| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A method for analysis and profiling of boron, carbon and oxygen impurities in semiconductor wafers by recoil atoms in heavy ion beams
|
Petrascu, M.
|
|
1984
|
4 |
3 |
p. 396-398
3 p.
|
artikel
|
| 2 |
Author index
|
|
|
1984
|
4 |
3 |
p. 427-430
4 p.
|
artikel
|
| 3 |
Changes in RBS spectra from surface charge effects
|
Arafah, D.E.
|
|
1984
|
4 |
3 |
p. 399-400
2 p.
|
artikel
|
| 4 |
Correction factors for the self-absorption of gamma-rays in a cylindrical sample
|
Zikovsky, L.
|
|
1984
|
4 |
3 |
p. 425-
1 p.
|
artikel
|
| 5 |
Detection of 10Be with a 2 MV tandem accelerator mass spectrometer
|
Zabel, T.H.
|
|
1984
|
4 |
3 |
p. 393-395
3 p.
|
artikel
|
| 6 |
Deuterium beam species measurement by D-D fusion product analysis
|
Markevich, D.
|
|
1984
|
4 |
3 |
p. 388-392
5 p.
|
artikel
|
| 7 |
Direct computation of lss parameters for the prediction of fission-fragment ranges and energy-loss in any substance
|
Dickstein, P.A.
|
|
1984
|
4 |
3 |
p. 364-367
4 p.
|
artikel
|
| 8 |
Erratum
|
|
|
1984
|
4 |
3 |
p. 421-423
3 p.
|
artikel
|
| 9 |
Interaction of deuterium with lattice defects in nickel
|
Besenbacher, F.
|
|
1984
|
4 |
3 |
p. 374-387
14 p.
|
artikel
|
| 10 |
Lateral and angular spread up to large energy losses for MeV protons transmitted through polyester films
|
Schmaus, D.
|
|
1984
|
4 |
3 |
p. 317-331
15 p.
|
artikel
|
| 11 |
Measurement of the fluorine content of three NBS standard reference materials by use of the 19F(p, p'γ)19F reaction
|
Hanson, A.L.
|
|
1984
|
4 |
3 |
p. 401-403
3 p.
|
artikel
|
| 12 |
Multiple scattering of protons in thick gas targets
|
Kuhn, S.
|
|
1984
|
4 |
3 |
p. 332-336
5 p.
|
artikel
|
| 13 |
On the treatment of saturation effects in Mössbauer spectroscopy and the evaluation of spectra
|
Jernberg, Per
|
|
1984
|
4 |
3 |
p. 412-420
9 p.
|
artikel
|
| 14 |
Proton energy loss in solids
|
Sirotinin, E.I.
|
|
1984
|
4 |
3 |
p. 337-345
9 p.
|
artikel
|
| 15 |
Radiation intensity from ultrarelativistic particles during axial channeling and its orientation dependence
|
Baier, Vladimir N.
|
|
1984
|
4 |
3 |
p. 346-355
10 p.
|
artikel
|
| 16 |
Subject index
|
|
|
1984
|
4 |
3 |
p. 431-432
2 p.
|
artikel
|
| 17 |
The energy distribution of sputtered particles at low bombarding energies
|
Urbassek, Michael
|
|
1984
|
4 |
3 |
p. 356-363
8 p.
|
artikel
|
| 18 |
The generation of shallow dopant layers by low-angle implantation
|
De Cata, L.
|
|
1984
|
4 |
3 |
p. 368-373
6 p.
|
artikel
|
| 19 |
The use of aluminium γ-ray yield ratio for sample uniformity and surface contamination check in PIXE analysis
|
Räisänen, J.
|
|
1984
|
4 |
3 |
p. 404-407
4 p.
|
artikel
|
| 20 |
Thin film analysis by low energy proton induced X-ray emission
|
Torrisi, L.
|
|
1984
|
4 |
3 |
p. 408-411
4 p.
|
artikel
|
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