| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Chemical characterization of plasma-polymerized hexamethyldisilazane by nuclear elastic recoil detection
|
Groleau, R.
|
|
1986
|
136 |
1 |
p. 85-92
8 p.
|
artikel
|
| 2 |
Chromium silicide formation under pulsed heat flow
|
D'Anna, E.
|
|
1986
|
136 |
1 |
p. 93-104
12 p.
|
artikel
|
| 3 |
Conductivity imaging of the erosion pattern for ZnO prepared by planar R.F. magnetron sputtering
|
Webb, James B.
|
|
1986
|
136 |
1 |
p. 135-139
5 p.
|
artikel
|
| 4 |
Density measurements of diamond-like coatings using a low energy accelerator
|
Anttila, A.
|
|
1986
|
136 |
1 |
p. 129-134
6 p.
|
artikel
|
| 5 |
Dielectric properties of fluorocarbon and chlorofluorocarbon films plasma polymerized in an R.F. glow discharge
|
Martinů, L.
|
|
1986
|
136 |
1 |
p. 11-19
9 p.
|
artikel
|
| 6 |
Editorial Board
|
|
|
1986
|
136 |
1 |
p. iii-
1 p.
|
artikel
|
| 7 |
Effect of a contact and protective seal on aluminum electromigration
|
Teal, V.
|
|
1986
|
136 |
1 |
p. 21-28
8 p.
|
artikel
|
| 8 |
Effects of ion irradiation on thermally formed silicides in the presence of interfacial oxide
|
Lien, C.-D.
|
|
1986
|
136 |
1 |
p. 69-76
8 p.
|
artikel
|
| 9 |
Electrochemical corrosion behaviour of ion-beam-mixed Fe-Al alloy: A conversion electron Mössbauer spectroscopic study
|
Kanetkar, S.M.
|
|
1986
|
136 |
1 |
p. 45-55
11 p.
|
artikel
|
| 10 |
Initial stages of the Pd-GaAs reaction: Formation and decomposition of ternary phases
|
Sands, T.
|
|
1986
|
136 |
1 |
p. 105-122
18 p.
|
artikel
|
| 11 |
Intermixing between germanium and silicon thin films in the presence of a fast interstitial diffuser
|
Pai, C.S.
|
|
1986
|
136 |
1 |
p. 37-43
7 p.
|
artikel
|
| 12 |
Non-linear optical wavelength conversion in Ti:LiNbO3 waveguides
|
Arvidsson, Gunnar
|
|
1986
|
136 |
1 |
p. 29-36
8 p.
|
artikel
|
| 13 |
On the evaluation of depth resolution from depth profiles of multilayers: Comment on “multiple point depth profiling of multilayer Cr-Ni thin film structures deposited on a rough substrate using scanning Auger microscopy”
|
Marton, D.
|
|
1986
|
136 |
1 |
p. L23-L26
nvt p.
|
artikel
|
| 14 |
Plasma etching of amorphous GeSx thin films
|
Ivanova, Z.G.
|
|
1986
|
136 |
1 |
p. 123-127
5 p.
|
artikel
|
| 15 |
Properties of silicon nitride films prepared by plasma-enhanced chemical vapour deposition of SiH4-N2 mixtures
|
Watanabe, Hideo
|
|
1986
|
136 |
1 |
p. 77-83
7 p.
|
artikel
|
| 16 |
Properties of ZnO films deposited onto InP by spray pyrolysis
|
Eberspacher, Chris
|
|
1986
|
136 |
1 |
p. 1-10
10 p.
|
artikel
|
| 17 |
Reply to “on the evaluation of depth resolution from depth profiles of multilayers: comment ‘multiple point depth profiling of multilayer Cr/Ni thin film structures deposited on a rough substrate using scanning Auger microscopy’”
|
Hofmann, S.
|
|
1986
|
136 |
1 |
p. L27-L29
nvt p.
|
artikel
|
| 18 |
Scratch adhesion test of reactively sputtered TiN coatings on a soft substrate
|
Je, J.H.
|
|
1986
|
136 |
1 |
p. 57-67
11 p.
|
artikel
|
| 19 |
The influence of control mechanism feedback parameters on the photoreactions of diacetylene monolayers
|
Veale, G.
|
|
1986
|
136 |
1 |
p. 141-145
5 p.
|
artikel
|
| 20 |
Titanium deposition onto ion-bombarded and plasma-treated polydimethylsiloxane: Surface modification, interface and adhesion
|
Bodö, P.
|
|
1986
|
136 |
1 |
p. 147-159
13 p.
|
artikel
|
Tijdschrift beschrijving