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                             27 results found
no title author magazine year volume issue page(s) type
1 An algorithm for Monte Carlo simulation of coupled electron-photon transport Sempau, J.
1997
132 3 p. 377-390
14 p.
article
2 Analytical use of the multiple gamma-rays from the 12C(d,p)13C∗ nuclear reaction Papillon, F.
1997
132 3 p. 468-480
13 p.
article
3 A study of single crystal zirconia implanted with platinum ions Xie, Dong-zhu
1997
132 3 p. 425-429
5 p.
article
4 Beam bending using graded composition strained layers Breese, M.B.H.
1997
132 3 p. 540-547
8 p.
article
5 Calendar 1997
132 3 p. 549-550
2 p.
article
6 Characterization of alpha sources prepared by direct evaporation using Rutherford backscattering spectrometry Blanco Rodríguez, P.
1997
132 3 p. 501-506
6 p.
article
7 Correction and addendum to “The formation of clusters during large sputtering events” [Nucl. Instr. and Meth. B 124 (1997) 31] Hartman, John W.
1997
132 3 p. 406-408
3 p.
article
8 Deep light ion lithography in PMMA — A parameter study Schrempel, F.
1997
132 3 p. 430-438
9 p.
article
9 Defect levels of proton-irradiated silicon with a dose of 3.6 × 1013cm−2 Schmidt, D.C.
1997
132 3 p. 439-446
8 p.
article
10 Depth locating of elements by the PIXE technique Lagarde, Gérard
1997
132 3 p. 521-527
7 p.
article
11 Depth profiling of a single crystal of YBCO superconductor using micro-PIXE technique Ahmed, M.
1997
132 3 p. 507-512
6 p.
article
12 Determination of fluorine by low energy deuteron activation: Comparison with a prompt nuclear technique Sastri, Chaturvedula S.
1997
132 3 p. 513-520
8 p.
article
13 Electron impact ionization cross section of Ar+, Kr+, In+ and Ge+ Gao Haibin,
1997
132 3 p. 364-370
7 p.
article
14 Enhanced emission of secondary ions from solid surfaces bombarded with MeV polyatomic ions Tomaschko, Ch.
1997
132 3 p. 371-376
6 p.
article
15 Evidence of ionization annealing upon helium-ion irradiation of pre-damaged fluorapatite Ouchani, S.
1997
132 3 p. 447-451
5 p.
article
16 Fluorescence efficiencies of thin scintillating films in the extreme ultraviolet spectral region McKinsey, D.N.
1997
132 3 p. 351-358
8 p.
article
17 Focusing of hard X-rays with a W Si supermirror Høghøj, Peter
1997
132 3 p. 528-533
6 p.
article
18 On line measurements of proton flux by high energy backscattering spectroscopy Torrisi, L.
1997
132 3 p. 534-539
6 p.
article
19 Optical emissions from an aluminum surface by ion bombardment Ching Shuang Lee,
1997
132 3 p. 391-394
4 p.
article
20 PIXE and PESA aspects of the Guelph Visibility and Fine Particulate Monitoring Program Nejedlý, Z.
1997
132 3 p. 489-500
12 p.
article
21 PIXE and XRF comparison for applications to sediments analysis Benyaïch, F.
1997
132 3 p. 481-488
8 p.
article
22 Pre-equilibrium charge state distributions of Ni26+ (74 MeV/u) in carbon foils Rothard, H.
1997
132 3 p. 359-363
5 p.
article
23 Radiation induced recrystallisation and enhancement in photoluminescence from porous silicon Bhave, Tejashree M.
1997
132 3 p. 409-417
9 p.
article
24 Single aliquot dating of ceramics by green light stimulation of luminescence from quartz Liritzis, I.
1997
132 3 p. 457-467
11 p.
article
25 Target theory applied to swift heavy ions track grafting experiments Mazzei, Ruben
1997
132 3 p. 452-456
5 p.
article
26 The influence of inner-shell electron promotion on charge exchange processes in low energy ion scattering from surfaces Ting Li,
1997
132 3 p. 395-405
11 p.
article
27 Transmission electron microscopy investigation of the crystal-amorphous-polycrystal transition in silicon during bismuth room temperature ion implantation Fauré, J.
1997
132 3 p. 418-424
7 p.
article
                             27 results found
 
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