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                             39 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Accurate Monte Carlo simulation of fluorine and BF2 ion implantation into crystalline silicon Tian, Shiyang
 2004
 215 3-4 p. 403-412
10 p.
 artikel
2 Analysis of laterally non-uniform layers and sub-micron devices by Rutherford backscattering spectrometry Mangelinck, D.
 2004
 215 3-4 p. 495-500
6 p.
 artikel
3 An empirical expression to calculate thick target neutron yield distributions from proton induced reactions Maiti, Moumita
 2004
 215 3-4 p. 317-325
9 p.
 artikel
4 Anisotropic energies of sputtered atoms under oblique ion incidence Stepanova, M.
 2004
 215 3-4 p. 357-365
9 p.
 artikel
5 Applications of invariant embedding: positron backscattering from surfaces Glazov, Lev G.
 2004
 215 3-4 p. 509-524
16 p.
 artikel
6 A remote data acquisition and control system for Mössbauer spectroscopy Zhou, Qingguo
 2004
 215 3-4 p. 577-580
4 p.
 artikel
7 Author index 2004
 215 3-4 p. 586-593
8 p.
 artikel
8 Barium L subshells Coster–Kronig and fluorescence yields by the subshell selective photoionization method Barrea, Raúl A.
 2004
 215 3-4 p. 308-316
9 p.
 artikel
9 Calendar 2004
 215 3-4 p. 581-585
5 p.
 artikel
10 Determination of CR-39 detection efficiency for fast neutron registration and the absolute neutron dosimetry El-Sersy, A.R.
 2004
 215 3-4 p. 443-448
6 p.
 artikel
11 Direct reconstruction of the effective atomic number of materials by the method of multi-energy radiography Naydenov, Sergey V
 2004
 215 3-4 p. 552-560
9 p.
 artikel
12 Editorial board 2004
 215 3-4 p. IFC-
1 p.
 artikel
13 Effect of electron irradiation and heat treatment on the multi-step transformation in a Ni-rich near-equiatomic TiNi alloy Wang, Z.G.
 2004
 215 3-4 p. 436-442
7 p.
 artikel
14 Effect of self-ion bombardment on the corrosion behavior of zirconium Peng, D.Q.
 2004
 215 3-4 p. 394-402
9 p.
 artikel
15 Fabrication of optical waveguides in KTiOAsO4 by He or Si ion implantation Wang, Feng-Xiang
 2004
 215 3-4 p. 389-393
5 p.
 artikel
16 Fibroblasts adhesion on ion beam modified polyethylene Švorčı́k, V.
 2004
 215 3-4 p. 366-372
7 p.
 artikel
17 High-field conduction in high-density polyethylene thin films irradiated with electron beams Abdel-Hamid, H.M.
 2004
 215 3-4 p. 479-485
7 p.
 artikel
18 Ion-beam mixing at Ni/n-6H–SiC interface under irradiation by H+-ions Kozlovski, V.V.
 2004
 215 3-4 p. 385-388
4 p.
 artikel
19 Ion hammering of silica colloids Klaumünzer, S.
 2004
 215 3-4 p. 345-352
8 p.
 artikel
20 I–V and deep level transient spectroscopy studies on 60 MeV oxygen ion irradiated NPN transistors Gnana Prakash, A.P.
 2004
 215 3-4 p. 457-470
14 p.
 artikel
21 Measurement of xenon in uranium dioxide (UO2) with SIMS Desgranges, L
 2004
 215 3-4 p. 545-551
7 p.
 artikel
22 Micro-PIXE analysis of reference standards for the quantitative analysis of trace elements in individual raindrops Ma, C.-J.
 2004
 215 3-4 p. 501-508
8 p.
 artikel
23 Nucleation and growth of Ag clusters in silicate glasses under ion irradiation Pivin, J.C
 2004
 215 3-4 p. 373-384
12 p.
 artikel
24 On the authenticity of eight Reales 1730 Mexican silver coins by X-ray diffraction and by energy dispersion spectroscopy techniques Rojas-Rodriguez, I
 2004
 215 3-4 p. 537-544
8 p.
 artikel
25 Optogalvanic spectroscopy of silicon atoms Ueda, Yoshinori
 2004
 215 3-4 p. 419-422
4 p.
 artikel
26 Polarisation analysis of VUV synchrotron radiation emitted from a bending magnet source in the energy range 20–50 eV: A comparison between measurements and theoretical predictions Finetti, P.
 2004
 215 3-4 p. 565-576
12 p.
 artikel
27 Preferred crystal orientation of hafnium films prepared by ion beam assisted deposition Jiang, Bingyao
 2004
 215 3-4 p. 413-418
6 p.
 artikel
28 Proton irradiation experiments of optocouplers Ikezawa, Kazuhiro
 2004
 215 3-4 p. 449-456
8 p.
 artikel
29 Radical formation induced by γ radiation in poly(vinyl chloride) powder Costa, L.
 2004
 215 3-4 p. 471-478
8 p.
 artikel
30 Radiocarbon precision tests at the Lecce AMS facility using a sequential injection system Calcagnile, L.
 2004
 215 3-4 p. 561-564
4 p.
 artikel
31 Revisiting the stopping powers of Si and SiO2 for 4He ions: 0.5–2.0 MeV Lennard, W.N
 2004
 215 3-4 p. 297-307
11 p.
 artikel
32 Scaling properties in single collision model of light ion reflection Vukanić, J.
 2004
 215 3-4 p. 337-344
8 p.
 artikel
33 Sputter depth profiling of InN layers Kosiba, R
 2004
 215 3-4 p. 486-494
9 p.
 artikel
34 Subject index 2004
 215 3-4 p. 594-596
3 p.
 artikel
35 The influence of the ion–atom potential on molecular dynamics simulations of sputtering Shapiro, M.H
 2004
 215 3-4 p. 326-336
11 p.
 artikel
36 The production of nitrogen-13 by neutron capture in boron compounds Schleier-Smith, M.H
 2004
 215 3-4 p. 531-536
6 p.
 artikel
37 Thickness effect correction in XAFS-spectroscopy: Temperature measurement approach Voronina, E
 2004
 215 3-4 p. 525-530
6 p.
 artikel
38 Transmission of gamma rays through the curved single crystals of gadolinium–gallium garnet Khairulin, R.A.
 2004
 215 3-4 p. 353-356
4 p.
 artikel
39 Volatile evolution from polymer materials induced by irradiation with He++ ions and comparative pyrolysis experiments Murphy, J.J.
 2004
 215 3-4 p. 423-435
13 p.
 artikel
                             39 gevonden resultaten
 
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