| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Anisotropy of fields of stress in Si monocrystals with ordered dislocation structure
|
Gorid’ko, N.Ya
|
|
2000
|
288 |
2 |
p. 191-195
5 p.
|
artikel
|
| 2 |
Cracking behaviours and stresses release in titanium matrix composites
|
Fang, Q
|
|
2000
|
288 |
2 |
p. 142-147
6 p.
|
artikel
|
| 3 |
Dependence of strain at the (111)Si/SiO2 interface on interfacial Si dangling-bond concentration
|
Nouwen, B
|
|
2000
|
288 |
2 |
p. 239-243
5 p.
|
artikel
|
| 4 |
Elastic and plastic strains in Al/TiW/Si contacts during thermal cycles
|
Berger, S.
|
|
2000
|
288 |
2 |
p. 164-167
4 p.
|
artikel
|
| 5 |
Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moiré fringe pattern
|
Pailloux, F
|
|
2000
|
288 |
2 |
p. 244-247
4 p.
|
artikel
|
| 6 |
Etching effect on the texture and the stress of copper layers evaporated on Si(100)
|
Benouattas, N
|
|
2000
|
288 |
2 |
p. 253-256
4 p.
|
artikel
|
| 7 |
Evaluations of the intrinsic stress value in silicon wafers from photovoltage measurements
|
Patrin, A.
|
|
2000
|
288 |
2 |
p. 177-181
5 p.
|
artikel
|
| 8 |
Experimental and numerical residual stress analysis of layer coated composites
|
Buchmann, M
|
|
2000
|
288 |
2 |
p. 154-159
6 p.
|
artikel
|
| 9 |
Index
|
|
|
2000
|
288 |
2 |
p. 304-309
6 p.
|
artikel
|
| 10 |
Index
|
|
|
2000
|
288 |
2 |
p. 303-
1 p.
|
artikel
|
| 11 |
Influence of a weak magnetic field on spin-dependent relaxation of structural defects in diamagnetic crystals
|
Golovin, Yu.I
|
|
2000
|
288 |
2 |
p. 261-265
5 p.
|
artikel
|
| 12 |
Influence of intrinsic stresses on crystallographic defects distribution in Cz-Si wafers
|
Piotrowski, T
|
|
2000
|
288 |
2 |
p. 200-204
5 p.
|
artikel
|
| 13 |
Interstitial boron in tungsten: modeling of lattice tetragonality
|
Dorfman, Simon
|
|
2000
|
288 |
2 |
p. 257-260
4 p.
|
artikel
|
| 14 |
Investigation of residual stresses in microsystems using X-ray diffraction
|
Kämpfe, Bernd
|
|
2000
|
288 |
2 |
p. 119-125
7 p.
|
artikel
|
| 15 |
Laser shock waves as a tool of changing the strains in materials
|
Nikiforov, Y.
|
|
2000
|
288 |
2 |
p. 173-176
4 p.
|
artikel
|
| 16 |
Magnetophonon resonance as method of controlling of the thermal stress in the multiple quantum wells
|
Tomaka, G.
|
|
2000
|
288 |
2 |
p. 138-141
4 p.
|
artikel
|
| 17 |
Measurement of residual stresses in a plate using bulging test and a dynamic technique: application to electroplated nickel coatings
|
Basrour, S
|
|
2000
|
288 |
2 |
p. 160-163
4 p.
|
artikel
|
| 18 |
Micro-Raman stress imaging of ceramic (C, SiC)-fiber-reinforced ceramic-matrix and metal–matrix composites
|
Gouadec, G
|
|
2000
|
288 |
2 |
p. 132-137
6 p.
|
artikel
|
| 19 |
Morphological and structural characteristics presented by the Cu–Sn–Cu metallurgical system used in electronic joints
|
Ferreira, J
|
|
2000
|
288 |
2 |
p. 248-252
5 p.
|
artikel
|
| 20 |
Neutron strain scanning on bimetallic tubes
|
Borlado, C.R
|
|
2000
|
288 |
2 |
p. 288-292
5 p.
|
artikel
|
| 21 |
Production of preset quality large Na(I)(Tl) single crystals for detectors used in medical instrument building
|
Goriletsky, V.I
|
|
2000
|
288 |
2 |
p. 196-199
4 p.
|
artikel
|
| 22 |
Residual stresses in chemical vapor deposition free-standing diamond films by X-ray diffraction analyses
|
Durand, O
|
|
2000
|
288 |
2 |
p. 217-222
6 p.
|
artikel
|
| 23 |
Residual stresses in new rails
|
Schleinzer, G.
|
|
2000
|
288 |
2 |
p. 280-283
4 p.
|
artikel
|
| 24 |
Residual stresses in titanium matrix composites (TMC) in thermomechanical cycling using matrix etching
|
Fang, Q.
|
|
2000
|
288 |
2 |
p. 293-297
5 p.
|
artikel
|
| 25 |
Residual stress measurement by Hertzian indentation
|
Bisrat, Y
|
|
2000
|
288 |
2 |
p. 148-153
6 p.
|
artikel
|
| 26 |
Role of soldering parameters on the electrical performances presented by Cu–Sn–Cu joints used in power diodes
|
Martins, R
|
|
2000
|
288 |
2 |
p. 275-279
5 p.
|
artikel
|
| 27 |
Scanning force microscope study of detachment of nanometer adhering particulates
|
Dickinson, J.T.
|
|
2000
|
288 |
2 |
p. 182-186
5 p.
|
artikel
|
| 28 |
Strain mapping by diffraction imaging
|
Wroblewski, T
|
|
2000
|
288 |
2 |
p. 126-131
6 p.
|
artikel
|
| 29 |
Stress and surface studies of SILAR grown ZnS thin films on (100)GaAs substrates
|
Laukaitis, G
|
|
2000
|
288 |
2 |
p. 223-230
8 p.
|
artikel
|
| 30 |
Stress relaxation effects in Ag/Pd superlattices at initial stages of ion beam mixing
|
Pienkos, T
|
|
2000
|
288 |
2 |
p. 266-269
4 p.
|
artikel
|
| 31 |
Stress resistance parameters of brittle solids under laser/plasma pulse heating
|
Gurarie, V.N.
|
|
2000
|
288 |
2 |
p. 168-172
5 p.
|
artikel
|
| 32 |
Stress-textural indicators of tribological wear
|
Starczewski, L
|
|
2000
|
288 |
2 |
p. 284-287
4 p.
|
artikel
|
| 33 |
Strong elastic deformation influence on scattering mechanisms in quantum wires based on semimetals
|
Nikolaeva, A
|
|
2000
|
288 |
2 |
p. 298-302
5 p.
|
artikel
|
| 34 |
Two-dimensional mapping of residual stress-induced birefringence in differently-grown semiconductors for optical communication applications
|
Milani, A
|
|
2000
|
288 |
2 |
p. 205-208
4 p.
|
artikel
|
| 35 |
X-ray characterization of residual stresses in electroplated nickel used in LIGA technique
|
Basrour, S.
|
|
2000
|
288 |
2 |
p. 270-274
5 p.
|
artikel
|
| 36 |
X-ray diffraction as a tool to study the mechanical behaviour of thin films
|
Kraft, O
|
|
2000
|
288 |
2 |
p. 209-216
8 p.
|
artikel
|
| 37 |
X-ray diffraction under non-hydrostatic conditions in experiments with diamond anvil cell: wüstite (FeO) as an example
|
Dubrovinsky, L
|
|
2000
|
288 |
2 |
p. 187-190
4 p.
|
artikel
|
| 38 |
X-ray reflectivity study of formation of multilayer porous anodic oxides of silicon
|
Fenollosa, R
|
|
2000
|
288 |
2 |
p. 235-238
4 p.
|
artikel
|
| 39 |
X-ray study of SrTiO3 thin films in multilayer structures
|
Petrov, P.K
|
|
2000
|
288 |
2 |
p. 231-234
4 p.
|
artikel
|
Tijdschrift beschrijving