| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A comparison of electrostatic discharge models and failure signatures for CMOS integrated circuit devices
|
Kelly, M.
|
|
1996
|
38 |
1-2 |
p. 53-71
19 p.
|
artikel
|
| 2 |
Analysis of snubber-clamped diode-string mixed voltage interface ESD protection network for advanced microprocessors
|
Voldman, Steven H.
|
|
1996
|
38 |
1-2 |
p. 3-31
29 p.
|
artikel
|
| 3 |
Calendar
|
|
|
1996
|
38 |
1-2 |
p. 175-
1 p.
|
artikel
|
| 4 |
Editorial
|
Greason, William D.
|
|
1996
|
38 |
1-2 |
p. 1-
1 p.
|
artikel
|
| 5 |
Editorial Board
|
|
|
1996
|
38 |
1-2 |
p. iii-
1 p.
|
artikel
|
| 6 |
ESD failure mechanisms of inductive and magnetoresistive recording heads
|
Wallash, Albert J.
|
|
1996
|
38 |
1-2 |
p. 159-173
15 p.
|
artikel
|
| 7 |
ESD: waveform calculation, field and current of human and simulator ESD
|
Pommerenke, David
|
|
1996
|
38 |
1-2 |
p. 33-51
19 p.
|
artikel
|
| 8 |
Failure analysis of shallow trench isolated ESD structures
|
Never, James M.
|
|
1996
|
38 |
1-2 |
p. 93-112
20 p.
|
artikel
|
| 9 |
Latent gate oxide damages caused by CDM-ESD
|
Reiner, Joachim C.
|
|
1996
|
38 |
1-2 |
p. 131-157
27 p.
|
artikel
|
| 10 |
Layout optimization of an ESD-protection n-MOSFET by simulation and measurement
|
Stricker, Andreas
|
|
1996
|
38 |
1-2 |
p. 73-92
20 p.
|
artikel
|
| 11 |
Melt filaments in n+pn+ lateral bipolar ESD protection devices
|
Clark, Neal K.
|
|
1996
|
38 |
1-2 |
p. 113-129
17 p.
|
artikel
|
Tijdschrift beschrijving