| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Application of synchrotron X-ray radiography to the study of dendritic equiaxed microstructure formation in Al–Cu alloys
|
Bogno, A.
|
|
2010
|
268 |
3-4 |
p. 394-398
5 p.
|
artikel
|
| 2 |
A thin film approach to protein crystallography
|
Birkholz, M.
|
|
2010
|
268 |
3-4 |
p. 414-419
6 p.
|
artikel
|
| 3 |
Author Index
|
|
|
2010
|
268 |
3-4 |
p. I-VI
nvt p.
|
artikel
|
| 4 |
Combined Rietveld refinement of Zn2SiO4:Mn2+ using X-ray and neutron powder diffraction data
|
Kim, Yong-Il
|
|
2010
|
268 |
3-4 |
p. 346-351
6 p.
|
artikel
|
| 5 |
Comparative study of structural and morphological properties of CuIn3S5 and CuIn7S11 materials
|
Khemiri, N.
|
|
2010
|
268 |
3-4 |
p. 268-272
5 p.
|
artikel
|
| 6 |
Contents
|
|
|
2010
|
268 |
3-4 |
p. vii-viii
nvt p.
|
artikel
|
| 7 |
Core–shell nanowires: From the ensemble to single-wire characterization
|
Keplinger, Mario
|
|
2010
|
268 |
3-4 |
p. 316-319
4 p.
|
artikel
|
| 8 |
Depth-dependent magnetic characterization of Fe films on NiO(001)
|
Luches, P.
|
|
2010
|
268 |
3-4 |
p. 361-364
4 p.
|
artikel
|
| 9 |
Determination of global and local residual stresses in SOFC by X-ray diffraction
|
Villanova, Julie
|
|
2010
|
268 |
3-4 |
p. 282-286
5 p.
|
artikel
|
| 10 |
Determination of the local gold contact morphology on a photoactive polymer film using nanobeam GISAXS
|
Ruderer, M.A.
|
|
2010
|
268 |
3-4 |
p. 403-410
8 p.
|
artikel
|
| 11 |
Dislocation generation related to micro-cracks in Si wafers: High temperature in situ study with white beam X-ray topography
|
Danilewsky, A.
|
|
2010
|
268 |
3-4 |
p. 399-402
4 p.
|
artikel
|
| 12 |
Dose-dependent bonding environment of oxygen implanted in GaN
|
Katsikini, M.
|
|
2010
|
268 |
3-4 |
p. 241-245
5 p.
|
artikel
|
| 13 |
3D strain imaging in sub-micrometer crystals using cross-reciprocal space measurements: Numerical feasibility and experimental methodology
|
Vaxelaire, N.
|
|
2010
|
268 |
3-4 |
p. 388-393
6 p.
|
artikel
|
| 14 |
Editorial
|
Boscherini, Federico
|
|
2010
|
268 |
3-4 |
p. v-
1 p.
|
artikel
|
| 15 |
Editorial board
|
|
|
2010
|
268 |
3-4 |
p. IFC-
1 p.
|
artikel
|
| 16 |
Effect of aluminium addition on the structural properties of nanostructured Fe50Co50 alloy
|
Djebbari, C.
|
|
2010
|
268 |
3-4 |
p. 306-310
5 p.
|
artikel
|
| 17 |
Effect of antimony incorporation on structural properties of CuInS2 crystals
|
Ben Rabeh, M.
|
|
2010
|
268 |
3-4 |
p. 273-276
4 p.
|
artikel
|
| 18 |
Elastic behaviour of titanium dioxide films on polyimide substrates studied by in situ tensile testing in a X-ray diffractometer
|
Bontempi, Elza
|
|
2010
|
268 |
3-4 |
p. 365-369
5 p.
|
artikel
|
| 19 |
Elemental depth profiling of Cu(In,Ga)Se2 thin films by reference-free grazing incidence X-ray fluorescence analysis
|
Streeck, C.
|
|
2010
|
268 |
3-4 |
p. 277-281
5 p.
|
artikel
|
| 20 |
Erbium environment on Er-doped silica and alumino-silicate glass films: An EXAFS study
|
Cattaruzza, E.
|
|
2010
|
268 |
3-4 |
p. 311-315
5 p.
|
artikel
|
| 21 |
Experimental set-up for time resolved small angle X-ray scattering studies of nanoparticles formation using a free-jet micromixer
|
Marmiroli, Benedetta
|
|
2010
|
268 |
3-4 |
p. 329-333
5 p.
|
artikel
|
| 22 |
Fe distribution and speciation in human nails
|
Katsikini, M.
|
|
2010
|
268 |
3-4 |
p. 420-424
5 p.
|
artikel
|
| 23 |
GISAXS and GIWAXS analysis of amorphous–nanocrystalline silicon thin films
|
Juraić, K.
|
|
2010
|
268 |
3-4 |
p. 259-262
4 p.
|
artikel
|
| 24 |
GIXRF–NEXAFS investigations on buried ZnO/Si interfaces: A first insight in changes of chemical states due to annealing of the specimen
|
Pagels, M.
|
|
2010
|
268 |
3-4 |
p. 370-373
4 p.
|
artikel
|
| 25 |
In situ investigation of wet chemical processes for chalcopyrite solar cells by L-edge XAS under ambient conditions
|
Greil, Stefanie M.
|
|
2010
|
268 |
3-4 |
p. 263-267
5 p.
|
artikel
|
| 26 |
Investigation of InAs/GaSb-based superlattices by diffraction methods
|
Ashuach, Y.
|
|
2010
|
268 |
3-4 |
p. 231-235
5 p.
|
artikel
|
| 27 |
Investigation on a corrosion product deposit layer on a boiling water reactor fuel cladding
|
Orlov, A.V.
|
|
2010
|
268 |
3-4 |
p. 297-305
9 p.
|
artikel
|
| 28 |
Micro-XRF and micro-XAFS studies of an Al matrix Fe–Ni composite
|
Pinakidou, F.
|
|
2010
|
268 |
3-4 |
p. 356-360
5 p.
|
artikel
|
| 29 |
Monitoring the crystallization process of nano-confined organic molecules by synchrotron X-ray diffraction
|
Milita, S.
|
|
2010
|
268 |
3-4 |
p. 411-413
3 p.
|
artikel
|
| 30 |
Non-destructive analysis of micro texture and grain boundary character from X-ray diffraction contrast tomography
|
King, A.
|
|
2010
|
268 |
3-4 |
p. 291-296
6 p.
|
artikel
|
| 31 |
Observation of nano-indent induced strain fields and dislocation generation in silicon wafers using micro-Raman spectroscopy and white beam X-ray topography
|
Allen, D.
|
|
2010
|
268 |
3-4 |
p. 383-387
5 p.
|
artikel
|
| 32 |
On revealing the vertical structure of nanoparticle films with elemental resolution: A total external reflection X-ray standing waves study
|
Zargham, Ardalan
|
|
2010
|
268 |
3-4 |
p. 325-328
4 p.
|
artikel
|
| 33 |
Optical measurements of nanoporous anodic alumina formed on Si using novel X-ray spectroscopy set up CLASSIX
|
Nasir, Mazhar E.
|
|
2010
|
268 |
3-4 |
p. 251-253
3 p.
|
artikel
|
| 34 |
Planar irregularities of texture and stress field in Ti detected by X-ray diffraction technique
|
Tarkowski, L.
|
|
2010
|
268 |
3-4 |
p. 352-355
4 p.
|
artikel
|
| 35 |
Properties of InAs grown on misoriented GaAs substrates by atmospheric pressure metal–organic vapor phase epitaxy
|
Ben Naceur, H.
|
|
2010
|
268 |
3-4 |
p. 236-240
5 p.
|
artikel
|
| 36 |
Soft X-ray spectroscopy of oxide-embedded and functionalized silicon nanocrystals
|
Kelly, Joel A.
|
|
2010
|
268 |
3-4 |
p. 246-250
5 p.
|
artikel
|
| 37 |
Structural distortion of biogenic aragonite in strongly textured mollusc shell layers
|
Chateigner, D.
|
|
2010
|
268 |
3-4 |
p. 341-345
5 p.
|
artikel
|
| 38 |
Submicron beam X-ray diffraction of nanoheteroepitaxily grown GaN: Experimental challenges and calibration procedures
|
Bonanno, P.L.
|
|
2010
|
268 |
3-4 |
p. 320-324
5 p.
|
artikel
|
| 39 |
Synchrotron radiation photoionization mass spectrometry of laser ablated species
|
Alvarez Ruiz, J.
|
|
2010
|
268 |
3-4 |
p. 425-429
5 p.
|
artikel
|
| 40 |
Total pattern fitting for the combined size–strain–stress–texture determination in thin film diffraction
|
Lutterotti, Luca
|
|
2010
|
268 |
3-4 |
p. 334-340
7 p.
|
artikel
|
| 41 |
XBIC/μ-XRF/μ-XAS analysis of metals precipitation in block-cast solar silicon
|
Trushin, M.
|
|
2010
|
268 |
3-4 |
p. 254-258
5 p.
|
artikel
|
| 42 |
XPS characterization of different thermal treatments in the ITO–Si interface of a carbonate-textured monocrystalline silicon solar cell
|
Montesdeoca-Santana, A.
|
|
2010
|
268 |
3-4 |
p. 374-378
5 p.
|
artikel
|
| 43 |
X-ray and microstructural investigation of NiTiPt alloys homogenised at intermediate to high temperatures
|
O’Donoghue, L.
|
|
2010
|
268 |
3-4 |
p. 287-290
4 p.
|
artikel
|
| 44 |
X-ray microtomography analysis and Molecular Dynamics calculations to understand the dynamic damage process in metals
|
Bontaz-Carion, J.
|
|
2010
|
268 |
3-4 |
p. 379-382
4 p.
|
artikel
|
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