| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Atomic scale modeling of interstitial loop-induced strengthening in nickel
|
Zhou, Gang
|
|
2019
|
452 |
C |
p. 36-39
|
artikel
|
| 2 |
Design of a PGNAA facility using D-T neutron generator for bulk samples analysis
|
Cheng, Can
|
|
2019
|
452 |
C |
p. 30-35
|
artikel
|
| 3 |
Diffraction and transition radiation on conducting sphere and hemispherical bulge in conducting plane: Further development
|
Shul’ga, N.F.
|
|
2019
|
452 |
C |
p. 55-62
|
artikel
|
| 4 |
Editorial Board
|
|
|
2019
|
452 |
C |
p. ii
|
artikel
|
| 5 |
Fast method for the estimation of the absorbed dose in X-ray microtomography
|
De Muynck, Amelie
|
|
2019
|
452 |
C |
p. 40-47
|
artikel
|
| 6 |
Ion beam analysis for the study of our cultural heritage. A short history and its milestones
|
Zucchiatti, Alessandro
|
|
2019
|
452 |
C |
p. 48-54
|
artikel
|
| 7 |
Kossel interferences of proton-induced X-ray emission lines to study thin film waveguides
|
Zhang, J.P.
|
|
2019
|
452 |
C |
p. 12-20
|
artikel
|
| 8 |
Measurement of gamma-ray production cross sections for nuclear reaction 31P(p,pγ1-0)31P
|
Silva, H.
|
|
2019
|
452 |
C |
p. 26-29
|
artikel
|
| 9 |
Nuclear microprobe characterization of defects in zinc recycled cemented carbides
|
Freemantle, C.S.
|
|
2019
|
452 |
C |
p. 7-11
|
artikel
|
| 10 |
Stigmatic imaging of secondary ions in MeV-SIMS spectrometry by linear Time-of-Flight mass spectrometer and the TimePix detector
|
Jenčič, Boštjan
|
|
2019
|
452 |
C |
p. 1-6
|
artikel
|
| 11 |
Trapping and detrapping process of hydrogen in tungsten divacancy: A molecular dynamics study
|
Fu, Baoqin
|
|
2019
|
452 |
C |
p. 21-25
|
artikel
|
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