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                             22 results found
no title author magazine year volume issue page(s) type
1 Annealing effects on elemental composition and morphological properties of Pd thin films grown on crystalline silicon substrate Masenya, M.
2019
444 C p. 91-95
article
2 Chemical effect on the energy lose for slow ion channeling a narrow band gap semiconductor Li, Chang-kai
2019
444 C p. 38-42
article
3 Comment on N. Khelidj et al., Nucl. Instrum. Meth. Phys. Res. B 236 (2005) 88–94 Gillen, Kenneth T.
2019
444 C p. 135-138
article
4 Comparison of defect structure in Si and Ge ion implanted GaN epilayers by RBS/channeling Pągowska, K.D.
2019
444 C p. 74-79
article
5 Comparison of ionization track structure models for electronic devices of different sizes Liu, Jizhe
2019
444 C p. 43-49
article
6 Damages on pure tungsten irradiated by compression plasma flows Qu, Miao
2019
444 C p. 33-37
article
7 EBT3 film calibration in the Bragg peak region for proton beams below 5 MeV Battaglia, M.C.
2019
444 C p. 117-124
article
8 Editorial Board 2019
444 C p. ii
article
9 Effects of nuclear and electronic stopping powers on the conversion of hybrid silicate thin films Qi, Y.
2019
444 C p. 103-106
article
10 Evolution of radiation defects in NPN bipolar junction transistors irradiated by 3 MeV protons Liu, Chaoming
2019
444 C p. 50-53
article
11 Impact of composition modification induced by ion beam Coulomb-drag effects on the nanoindentation hardness of HT9 Gigax, Jonathan G.
2019
444 C p. 68-73
article
12 Investigation of structural and magnetic properties of Co+ ion implanted indium tin oxide thin films on polyethylene terephthalate (C10H8O4)n substrates by 100 keV ions Oluwaleye, O.
2019
444 C p. 96-102
article
13 Investigation of the mechanical properties of ODS steels at high temperatures using nanoindentation technique Wyszkowska, E.
2019
444 C p. 107-111
article
14 Parametric X-ray radiation in the Smith-Purcell geometry for non-destructive beam diagnostics Skoromnik, O.D.
2019
444 C p. 125-134
article
15 PESA in the analysis of hydrogen containing polymeric materials: Some basic considerations Kumar, Sanjiv
2019
444 C p. 1-5
article
16 Presence of reactive impurities in Ar+ ion beam plays a key role for Si ripple formation Bhowmik, Dipak
2019
444 C p. 54-61
article
17 Raman spectroscopy of Ar+-irradiated graphite surfaces supporting platinum nanoparticles Kimata, Tetsuya
2019
444 C p. 6-9
article
18 Raman study of ion beam irradiation damage on nanostructured TiO2 thin film Hazem, R.
2019
444 C p. 62-67
article
19 Robust inference of two-dimensional strain fields from diffraction-based measurements Hendriks, J.N.
2019
444 C p. 80-90
article
20 Structural investigation of RBMK nuclear graphite modified by 12C+ ion implantation and thermal treatment Lagzdina, Elena
2019
444 C p. 23-32
article
21 Superfocusing and zero-degree focusing in planar channeling of protons in a thin silicon crystal Ćosić, M.
2019
444 C p. 10-22
article
22 Test of the validity of Bragg’s rule for mean excitation energies of small molecules and ions Sauer, Stephan P.A.
2019
444 C p. 112-116
article
                             22 results found
 
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