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                             44 results found
no title author magazine year volume issue page(s) type
1 Application of synchrotron X-ray radiography to the study of dendritic equiaxed microstructure formation in Al–Cu alloys Bogno, A.
 2010
 268 3-4 p. 394-398
5 p.
 article
2 A thin film approach to protein crystallography Birkholz, M.
 2010
 268 3-4 p. 414-419
6 p.
 article
3 Author Index 2010
 268 3-4 p. I-VI
nvt p.
 article
4 Combined Rietveld refinement of Zn2SiO4:Mn2+ using X-ray and neutron powder diffraction data Kim, Yong-Il
 2010
 268 3-4 p. 346-351
6 p.
 article
5 Comparative study of structural and morphological properties of CuIn3S5 and CuIn7S11 materials Khemiri, N.
 2010
 268 3-4 p. 268-272
5 p.
 article
6 Contents 2010
 268 3-4 p. vii-viii
nvt p.
 article
7 Core–shell nanowires: From the ensemble to single-wire characterization Keplinger, Mario
 2010
 268 3-4 p. 316-319
4 p.
 article
8 Depth-dependent magnetic characterization of Fe films on NiO(001) Luches, P.
 2010
 268 3-4 p. 361-364
4 p.
 article
9 Determination of global and local residual stresses in SOFC by X-ray diffraction Villanova, Julie
 2010
 268 3-4 p. 282-286
5 p.
 article
10 Determination of the local gold contact morphology on a photoactive polymer film using nanobeam GISAXS Ruderer, M.A.
 2010
 268 3-4 p. 403-410
8 p.
 article
11 Dislocation generation related to micro-cracks in Si wafers: High temperature in situ study with white beam X-ray topography Danilewsky, A.
 2010
 268 3-4 p. 399-402
4 p.
 article
12 Dose-dependent bonding environment of oxygen implanted in GaN Katsikini, M.
 2010
 268 3-4 p. 241-245
5 p.
 article
13 3D strain imaging in sub-micrometer crystals using cross-reciprocal space measurements: Numerical feasibility and experimental methodology Vaxelaire, N.
 2010
 268 3-4 p. 388-393
6 p.
 article
14 Editorial Boscherini, Federico
 2010
 268 3-4 p. v-
1 p.
 article
15 Editorial board 2010
 268 3-4 p. IFC-
1 p.
 article
16 Effect of aluminium addition on the structural properties of nanostructured Fe50Co50 alloy Djebbari, C.
 2010
 268 3-4 p. 306-310
5 p.
 article
17 Effect of antimony incorporation on structural properties of CuInS2 crystals Ben Rabeh, M.
 2010
 268 3-4 p. 273-276
4 p.
 article
18 Elastic behaviour of titanium dioxide films on polyimide substrates studied by in situ tensile testing in a X-ray diffractometer Bontempi, Elza
 2010
 268 3-4 p. 365-369
5 p.
 article
19 Elemental depth profiling of Cu(In,Ga)Se2 thin films by reference-free grazing incidence X-ray fluorescence analysis Streeck, C.
 2010
 268 3-4 p. 277-281
5 p.
 article
20 Erbium environment on Er-doped silica and alumino-silicate glass films: An EXAFS study Cattaruzza, E.
 2010
 268 3-4 p. 311-315
5 p.
 article
21 Experimental set-up for time resolved small angle X-ray scattering studies of nanoparticles formation using a free-jet micromixer Marmiroli, Benedetta
 2010
 268 3-4 p. 329-333
5 p.
 article
22 Fe distribution and speciation in human nails Katsikini, M.
 2010
 268 3-4 p. 420-424
5 p.
 article
23 GISAXS and GIWAXS analysis of amorphous–nanocrystalline silicon thin films Juraić, K.
 2010
 268 3-4 p. 259-262
4 p.
 article
24 GIXRF–NEXAFS investigations on buried ZnO/Si interfaces: A first insight in changes of chemical states due to annealing of the specimen Pagels, M.
 2010
 268 3-4 p. 370-373
4 p.
 article
25 In situ investigation of wet chemical processes for chalcopyrite solar cells by L-edge XAS under ambient conditions Greil, Stefanie M.
 2010
 268 3-4 p. 263-267
5 p.
 article
26 Investigation of InAs/GaSb-based superlattices by diffraction methods Ashuach, Y.
 2010
 268 3-4 p. 231-235
5 p.
 article
27 Investigation on a corrosion product deposit layer on a boiling water reactor fuel cladding Orlov, A.V.
 2010
 268 3-4 p. 297-305
9 p.
 article
28 Micro-XRF and micro-XAFS studies of an Al matrix Fe–Ni composite Pinakidou, F.
 2010
 268 3-4 p. 356-360
5 p.
 article
29 Monitoring the crystallization process of nano-confined organic molecules by synchrotron X-ray diffraction Milita, S.
 2010
 268 3-4 p. 411-413
3 p.
 article
30 Non-destructive analysis of micro texture and grain boundary character from X-ray diffraction contrast tomography King, A.
 2010
 268 3-4 p. 291-296
6 p.
 article
31 Observation of nano-indent induced strain fields and dislocation generation in silicon wafers using micro-Raman spectroscopy and white beam X-ray topography Allen, D.
 2010
 268 3-4 p. 383-387
5 p.
 article
32 On revealing the vertical structure of nanoparticle films with elemental resolution: A total external reflection X-ray standing waves study Zargham, Ardalan
 2010
 268 3-4 p. 325-328
4 p.
 article
33 Optical measurements of nanoporous anodic alumina formed on Si using novel X-ray spectroscopy set up CLASSIX Nasir, Mazhar E.
 2010
 268 3-4 p. 251-253
3 p.
 article
34 Planar irregularities of texture and stress field in Ti detected by X-ray diffraction technique Tarkowski, L.
 2010
 268 3-4 p. 352-355
4 p.
 article
35 Properties of InAs grown on misoriented GaAs substrates by atmospheric pressure metal–organic vapor phase epitaxy Ben Naceur, H.
 2010
 268 3-4 p. 236-240
5 p.
 article
36 Soft X-ray spectroscopy of oxide-embedded and functionalized silicon nanocrystals Kelly, Joel A.
 2010
 268 3-4 p. 246-250
5 p.
 article
37 Structural distortion of biogenic aragonite in strongly textured mollusc shell layers Chateigner, D.
 2010
 268 3-4 p. 341-345
5 p.
 article
38 Submicron beam X-ray diffraction of nanoheteroepitaxily grown GaN: Experimental challenges and calibration procedures Bonanno, P.L.
 2010
 268 3-4 p. 320-324
5 p.
 article
39 Synchrotron radiation photoionization mass spectrometry of laser ablated species Alvarez Ruiz, J.
 2010
 268 3-4 p. 425-429
5 p.
 article
40 Total pattern fitting for the combined size–strain–stress–texture determination in thin film diffraction Lutterotti, Luca
 2010
 268 3-4 p. 334-340
7 p.
 article
41 XBIC/μ-XRF/μ-XAS analysis of metals precipitation in block-cast solar silicon Trushin, M.
 2010
 268 3-4 p. 254-258
5 p.
 article
42 XPS characterization of different thermal treatments in the ITO–Si interface of a carbonate-textured monocrystalline silicon solar cell Montesdeoca-Santana, A.
 2010
 268 3-4 p. 374-378
5 p.
 article
43 X-ray and microstructural investigation of NiTiPt alloys homogenised at intermediate to high temperatures O’Donoghue, L.
 2010
 268 3-4 p. 287-290
4 p.
 article
44 X-ray microtomography analysis and Molecular Dynamics calculations to understand the dynamic damage process in metals Bontaz-Carion, J.
 2010
 268 3-4 p. 379-382
4 p.
 article
                             44 results found
 
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