| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A wavelength dispersive X–ray spectrometer for small area X–ray fluorescence spectroscopy at SPring–8 BL39XU
|
Hayakawa, Shinjiro
|
|
1999
|
54 |
1 |
p. 171-177
7 p.
|
artikel
|
| 2 |
Calculation of Anisotropic C K X–ray Emission Spectra of Carbons and Related Materials
|
Kim, Sujin
|
|
1999
|
54 |
1 |
p. 179-187
9 p.
|
artikel
|
| 3 |
Comparison between X-ray photoelectron and X-ray absorption spectra of an environmental aerosol sample measured by synchrotron radiation
|
Kawai, Jun
|
|
1999
|
54 |
1 |
p. 241-245
5 p.
|
artikel
|
| 4 |
Conversion electron yield X-ray absorption fine structure measurements under atmospheric conditions
|
Hayakawa, Shinjiro
|
|
1999
|
54 |
1 |
p. 235-239
5 p.
|
artikel
|
| 5 |
Development of a new in situ cell for the X–ray Absorption Fine Structure analysis of the electrochemical reaction in a rechargeable battery and its application to the Lithium Battery Material, Li1+yMn2−yO4
|
Nakai, Izumi
|
|
1999
|
54 |
1 |
p. 143-149
7 p.
|
artikel
|
| 6 |
Difference in the Tunnel Current–Tunnel Gap Width Dependence of Molecule–Adsorbed and Non–Adsorbed Graphite Measured by Means of Tunnel Gap Imaging
|
Miyamura, Kazuo
|
|
1999
|
54 |
1 |
p. 163-166
4 p.
|
artikel
|
| 7 |
Ecological study of the migration of eel by synchrotron radiation induced X–ray fluorescence imaging of otoliths
|
Nakai, Izumi
|
|
1999
|
54 |
1 |
p. 167-170
4 p.
|
artikel
|
| 8 |
Editorial
|
|
|
1999
|
54 |
1 |
p. 5-
1 p.
|
artikel
|
| 9 |
Editorial
|
|
|
1999
|
54 |
1 |
p. 1-2
2 p.
|
artikel
|
| 10 |
Generality of the scattering dilution method for FT-IR spectrometry
|
Kaihara, Mikio
|
|
1999
|
54 |
1 |
p. 83-89
7 p.
|
artikel
|
| 11 |
Grazing incidence X-ray absorption spectra of (Si/W) 100/Si multilayer
|
Hayashi, Kouichi
|
|
1999
|
54 |
1 |
p. 223-226
4 p.
|
artikel
|
| 12 |
K–edge X–ray absorption spectra of argon in sputtered aluminum films
|
Takemura, Momoko
|
|
1999
|
54 |
1 |
p. 159-162
4 p.
|
artikel
|
| 13 |
K-line X-ray fluorescence analysis of high-Z elements
|
Harada, Masaaki
|
|
1999
|
54 |
1 |
p. 29-39
11 p.
|
artikel
|
| 14 |
Light element analysis in steel by high–energy heavy–ion time of flight elastic recoil detection analysis
|
Hong, Wan
|
|
1999
|
54 |
1 |
p. 151-157
7 p.
|
artikel
|
| 15 |
Many-body effects in X-ray photoemission spectroscopy and electronic properties of solids
|
Kohiki, Shigemi
|
|
1999
|
54 |
1 |
p. 123-131
9 p.
|
artikel
|
| 16 |
Molecular orbital calculation of graphite K-V X-ray emission spectra
|
Kaneyoshi, Takahiro
|
|
1999
|
54 |
1 |
p. 189-196
8 p.
|
artikel
|
| 17 |
Quantitative depth profiling by laser-ionization sputtered neutral mass spectrometry
|
Higashi, Yasuhiro
|
|
1999
|
54 |
1 |
p. 109-122
14 p.
|
artikel
|
| 18 |
Recent performance of laboratory-scale X-ray absorption fine structure instruments
|
Sakurai, Kenji
|
|
1999
|
54 |
1 |
p. 99-107
9 p.
|
artikel
|
| 19 |
Refracted X-rays propagating near the surface under grazing incidence condition
|
Hayashi, Kouichi
|
|
1999
|
54 |
1 |
p. 227-230
4 p.
|
artikel
|
| 20 |
Review on grazing incidence X-ray spectrometry and reflectometry
|
Stoev, Krassimir N.
|
|
1999
|
54 |
1 |
p. 41-82
42 p.
|
artikel
|
| 21 |
Si X-ray absorption near edge structure (XANES) of Si, SiC, SiO2, and Si3N4 measured by an electron probe X-ray microanalyzer (EPMA)
|
Kawai, Jun
|
|
1999
|
54 |
1 |
p. 231-234
4 p.
|
artikel
|
| 22 |
Surface enhancement effect on the diffuse reflectance infrared Fourier transform spectra of compounds having a pyridine ring
|
Higuchi, Seiichiro
|
|
1999
|
54 |
1 |
p. 205-214
10 p.
|
artikel
|
| 23 |
Trace analysis, chemical state analysis and instrumentation chemistry – several experiences in research life
|
Gohshi, Yohichi
|
|
1999
|
54 |
1 |
p. 21-28
8 p.
|
artikel
|
| 24 |
XAFS analysis of coprecipitation of zinc by sulfide ions in an acidic solution
|
Numako, Chiya
|
|
1999
|
54 |
1 |
p. 133-141
9 p.
|
artikel
|
| 25 |
X–ray absorption fine structure (XAFS) of Si wafer measured using total reflection X–rays
|
Kawai, Jun
|
|
1999
|
54 |
1 |
p. 215-222
8 p.
|
artikel
|
| 26 |
X–ray fluorescent spectroscopy with a focused X–ray beam collimated by a glass capillary guide tube and element mapping of biological samples
|
Fukumoto, Natsuo
|
|
1999
|
54 |
1 |
p. 91-98
8 p.
|
artikel
|
| 27 |
X–ray Spectroscopic Analysis of Solid State Reaction during Mechanical Alloying
|
Yamada, Kazutoshi
|
|
1999
|
54 |
1 |
p. 197-203
7 p.
|
artikel
|
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