| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accurate low DOF modeling of a planar compliant mechanism with flexure hinges: the equivalent beam methodology
|
Zettl, B.
|
|
2005
|
29 |
2 |
p. 237-245
9 p.
|
artikel
|
| 2 |
A lensed fiber workstation based on the elastic polishing plate method
|
Lin, Samuel I-En
|
|
2005
|
29 |
2 |
p. 146-150
5 p.
|
artikel
|
| 3 |
A level-based optimization algorithm for complex part localization
|
Chatelain, Jean-François
|
|
2005
|
29 |
2 |
p. 197-207
11 p.
|
artikel
|
| 4 |
A note on the three-point method for roundness measurement
|
Muralikrishnan, B.
|
|
2005
|
29 |
2 |
p. 257-260
4 p.
|
artikel
|
| 5 |
A parametric study on oil/air lubrication of a high-speed spindle
|
Wu, Cheng-Hsien
|
|
2005
|
29 |
2 |
p. 162-167
6 p.
|
artikel
|
| 6 |
A Robust Spline Filter on the basis of L2-norm
|
Goto, T.
|
|
2005
|
29 |
2 |
p. 157-161
5 p.
|
artikel
|
| 7 |
Calendar
|
|
|
2005
|
29 |
2 |
p. 261-
1 p.
|
artikel
|
| 8 |
Design and development of a toroidal flexure for extended motion applications
|
Cuttino, James F.
|
|
2005
|
29 |
2 |
p. 135-145
11 p.
|
artikel
|
| 9 |
Effects of working parameters on surface finish in ball-burnishing of hardened steels
|
Luca, Liviu
|
|
2005
|
29 |
2 |
p. 253-256
4 p.
|
artikel
|
| 10 |
High precision chemical mechanical polishing of highly-boron-doped Si wafer used for epitaxial substrate
|
Watanabe, J.
|
|
2005
|
29 |
2 |
p. 151-156
6 p.
|
artikel
|
| 11 |
Investigation on the traceability of three dimensional scanning electron microscope measurements based on the stereo-pair technique
|
Bariani, P.
|
|
2005
|
29 |
2 |
p. 219-228
10 p.
|
artikel
|
| 12 |
Micro-burr formation and minimization through process control
|
Lee, Kiha
|
|
2005
|
29 |
2 |
p. 246-252
7 p.
|
artikel
|
| 13 |
Miniaturization of a one-axis-controlled magnetic bearing
|
Kuroki, Jiro
|
|
2005
|
29 |
2 |
p. 208-218
11 p.
|
artikel
|
| 14 |
Prelim 3 - Editorial board
|
|
|
2005
|
29 |
2 |
p. iii-
1 p.
|
artikel
|
| 15 |
Roundness modeling in BTA deep hole drilling
|
Chin, Do Hun
|
|
2005
|
29 |
2 |
p. 176-188
13 p.
|
artikel
|
| 16 |
Traceable calibration of transfer standards for scanning probe microscopy
|
Haycocks, J.
|
|
2005
|
29 |
2 |
p. 168-175
8 p.
|
artikel
|
| 17 |
Understanding simultaneous double-disk grinding: operation principle and material removal kinematics in silicon wafer planarization
|
Pietsch, Georg J.
|
|
2005
|
29 |
2 |
p. 189-196
8 p.
|
artikel
|
| 18 |
Validation of a single fibre-fed heterodyne laser interferometer with nanometre uncertainty
|
Knarren, B.A.W.H.
|
|
2005
|
29 |
2 |
p. 229-236
8 p.
|
artikel
|
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