index
|
|
|
2005
|
118 |
1-3 |
p. 310-311
2 p.
|
artikel
|
| 7 |
Chromium-doped titanium oxide thin films
|
Mardare, Diana
|
|
2005
|
118 |
1-3 |
p. 187-191
5 p.
|
artikel
|
| 8 |
Chromium oxides thin films prepared and coated in situ with gold by pulsed laser deposition
|
Stanoi, D.
|
|
2005
|
118 |
1-3 |
p. 74-78
5 p.
|
artikel
|
| 9 |
Comparision of residual stress and optical properties in Ta2O5 thin films deposited by single and dual ion beam sputtering
|
Yoon, S.G.
|
|
2005
|
118 |
1-3 |
p. 234-237
4 p.
|
artikel
|
| 10 |
Compositional and structural analysis of iron doped X-cut lithium niobate crystals
|
Sada, C.
|
|
2005
|
118 |
1-3 |
p. 155-159
5 p.
|
artikel
|
| 11 |
Dependence of oxygen flow rate on piezoelectric photothermal spectra of ZnO thin films grown by a reactive plasma deposition
|
Kakeno, T.
|
|
2005
|
118 |
1-3 |
p. 70-73
4 p.
|
artikel
|
| 12 |
Dependency of the properties of Sr x Bi y Ta2O9 thin films on the Sr and Bi stoichiometry
|
Viapiana, Matteo
|
|
2005
|
118 |
1-3 |
p. 34-38
5 p.
|
artikel
|
| 13 |
Deposition of nanocomposite Zr–ZrO2 films by reactive cathodic vacuum arc evaporation
|
Čyvienė, J.
|
|
2005
|
118 |
1-3 |
p. 238-241
4 p.
|
artikel
|
| 14 |
Development of a novel gas sensor based on oxide thick films
|
Arshak, K.
|
|
2005
|
118 |
1-3 |
p. 44-49
6 p.
|
artikel
|
| 15 |
Doped versus pure TGS crystals
|
Berbecaru, C.
|
|
2005
|
118 |
1-3 |
p. 141-146
6 p.
|
artikel
|
| 16 |
Dynamic scaling of hysteresis dispersion in ferroelectrics
|
Liu, J.-M.
|
|
2005
|
118 |
1-3 |
p. 2-6
5 p.
|
artikel
|
| 17 |
Editorial
|
Fragalà, Ignazio L.
|
|
2005
|
118 |
1-3 |
p. 1-
1 p.
|
artikel
|
| 18 |
Effect of hydrogen plasma treatment on the electrical properties of sputtered N-doped cuprous oxide films
|
Lu, Yang-Ming
|
|
2005
|
118 |
1-3 |
p. 179-182
4 p.
|
artikel
|
| 19 |
Effect of interlayer composition on passivation of (100)Si/HfO2 interface states by hydrogen
|
Truong, L.
|
|
2005
|
118 |
1-3 |
p. 197-200
4 p.
|
artikel
|
| 20 |
Effect of lanthanides-substituted on ferroelectric properties of bismuth titanate thin films prepared by metalorganic decomposition
|
Kim, Kyoung-Tae
|
|
2005
|
118 |
1-3 |
p. 229-233
5 p.
|
artikel
|
| 21 |
Effect of nonionic surfactants on the stability of alumina slurry for Cu CMP
|
Lee, Do-Won
|
|
2005
|
118 |
1-3 |
p. 293-300
8 p.
|
artikel
|
| 22 |
Effects of deposition temperature on the microstructural and electrical properties of praseodymium oxide-based films
|
Nigro, Raffaella Lo
|
|
2005
|
118 |
1-3 |
p. 117-121
5 p.
|
artikel
|
| 23 |
Effects of different oxidizers on the W-CMP performance
|
Seo, Yong-Jin
|
|
2005
|
118 |
1-3 |
p. 281-284
4 p.
|
artikel
|
| 24 |
Effects of the thermal annealing processes on praseodymium oxide based films grown on silicon substrates
|
Lo Nigro, Raffaella
|
|
2005
|
118 |
1-3 |
p. 192-196
5 p.
|
artikel
|
| 25 |
Fabrication and characterization of CuAlO2 transparent thin films prepared by spray technique
|
Bouzidi, C.
|
|
2005
|
118 |
1-3 |
p. 259-263
5 p.
|
artikel
|
| 26 |
Ferroelectric solid solutions (Ba,Sr)TiO3 for microwave applications
|
Alexandru, H.V.
|
|
2005
|
118 |
1-3 |
p. 92-96
5 p.
|
artikel
|
| 27 |
Fluorine-free and fluorine containing MOCVD precursors for electronic oxides: a comparison
|
Bedoya, C.
|
|
2005
|
118 |
1-3 |
p. 264-269
6 p.
|
artikel
|
| 28 |
Imaging and investigation of non-uniform distributions of electrophysical properties of insulator–semiconductor structures with thin oxides
|
Popov, V.M.
|
|
2005
|
118 |
1-3 |
p. 170-174
5 p.
|
artikel
|
| 29 |
Impact of physical and electrical thickness scaling on the reliability of plasma-nitrided gate dielectrics in a 90 nm SOI manufacturing technology
|
Geilenkeuser, R.
|
|
2005
|
118 |
1-3 |
p. 50-54
5 p.
|
artikel
|
| 30 |
Influence of structure changes of oxide films on their physical properties
|
Mukashev, B.N.
|
|
2005
|
118 |
1-3 |
p. 164-169
6 p.
|
artikel
|
| 31 |
Influence of the oxygen/argon ratio on the properties of sputtered hafnium oxide
|
Pereira, L.
|
|
2005
|
118 |
1-3 |
p. 210-213
4 p.
|
artikel
|
| 32 |
Infrared spectra of proton-exchanged waveguides in LiNbO3 and LiTaO3
|
Kuneva, M.K.
|
|
2005
|
118 |
1-3 |
p. 301-305
5 p.
|
artikel
|
| 33 |
Inside front cover
|
|
|
2005
|
118 |
1-3 |
p. CO2-
1 p.
|
artikel
|
| 34 |
Interface reactivity of Pr and SiO2 at 4H-SiC(0001)
|
Schmeißer, D.
|
|
2005
|
118 |
1-3 |
p. 19-22
4 p.
|
artikel
|
| 35 |
Investigations on the optical constants of indium oxide thin films prepared by ultrasonic spray pyrolysis
|
Girtan, Mihaela
|
|
2005
|
118 |
1-3 |
p. 175-178
4 p.
|
artikel
|
| 36 |
ITO films with enhanced electrical properties deposited on unheated ZnO-coated polymer substrates
|
Nunes de Carvalho, C.
|
|
2005
|
118 |
1-3 |
p. 66-69
4 p.
|
artikel
|
| 37 |
ITO properties on anisotropic flexible transparent cellulosic substrates under different stress conditions
|
Amaral, A.
|
|
2005
|
118 |
1-3 |
p. 183-186
4 p.
|
artikel
|
| 38 |
Microstructure and dielectric properties of compositionally-graded (Ba1−x Sr x )TiO3 thin films
|
Zhu, Xinhua
|
|
2005
|
118 |
1-3 |
p. 219-224
6 p.
|
artikel
|
| 39 |
Microstructure of (110)-oriented epitaxial SrRuO3 thin films grown on off-cut single crystal YSZ(100) substrates
|
Zhu, Xinhua
|
|
2005
|
118 |
1-3 |
p. 60-65
6 p.
|
artikel
|
| 40 |
Microwave loss mechanisms in Ba0.25Sr0.75TiO3 films
|
Vorobiev, A.
|
|
2005
|
118 |
1-3 |
p. 214-218
5 p.
|
artikel
|
| 41 |
Mixed and carbon filled oxide materials as gamma radiation sensors
|
Arshak, K.
|
|
2005
|
118 |
1-3 |
p. 275-280
6 p.
|
artikel
|
| 42 |
NH3-RTP grown ultra-thin oxynitride layers for MOS gate applications
|
Chung, H.Y.A.
|
|
2005
|
118 |
1-3 |
p. 55-59
5 p.
|
artikel
|
| 43 |
Nickel-doped (Zr0.8, Sn0.2)TiO4 for microwave and millimeter-wave applications
|
Ioachim, A.
|
|
2005
|
118 |
1-3 |
p. 205-209
5 p.
|
artikel
|
| 44 |
Optimization of SiN thin film for high index contrast planar silica waveguides
|
Kim, Y.T.
|
|
2005
|
118 |
1-3 |
p. 242-245
4 p.
|
artikel
|
| 45 |
Oxidation of macroporous silicon for thick thermal insulation
|
Kan, P.Y.Y.
|
|
2005
|
118 |
1-3 |
p. 289-292
4 p.
|
artikel
|
| 46 |
Oxynitrides on 4H–SiC(0001)
|
Hoffmann, P.
|
|
2005
|
118 |
1-3 |
p. 270-274
5 p.
|
artikel
|
| 47 |
Polarization comparison of Pb(Zr,Ti)O3 and Bi4Ti3O12-based ferroelectrics
|
Funakubo, Hiroshi
|
|
2005
|
118 |
1-3 |
p. 23-27
5 p.
|
artikel
|
| 48 |
Porogen concentration and its desorbing temperature dependence in porous silica film incorporated with ethylene groups
|
Uchida, Yasutaka
|
|
2005
|
118 |
1-3 |
p. 250-252
3 p.
|
artikel
|
| 49 |
Preparation of La0.5Sr0.5CoO3 powders and thin film from a new aqueous solution–gel precursor
|
Pagnaer, J.
|
|
2005
|
118 |
1-3 |
p. 79-83
5 p.
|
artikel
|
| 50 |
Properties of La and Nb-modified PZT thin films grown by radio frequency assisted pulsed laser deposition
|
Verardi, P.
|
|
2005
|
118 |
1-3 |
p. 39-43
5 p.
|
artikel
|
| 51 |
Pulsed liquid-injection MOCVD of high-K oxides for advanced semiconductor technologies
|
Dubourdieu, C.
|
|
2005
|
118 |
1-3 |
p. 105-111
7 p.
|
artikel
|
| 52 |
γ-Radiation influence on the photoelectrical properties of oxide–p-InSe heterostructure
|
Kovalyuk, Z.D.
|
|
2005
|
118 |
1-3 |
p. 147-149
3 p.
|
artikel
|
| 53 |
Reaction mechanism of a lanthanum precursor in liquid source metalorganic chemical vapor deposition
|
Nakamura, Toshihiro
|
|
2005
|
118 |
1-3 |
p. 253-258
6 p.
|
artikel
|
| 54 |
Recent developments in the MOCVD and ALD of rare earth oxides and silicates
|
Jones, Anthony C.
|
|
2005
|
118 |
1-3 |
p. 97-104
8 p.
|
artikel
|
| 55 |
Room temperature dc and ac electrical behaviour of undoped ZnO films under UV light
|
Martins, R.
|
|
2005
|
118 |
1-3 |
p. 135-140
6 p.
|
artikel
|
| 56 |
Self-organization of ferroelectric grains in self-supported nanocrystalline films
|
Lyahovitskaya, V.
|
|
2005
|
118 |
1-3 |
p. 12-14
3 p.
|
artikel
|
| 57 |
SnO2 films: formation, electrical and optical properties
|
Gorley, P.M.
|
|
2005
|
118 |
1-3 |
p. 160-163
4 p.
|
artikel
|
| 58 |
Solid phase crystallisation of HfO2 thin films
|
Modreanu, M.
|
|
2005
|
118 |
1-3 |
p. 127-131
5 p.
|
artikel
|
| 59 |
Structural analysis of the Mn–Zn ferrites using XRD technique
|
Ghazanfar, Uzma
|
|
2005
|
118 |
1-3 |
p. 84-86
3 p.
|
artikel
|
| 60 |
Structural and dielectric properties of ZrTiO4 and Zr0.8Sn0.2TiO4 deposited by pulsed laser deposition
|
Viticoli, M.
|
|
2005
|
118 |
1-3 |
p. 87-91
5 p.
|
artikel
|
| 61 |
Study of room temperature dc resistivity in comparison with activation energy and drift mobility of NiZn ferrites
|
Ghazanfar, Uzma
|
|
2005
|
118 |
1-3 |
p. 132-134
3 p.
|
artikel
|
| 62 |
subject index
|
|
|
2005
|
118 |
1-3 |
p. 312-317
6 p.
|
artikel
|
| 63 |
Switching fatigue of ferroelectric layered-perovskite thin films: temperature effect
|
Yuan, G.L.
|
|
2005
|
118 |
1-3 |
p. 225-228
4 p.
|
artikel
|
| 64 |
The epitaxial ZrO2 on silicon as alternative gate dielectric: film growth, characterization and electronic structure calculations
|
Wang, S.J.
|
|
2005
|
118 |
1-3 |
p. 122-126
5 p.
|
artikel
|
| 65 |
The etching properties of Al2O3 thin films in N2/Cl2/BCl3 and Ar/Cl2/BCl3 gas chemistry
|
Koo, Seong-Mo
|
|
2005
|
118 |
1-3 |
p. 201-204
4 p.
|
artikel
|
| 66 |
UV pulsed laser deposition of magnetite thin films
|
Paramês, M.L.
|
|
2005
|
118 |
1-3 |
p. 246-249
4 p.
|
artikel
|
| 67 |
Viscoplastic behaviour of perovskite type ferroelectrics
|
Belov, A.Yu.
|
|
2005
|
118 |
1-3 |
p. 7-11
5 p.
|
artikel
|
| 68 |
Wafer level reliability and leakage current modeling of PZT capacitors
|
Bouyssou, E.
|
|
2005
|
118 |
1-3 |
p. 28-33
6 p.
|
artikel
|
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