| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Absolute cross section for hydrogen forward scattering
|
Baglin, J.E.E.
|
|
1992
|
64 |
1-4 |
p. 469-474
6 p.
|
artikel
|
| 2 |
Accelerator mass spectrometry — fascinating applications and their technical challenges
|
Suter, M.
|
|
1992
|
64 |
1-4 |
p. 321-329
9 p.
|
artikel
|
| 3 |
Accelerator terminal voltage stability
|
Ferry, J.A.
|
|
1992
|
64 |
1-4 |
p. 309-312
4 p.
|
artikel
|
| 4 |
A comparative study of deuterium ingress from solution into Zr, Zircaloy-2 and Zr-2.5wt.% Nb by nuclear reaction analysis at the liquid-solid interface
|
Forster, J.S.
|
|
1992
|
64 |
1-4 |
p. 403-407
5 p.
|
artikel
|
| 5 |
A comparison between high- and low-energy ion mixing at different temperatures
|
Yang-Tse, Cheng
|
|
1992
|
64 |
1-4 |
p. 38-47
10 p.
|
artikel
|
| 6 |
A grouping strategy for autoconvolution summation in the stochastic theory for energy straggling and narrow resonance excitation curve calculations
|
Vickridge, Ian
|
|
1992
|
64 |
1-4 |
p. 687-691
5 p.
|
artikel
|
| 7 |
A high-resolution electrostatic spectrometer for the investigation of near-surface layers in solids by high-resolution Rutherford backscattering with MeV ions
|
Enders, Th.
|
|
1992
|
64 |
1-4 |
p. 817-824
8 p.
|
artikel
|
| 8 |
A minicyclotron for a scanning proton muprobe
|
van der Heide, J.A.
|
|
1992
|
64 |
1-4 |
p. 336-341
6 p.
|
artikel
|
| 9 |
Analysis of co-sputtered in situ annealed superconducting Y1Ba2Cu3O7 − x thin films
|
Saarilahti, J.
|
|
1992
|
64 |
1-4 |
p. 193-197
5 p.
|
artikel
|
| 10 |
Analysis of defects in weakly damaged GaAs by Monte Carlo channeling simulation
|
Dygo, A.
|
|
1992
|
64 |
1-4 |
p. 721-723
3 p.
|
artikel
|
| 11 |
Analysis of IMF-grown CdxHg1 − xTe using helium ion RBS
|
Avery, A.J.
|
|
1992
|
64 |
1-4 |
p. 134-137
4 p.
|
artikel
|
| 12 |
A new microbeam formation system
|
Agawa, Y.
|
|
1992
|
64 |
1-4 |
p. 349-352
4 p.
|
artikel
|
| 13 |
A new Monte Carlo model for the calculation of MEIS energy spectra
|
Alkemade, P.F.A.
|
|
1992
|
64 |
1-4 |
p. 716-720
5 p.
|
artikel
|
| 14 |
Angle-resolved imaging of single-crystal materials with MeV helium ions
|
Strathman, M.D.
|
|
1992
|
64 |
1-4 |
p. 840-845
6 p.
|
artikel
|
| 15 |
An investigation of the Cs bombardment induced altered layer in Si by MEIS, RBS, SIMS and IMPETUS simulation
|
Valizadeh, R.
|
|
1992
|
64 |
1-4 |
p. 609-613
5 p.
|
artikel
|
| 16 |
Annealing studies on ion implanted diamond
|
Spits, R.A.
|
|
1992
|
64 |
1-4 |
p. 210-214
5 p.
|
artikel
|
| 17 |
Application of FTIR, PIXE, and EBS for trace element analysis in biological samples
|
Kwiatek, W.M.
|
|
1992
|
64 |
1-4 |
p. 512-516
5 p.
|
artikel
|
| 18 |
Application of ion beam analysis (RBS and ERD) to the surface chemistry study of leached minerals
|
Arnold, G.W.
|
|
1992
|
64 |
1-4 |
p. 542-546
5 p.
|
artikel
|
| 19 |
Applications of scanning transmission ion microscopy
|
Breese, M.B.H.
|
|
1992
|
64 |
1-4 |
p. 505-511
7 p.
|
artikel
|
| 20 |
A quantitative study of copper segregation in silicon under oxygen ion beam bombardment using SIMS
|
Kilner, J.A.
|
|
1992
|
64 |
1-4 |
p. 632-635
4 p.
|
artikel
|
| 21 |
A study of carbon thin films by ion beams
|
Noriaki, Matsunami
|
|
1992
|
64 |
1-4 |
p. 800-802
3 p.
|
artikel
|
| 22 |
Atomic positions on oxygen-covered Cu(110) surfaces
|
Dorenbos, G.
|
|
1992
|
64 |
1-4 |
p. 88-92
5 p.
|
artikel
|
| 23 |
Author index
|
|
|
1992
|
64 |
1-4 |
p. 853-866
14 p.
|
artikel
|
| 24 |
Backscattering and channeling study of lead inclusions in Pb-implanted aluminium
|
Bourdelle, K.K.
|
|
1992
|
64 |
1-4 |
p. 143-148
6 p.
|
artikel
|
| 25 |
Basic requirements for quantitative SIMS analysis using cesium bombardment and detection of MCs+ secondary ions
|
Wittmaack, K.
|
|
1992
|
64 |
1-4 |
p. 621-625
5 p.
|
artikel
|
| 26 |
Beam assisted molecular rearrangement observed by TDPAD for fluorine complexes in diamond
|
Sideras-Haddad, E.
|
|
1992
|
64 |
1-4 |
p. 237-241
5 p.
|
artikel
|
| 27 |
Calculation of ion mixing and energy deposition using a modified version of TRIM
|
King, B.V.
|
|
1992
|
64 |
1-4 |
p. 724-729
6 p.
|
artikel
|
| 28 |
Channeling in quasicrystals
|
du Marchie van Voorthuysen, E.H.
|
|
1992
|
64 |
1-4 |
p. 261-265
5 p.
|
artikel
|
| 29 |
Channeling spectrometry in HTSC thin film analysis
|
Remind, J.
|
|
1992
|
64 |
1-4 |
p. 174-178
5 p.
|
artikel
|
| 30 |
Computer controlled ion beam energy scanning and data acquisition system and investigations of the Lewis effect
|
Wüstenbecker, S.
|
|
1992
|
64 |
1-4 |
p. 663-667
5 p.
|
artikel
|
| 31 |
Computer simulation of ion implantation into crystalline targets
|
Posselt, M.
|
|
1992
|
64 |
1-4 |
p. 706-710
5 p.
|
artikel
|
| 32 |
Concentration profile of light elements near an interface
|
Terwagne, G.
|
|
1992
|
64 |
1-4 |
p. 153-155
3 p.
|
artikel
|
| 33 |
Core ionization and ion ejection during SIMS analysis
|
Petravic, M.
|
|
1992
|
64 |
1-4 |
p. 659-662
4 p.
|
artikel
|
| 34 |
Cross sections for 170.5° backscattering of 4He by the isotopes of boron for 4He energies between 1.0 and 3.3 MeV
|
McIntyre Jr., L.C.
|
|
1992
|
64 |
1-4 |
p. 457-460
4 p.
|
artikel
|
| 35 |
Dating of archaeological flints by fluorine depth profiling: new insights into the mechanism of fluorine uptake
|
Walter, Ph.
|
|
1992
|
64 |
1-4 |
p. 494-498
5 p.
|
artikel
|
| 36 |
Dechanneling by misfit dislocations in III–V semiconductor heterostructures
|
Mazzer, M.
|
|
1992
|
64 |
1-4 |
p. 103-107
5 p.
|
artikel
|
| 37 |
Depth profiling of deuterium in a beryllium/carbon layer
|
Hughes, I.G.
|
|
1992
|
64 |
1-4 |
p. 434-438
5 p.
|
artikel
|
| 38 |
Depth profiling of hydrogen using the high efficiency ERD-TOF technique
|
Gujrathi, S.C.
|
|
1992
|
64 |
1-4 |
p. 789-795
7 p.
|
artikel
|
| 39 |
Depth resolution in SIMS study of a Fe-Ti multilayer structure
|
Dupuy, J.C.
|
|
1992
|
64 |
1-4 |
p. 636-640
5 p.
|
artikel
|
| 40 |
Determination by PIXE of the elemental distribution in a lake
|
Respaldiza, Miguel A.
|
|
1992
|
64 |
1-4 |
p. 538-541
4 p.
|
artikel
|
| 41 |
Determination of hydrogen surface coverage of Pt0.5Ni0.5 single crystals by NRA
|
Fallavier, M.
|
|
1992
|
64 |
1-4 |
p. 83-87
5 p.
|
artikel
|
| 42 |
Deuteron beam analysis of rapid thermal nitridation of silicon and thin SiO2 films
|
Ganem, J-J.
|
|
1992
|
64 |
1-4 |
p. 778-783
6 p.
|
artikel
|
| 43 |
Development of a special anti-Compton spectrometer
|
Micek, S.L.
|
|
1992
|
64 |
1-4 |
p. 282-286
5 p.
|
artikel
|
| 44 |
Diffusion of cesium in sodium borosilicate glasses for nuclear waste immobilisation, studied by low-energy ion scattering
|
van Kessel, O.
|
|
1992
|
64 |
1-4 |
p. 593-595
3 p.
|
artikel
|
| 45 |
Editorial Board
|
|
|
1992
|
64 |
1-4 |
p. ii-iii
nvt p.
|
artikel
|
| 46 |
Electronic processes in slow ion-metal surface collisions
|
Eeken, P.
|
|
1992
|
64 |
1-4 |
p. 580-583
4 p.
|
artikel
|
| 47 |
Energy loss straggling of MeV ions in thin solid films
|
Briere, M.A.
|
|
1992
|
64 |
1-4 |
p. 693-700
8 p.
|
artikel
|
| 48 |
Exploring surface structures by coaxial impact collision ion scattering spectroscopy (CAICISS)
|
Aono, M.
|
|
1992
|
64 |
1-4 |
p. 29-37
9 p.
|
artikel
|
| 49 |
External PIXE and mu-PIXE measurements of elemental concentrations in volcanic rocks
|
Santo, A.P.
|
|
1992
|
64 |
1-4 |
p. 517-522
6 p.
|
artikel
|
| 50 |
Hafnium diffusion in Zircaloy-2 and Zr-2.5 wt.% Nb: A Rutherford backscattering study
|
Laursen, T.
|
|
1992
|
64 |
1-4 |
p. 475-479
5 p.
|
artikel
|
| 51 |
Hamiltonian description of ion motion in crossed electric and magnetic fields with cylindrical symmetry
|
Botman, J.I.M.
|
|
1992
|
64 |
1-4 |
p. 353-357
5 p.
|
artikel
|
| 52 |
Heavy-ion irradiation effects on passivated implanted planar silicon detectors
|
De Coster, W.
|
|
1992
|
64 |
1-4 |
p. 287-291
5 p.
|
artikel
|
| 53 |
3He induced charged particle reactions for oxygen analysis
|
Cohen, David D.
|
|
1992
|
64 |
1-4 |
p. 413-416
4 p.
|
artikel
|
| 54 |
High pulse rate and pileup handling in precision RBS
|
Amsel, G.
|
|
1992
|
64 |
1-4 |
p. 811-816
6 p.
|
artikel
|
| 55 |
High resolution depth profiling of light elements
|
Dollinger, G.
|
|
1992
|
64 |
1-4 |
p. 422-427
6 p.
|
artikel
|
| 56 |
High-speed data processing for three-dimensional analysis by micro-RBS
|
Takai, M.
|
|
1992
|
64 |
1-4 |
p. 277-281
5 p.
|
artikel
|
| 57 |
Hydrogen analysis by secondary ion mass spectrometry using HCs+ ions
|
Gnaser, H.
|
|
1992
|
64 |
1-4 |
p. 646-649
4 p.
|
artikel
|
| 58 |
Hyperfine field and fraction in high field site for implanted 221Fr Fe
|
Lindroos, M.
|
|
1992
|
64 |
1-4 |
p. 227-231
5 p.
|
artikel
|
| 59 |
Improved depth resolution in CERDA by recoil time of flight measurement
|
Rijken, H.A.
|
|
1992
|
64 |
1-4 |
p. 395-398
4 p.
|
artikel
|
| 60 |
Improvement of beam properties by optimizing ion optics and minimizing beam interactions
|
Vijgen, L.J.
|
|
1992
|
64 |
1-4 |
p. 378-382
5 p.
|
artikel
|
| 61 |
Increased sensitivity of SIMS in indium phosphide by detecting PxM− molecular ions under cesium bombardment
|
Gauneau, M.
|
|
1992
|
64 |
1-4 |
p. 614-620
7 p.
|
artikel
|
| 62 |
Influence of a wick lining on the evaporation rate of lithium from a charge exchange canal
|
Thampi, N.S.
|
|
1992
|
64 |
1-4 |
p. 375-377
3 p.
|
artikel
|
| 63 |
Influence of the ion beam induced desorption on the quantitative depth profiling of hydrogen in a variety of materials
|
Ross, G.G.
|
|
1992
|
64 |
1-4 |
p. 603-607
5 p.
|
artikel
|
| 64 |
Interactive personal-computer data analysis of ion backscattering spectra
|
Saarilahti, J.
|
|
1992
|
64 |
1-4 |
p. 734-738
5 p.
|
artikel
|
| 65 |
Investigation of oxygen and fluorine distributions using nuclear reaction analysis at the Rossendorf nuclear muprobe
|
Grambole, D.
|
|
1992
|
64 |
1-4 |
p. 399-402
4 p.
|
artikel
|
| 66 |
Investigation of the D-Pd system interphase boundary behaviour inside the palladium by ERD using monochromatic neutrons
|
Skorodumov, B.G.
|
|
1992
|
64 |
1-4 |
p. 388-394
7 p.
|
artikel
|
| 67 |
Investigations of carbon implanted silicon
|
Fröse, D.
|
|
1992
|
64 |
1-4 |
p. 760-764
5 p.
|
artikel
|
| 68 |
Ion beam analysis of gold jewelry
|
Demortier, Guy
|
|
1992
|
64 |
1-4 |
p. 481-487
7 p.
|
artikel
|
| 69 |
Ion beam analysis of interface reactions
|
Kuiper, A.E.T.
|
|
1992
|
64 |
1-4 |
p. 739-743
5 p.
|
artikel
|
| 70 |
Ion beam analysis of the bone tissue of Alzheimer's disease patients
|
Robertson, J.D.
|
|
1992
|
64 |
1-4 |
p. 553-557
5 p.
|
artikel
|
| 71 |
Ion beam analysis using alpha particles and protons for compositional determination of niobium superconducting compound films
|
Roux, B.
|
|
1992
|
64 |
1-4 |
p. 184-188
5 p.
|
artikel
|
| 72 |
Ion beam damage in epitaxially grown MCT on GaAs
|
Russo, S.P.
|
|
1992
|
64 |
1-4 |
p. 251-255
5 p.
|
artikel
|
| 73 |
Ion-beam induced plastic deformation in amorphous materials investigated by marker implantation and RBS
|
Benyagoub, A.
|
|
1992
|
64 |
1-4 |
p. 684-686
3 p.
|
artikel
|
| 74 |
Ion beam investigation of issues relevant to the migration of heavy elements in the geosphere
|
Dran, J.-C.
|
|
1992
|
64 |
1-4 |
p. 523-527
5 p.
|
artikel
|
| 75 |
Ion beam mixing of chromium on silicon nitride ceramics
|
Bolse, Wolfgang
|
|
1992
|
64 |
1-4 |
p. 138-142
5 p.
|
artikel
|
| 76 |
Ion beams as high-resolution probes of structure and function
|
Legge, G.J.F.
|
|
1992
|
64 |
1-4 |
p. 342-348
7 p.
|
artikel
|
| 77 |
Ion beams in high-temperature superconductivity research
|
Rehn, L.E.
|
|
1992
|
64 |
1-4 |
p. 161-168
8 p.
|
artikel
|
| 78 |
Ion-channeling investigations of nitrogen in zirconium
|
Howe, L.M.
|
|
1992
|
64 |
1-4 |
p. 246-250
5 p.
|
artikel
|
| 79 |
Ionization chambers for materials analysis with heavy ion beams
|
Assmann, W.
|
|
1992
|
64 |
1-4 |
p. 267-271
5 p.
|
artikel
|
| 80 |
Ion mixing in Si/Ge layered structures
|
Zhu, B.
|
|
1992
|
64 |
1-4 |
p. 108-112
5 p.
|
artikel
|
| 81 |
Ion scattering analysis of alumina supported model catalysts
|
Josek, K.
|
|
1992
|
64 |
1-4 |
p. 596-602
7 p.
|
artikel
|
| 82 |
Ion scattering investigations of buried CoSi2 layers produced by ion beam synthesis
|
Jebasinski, R.
|
|
1992
|
64 |
1-4 |
p. 99-102
4 p.
|
artikel
|
| 83 |
Large energy loss straggling of protons and He ions in Mylar foils
|
Cohen, David D.
|
|
1992
|
64 |
1-4 |
p. 672-677
6 p.
|
artikel
|
| 84 |
Laser induced interface reactions in Sb/Ge multilayer thin films: a study by RBS and CS-TEM
|
Serna, R.
|
|
1992
|
64 |
1-4 |
p. 807-810
4 p.
|
artikel
|
| 85 |
Lateral growth of cobalt suicide observed by an MeV helium ion microprobe
|
Kinomura, A.
|
|
1992
|
64 |
1-4 |
p. 770-773
4 p.
|
artikel
|
| 86 |
Lattice site changes of ion implanted 8Li in InP studied by alpha emission channeling
|
Wahl, U.
|
|
1992
|
64 |
1-4 |
p. 221-226
6 p.
|
artikel
|
| 87 |
Lattice site investigations for Mg in LiNbO3 by combined RBS-PIXE-NRA channeling experiments
|
Kling, A.
|
|
1992
|
64 |
1-4 |
p. 232-236
5 p.
|
artikel
|
| 88 |
Lead on Cu(100) and Cu(510): desorption and surface diffusion near the bulk melting temperature of Pb
|
Girard, Y.
|
|
1992
|
64 |
1-4 |
p. 73-77
5 p.
|
artikel
|
| 89 |
7Li(p, α) 4He, PIXE and RBS/channeling studies of the lattice site location of impurities in LiNbO3 and LiNbO3 co-doped with magnesium
|
Rebouta, L.
|
|
1992
|
64 |
1-4 |
p. 189-192
4 p.
|
artikel
|
| 90 |
Low energy ion-surface interactions
|
Cooper, B.H.
|
|
1992
|
64 |
1-4 |
p. 49-57
9 p.
|
artikel
|
| 91 |
Measurement and analysis of thin- and thick-target yield curves of narrow resonances with a high energy resolution ion beam
|
Schulte, W.H.
|
|
1992
|
64 |
1-4 |
p. 383-387
5 p.
|
artikel
|
| 92 |
Measurement of accumulated contaminants in glassy carbon by RBS, ERD and NRA
|
Ila, D.
|
|
1992
|
64 |
1-4 |
p. 439-442
4 p.
|
artikel
|
| 93 |
Medium energy ion scattering using a toroidal analyzer combined with a microbeam line
|
Kinomura, A.
|
|
1992
|
64 |
1-4 |
p. 576-579
4 p.
|
artikel
|
| 94 |
Microanalysis of masklessly MeV-ion-implanted area by MeV heavy-ion microprobe
|
Yuji, Horino
|
|
1992
|
64 |
1-4 |
p. 358-361
4 p.
|
artikel
|
| 95 |
Microscopic characterization of materials by ion beam and hyperfine interaction analysis
|
Soares, J.C.
|
|
1992
|
64 |
1-4 |
p. 215-220
6 p.
|
artikel
|
| 96 |
Molecular ion stability and populations in tandem accelerator mass spectrometry
|
Matteson, S.
|
|
1992
|
64 |
1-4 |
p. 330-335
6 p.
|
artikel
|
| 97 |
mubeam system for study of single event upset of semiconductor devices
|
Kamiya, T.
|
|
1992
|
64 |
1-4 |
p. 362-366
5 p.
|
artikel
|
| 98 |
NRA and RBS analyses of silicon, aluminium and iron nitride thin films
|
Stedile, F.C.
|
|
1992
|
64 |
1-4 |
p. 756-759
4 p.
|
artikel
|
| 99 |
NRA and XPS characterizations of layers formed by rapid thermal nitridation of thin SiO2 films
|
Ganem, J-J.
|
|
1992
|
64 |
1-4 |
p. 744-749
6 p.
|
artikel
|
| 100 |
NRA characterization of pretreatment operations of silicon
|
Ganem, J-J.
|
|
1992
|
64 |
1-4 |
p. 784-788
5 p.
|
artikel
|
| 101 |
Nuclear microanalysis study of the growth of thin dielectric films on silicon by classical and rapid thermal treatments
|
Rigo, S.
|
|
1992
|
64 |
1-4 |
p. 1-11
11 p.
|
artikel
|
| 102 |
Nuclear reaction analyses of boron nitride films deposited by ion beam based techniques
|
Bouchier, D.
|
|
1992
|
64 |
1-4 |
p. 765-769
5 p.
|
artikel
|
| 103 |
O2 + and Xe+ depth profiling of 150 keV Cs+ implantation in Si and SiO2 by SIMS
|
Bhan, M.K.
|
|
1992
|
64 |
1-4 |
p. 641-645
5 p.
|
artikel
|
| 104 |
ONO structures investigated by SIMS, RBS, and NRA
|
Iberl, Franz
|
|
1992
|
64 |
1-4 |
p. 650-653
4 p.
|
artikel
|
| 105 |
On the development of a WDX-PIXE measurement system and its application
|
Shigeki, Hayashi
|
|
1992
|
64 |
1-4 |
p. 428-433
6 p.
|
artikel
|
| 106 |
On the use of a d E-E telescope in elastic recoil detection
|
Bik, W.M.Arnold
|
|
1992
|
64 |
1-4 |
p. 832-835
4 p.
|
artikel
|
| 107 |
On the use of a gas filled magnetic spectrograph in elastic recoil detection
|
Sandker, G.J.
|
|
1992
|
64 |
1-4 |
p. 292-295
4 p.
|
artikel
|
| 108 |
Optical properties of a two-gap buncher
|
Kleeven, W.J.G.M.
|
|
1992
|
64 |
1-4 |
p. 367-370
4 p.
|
artikel
|
| 109 |
Order-disorder transition and melting of Au(110) surfaces
|
Hoss, A.
|
|
1992
|
64 |
1-4 |
p. 58-63
6 p.
|
artikel
|
| 110 |
Oxygen bleed-in during SIMS depth profiling: curse or blessing?
|
Zalm, P.C.
|
|
1992
|
64 |
1-4 |
p. 626-631
6 p.
|
artikel
|
| 111 |
PAC studies of ion beam induced mixing and phase formation in NiAl multilayers
|
Weber, Thomas
|
|
1992
|
64 |
1-4 |
p. 846-851
6 p.
|
artikel
|
| 112 |
Position analysis of light adsorbates by recoil detection: H on Ru(001)
|
Schulz, J.
|
|
1992
|
64 |
1-4 |
p. 588-592
5 p.
|
artikel
|
| 113 |
Precipitation and segregation of Sb at Si-SiO2 interfaces during thermal oxidation
|
Williams, J.S.
|
|
1992
|
64 |
1-4 |
p. 156-159
4 p.
|
artikel
|
| 114 |
Precipitation of antimony delta-doping layers in Si studied with channeling Rutherford backscattering spectrometry
|
van Ijzendoorn, L.J.
|
|
1992
|
64 |
1-4 |
p. 120-124
5 p.
|
artikel
|
| 115 |
Preface
|
Brongersma, H.H.
|
|
1992
|
64 |
1-4 |
p. vii-viii
nvt p.
|
artikel
|
| 116 |
Prehistoric cave painting PIXE analysis for the identification of paint “pots”
|
Menu, Michel
|
|
1992
|
64 |
1-4 |
p. 547-552
6 p.
|
artikel
|
| 117 |
Production and use of heavy ion beams of HMI accelerators for solid state application
|
Homeyer, H.
|
|
1992
|
64 |
1-4 |
p. 301-308
8 p.
|
artikel
|
| 118 |
Proton resonant scattering for oxygen stoichiometry of reactively evaporated ZrO2−x films
|
Caridi, A.
|
|
1992
|
64 |
1-4 |
p. 774-777
4 p.
|
artikel
|
| 119 |
Quantification of the separate matrix constituents of spheroidal graphite cast iron implanted with 15N by nuclear reaction analysis using an ion muprobe
|
Matthews, A.P.
|
|
1992
|
64 |
1-4 |
p. 452-456
5 p.
|
artikel
|
| 120 |
Radiation damaging behaviour of GaP by MeV ion implantation
|
Ascheron, C.
|
|
1992
|
64 |
1-4 |
p. 203-209
7 p.
|
artikel
|
| 121 |
Range parameters study of Pb and Au implanted into SiC films
|
Fichtner, P.F.P.
|
|
1992
|
64 |
1-4 |
p. 668-671
4 p.
|
artikel
|
| 122 |
Rational function approximation of the collision integrals
|
Severijns, C.A.
|
|
1992
|
64 |
1-4 |
p. 730-733
4 p.
|
artikel
|
| 123 |
RBS analyses of magnetic thin film multilayers and phases
|
Pereira, L.G.
|
|
1992
|
64 |
1-4 |
p. 803-806
4 p.
|
artikel
|
| 124 |
RBS analysis of diffusion and evaporation of implanted lead in aluminium
|
Yu, L.
|
|
1992
|
64 |
1-4 |
p. 78-82
5 p.
|
artikel
|
| 125 |
RBS analysis of thin amorphous YBaCuO films: comparison with direct determination of oxygen contents by NRA
|
Wong, J.C.Cheang
|
|
1992
|
64 |
1-4 |
p. 169-173
5 p.
|
artikel
|
| 126 |
Recent applications of PIXE spectrometry in archaeology I. Characterization of bronzes with special consideration of the influence of corrosion processes on data reliability
|
Swann, C.P.
|
|
1992
|
64 |
1-4 |
p. 499-504
6 p.
|
artikel
|
| 127 |
Recent applications of PIXE spectrometry in archaeology II. Characterization of Chinese pottery exported to the Islamic world
|
Fleming, S.J.
|
|
1992
|
64 |
1-4 |
p. 528-537
10 p.
|
artikel
|
| 128 |
Reflections and reminiscences from the early history of RBS, NRA and channeling
|
Davies, J.A.
|
|
1992
|
64 |
1-4 |
p. 12-28
17 p.
|
artikel
|
| 129 |
Resonance depth profiling of low-Z elements with target biasing applied to the 3.045 MeV 16O(α, α)16O resonance
|
De Coster, W.
|
|
1992
|
64 |
1-4 |
p. 417-421
5 p.
|
artikel
|
| 130 |
Shallow depth profiles of arsenic and boron in CoSi2 measured by secondary ion mass spectrometry
|
Mohadjeri, B.
|
|
1992
|
64 |
1-4 |
p. 654-658
5 p.
|
artikel
|
| 131 |
SIMS, RBS, ion channelling, and TEM studies of the low energy SIMOX structures
|
Li, Y.
|
|
1992
|
64 |
1-4 |
p. 750-755
6 p.
|
artikel
|
| 132 |
Simulation analysis of ion channeling spectra: thermal vibrational amplitude in Si
|
Dygo, A.
|
|
1992
|
64 |
1-4 |
p. 701-705
5 p.
|
artikel
|
| 133 |
Single event upset imaging with a nuclear muprobe
|
Doyle, B.L.
|
|
1992
|
64 |
1-4 |
p. 313-320
8 p.
|
artikel
|
| 134 |
Static low-energy ion scattering
|
Bergmans, R.H.
|
|
1992
|
64 |
1-4 |
p. 584-587
4 p.
|
artikel
|
| 135 |
Status of the calculation of the energy loss of swift ions in molecules
|
Sabin, John R.
|
|
1992
|
64 |
1-4 |
p. 678-683
6 p.
|
artikel
|
| 136 |
Strain in an epitaxial Pt/Fe alloy layer on Fe( 100)
|
Leibbrandt, G.W.R.
|
|
1992
|
64 |
1-4 |
p. 69-72
4 p.
|
artikel
|
| 137 |
Structure dependence of radiation damage depths after ion implantation
|
Friedland, E.
|
|
1992
|
64 |
1-4 |
p. 242-245
4 p.
|
artikel
|
| 138 |
Study of carbon and oxygen incorporation in reactively sputtered Cr-Si-Al films using ERDA
|
Neelmeijer, C.
|
|
1992
|
64 |
1-4 |
p. 461-464
4 p.
|
artikel
|
| 139 |
Study of high-fluence titanium implantation into AISI M2 steel by 48Ti isotopic tracing
|
El Khakani, M.A.
|
|
1992
|
64 |
1-4 |
p. 443-447
5 p.
|
artikel
|
| 140 |
Study of high-temperature superconductors by IBA methods
|
Chamera, D.
|
|
1992
|
64 |
1-4 |
p. 198-201
4 p.
|
artikel
|
| 141 |
Subnanosecond timing with ion-implanted detectors
|
Rijken, H.A.
|
|
1992
|
64 |
1-4 |
p. 272-276
5 p.
|
artikel
|
| 142 |
Surface and adsorbate structural analysis from time-of-flight scattering and recoiling spectrometry (TOF-SARS)
|
Rabalais, J.W.
|
|
1992
|
64 |
1-4 |
p. 559-565
7 p.
|
artikel
|
| 143 |
Surface composition of PtxNi1−x single crystal alloys
|
Weigand, P.
|
|
1992
|
64 |
1-4 |
p. 93-97
5 p.
|
artikel
|
| 144 |
Surface reconstructions of the Sn/Si(111) system investigated by ion-scattering spectrometry and scanning tunneling microscopy
|
Worthington, M.S.
|
|
1992
|
64 |
1-4 |
p. 566-571
6 p.
|
artikel
|
| 145 |
Surface sensitivity of RBS with nitrogen ions
|
Walter, Lang
|
|
1992
|
64 |
1-4 |
p. 796-799
4 p.
|
artikel
|
| 146 |
Surface sites and mobilities of In atoms on a stepped Cu( 100) surface studied at low coverage
|
Breeman, M.
|
|
1992
|
64 |
1-4 |
p. 64-68
5 p.
|
artikel
|
| 147 |
The application of charged particle spectrometry to 3He activation analysis of light elements
|
Pillay, A.E.
|
|
1992
|
64 |
1-4 |
p. 465-468
4 p.
|
artikel
|
| 148 |
The calculation of ion fractions in LEIS
|
Verbist, G.
|
|
1992
|
64 |
1-4 |
p. 572-575
4 p.
|
artikel
|
| 149 |
The CBNM scanning nuclear muprobe for materials analysis
|
Lövestam, N.E.G.
|
|
1992
|
64 |
1-4 |
p. 371-374
4 p.
|
artikel
|
| 150 |
The design and use of a computer package for the control of a precision goniometer during channelling
|
Diskett, D.J.
|
|
1992
|
64 |
1-4 |
p. 836-839
4 p.
|
artikel
|
| 151 |
The effect of ion beam mixing on SIMS depth resolution
|
Likonen, J.
|
|
1992
|
64 |
1-4 |
p. 149-152
4 p.
|
artikel
|
| 152 |
The ion beam analysis of laser-irradiated borosilicate glass
|
Lane, D.W.
|
|
1992
|
64 |
1-4 |
p. 448-451
4 p.
|
artikel
|
| 153 |
Thermal and ion beam induced thin film reactions in Cu-Al bilayers
|
Yoshitaka, Tamou
|
|
1992
|
64 |
1-4 |
p. 130-133
4 p.
|
artikel
|
| 154 |
The width of an RBS spectrum: influence of plural and multiple scattering
|
Bauer, P.
|
|
1992
|
64 |
1-4 |
p. 711-715
5 p.
|
artikel
|
| 155 |
Thin film growth dynamics analyzed by ion scattering
|
Zinke-Allmang, M.
|
|
1992
|
64 |
1-4 |
p. 113-119
7 p.
|
artikel
|
| 156 |
TOF ERD experiments using a 10 MeV 35Cl beam
|
Arai, E.
|
|
1992
|
64 |
1-4 |
p. 296-300
5 p.
|
artikel
|
| 157 |
Unusually large substitutional fraction for Fr implanted in Fe observed by emission channelling
|
Lindroos, M.
|
|
1992
|
64 |
1-4 |
p. 256-260
5 p.
|
artikel
|
| 158 |
Use of RBS and Raman spectroscopy to study oxygen mobility in YBaCuO thin films by 18O tracing experiments
|
Wong, J.C.Cheang
|
|
1992
|
64 |
1-4 |
p. 179-183
5 p.
|
artikel
|
| 159 |
Use of simulations of 15N profiling in studying hydrogen segregation at interfaces
|
Marwick, A.D.
|
|
1992
|
64 |
1-4 |
p. 408-412
5 p.
|
artikel
|
| 160 |
Use of the SUNY microbeam to investigate effects of mechanical treatment on metal/metal interdiffusion kinetics
|
Ding, P.J.
|
|
1992
|
64 |
1-4 |
p. 125-129
5 p.
|
artikel
|
| 161 |
Usewear characterisation of prehistoric flints with IBA
|
Christensen, M.
|
|
1992
|
64 |
1-4 |
p. 488-493
6 p.
|
artikel
|
| 162 |
Various advanced capabilities of the RBS setup at IMEC
|
Brijs, B.
|
|
1992
|
64 |
1-4 |
p. 825-831
7 p.
|
artikel
|
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