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                             18 results found
no title author magazine year volume issue page(s) type
1 Accurate low DOF modeling of a planar compliant mechanism with flexure hinges: the equivalent beam methodology Zettl, B.
2005
29 2 p. 237-245
9 p.
article
2 A lensed fiber workstation based on the elastic polishing plate method Lin, Samuel I-En
2005
29 2 p. 146-150
5 p.
article
3 A level-based optimization algorithm for complex part localization Chatelain, Jean-François
2005
29 2 p. 197-207
11 p.
article
4 A note on the three-point method for roundness measurement Muralikrishnan, B.
2005
29 2 p. 257-260
4 p.
article
5 A parametric study on oil/air lubrication of a high-speed spindle Wu, Cheng-Hsien
2005
29 2 p. 162-167
6 p.
article
6 A Robust Spline Filter on the basis of L2-norm Goto, T.
2005
29 2 p. 157-161
5 p.
article
7 Calendar 2005
29 2 p. 261-
1 p.
article
8 Design and development of a toroidal flexure for extended motion applications Cuttino, James F.
2005
29 2 p. 135-145
11 p.
article
9 Effects of working parameters on surface finish in ball-burnishing of hardened steels Luca, Liviu
2005
29 2 p. 253-256
4 p.
article
10 High precision chemical mechanical polishing of highly-boron-doped Si wafer used for epitaxial substrate Watanabe, J.
2005
29 2 p. 151-156
6 p.
article
11 Investigation on the traceability of three dimensional scanning electron microscope measurements based on the stereo-pair technique Bariani, P.
2005
29 2 p. 219-228
10 p.
article
12 Micro-burr formation and minimization through process control Lee, Kiha
2005
29 2 p. 246-252
7 p.
article
13 Miniaturization of a one-axis-controlled magnetic bearing Kuroki, Jiro
2005
29 2 p. 208-218
11 p.
article
14 Prelim 3 - Editorial board 2005
29 2 p. iii-
1 p.
article
15 Roundness modeling in BTA deep hole drilling Chin, Do Hun
2005
29 2 p. 176-188
13 p.
article
16 Traceable calibration of transfer standards for scanning probe microscopy Haycocks, J.
2005
29 2 p. 168-175
8 p.
article
17 Understanding simultaneous double-disk grinding: operation principle and material removal kinematics in silicon wafer planarization Pietsch, Georg J.
2005
29 2 p. 189-196
8 p.
article
18 Validation of a single fibre-fed heterodyne laser interferometer with nanometre uncertainty Knarren, B.A.W.H.
2005
29 2 p. 229-236
8 p.
article
                             18 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands