| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accurate 3D measurement system and calibration for speckle projection method
|
Zhu, Feipeng
|
|
2010
|
48 |
11 |
p. 1132-1139
8 p.
|
artikel
|
| 2 |
A new application of digital image processing to investigate thin compressed films: The measurement of buckling propagation
|
Wang, S.B.
|
|
2010
|
48 |
11 |
p. 1140-1144
5 p.
|
artikel
|
| 3 |
Deformation analysis of MEMS structures by modified digital moiré methods
|
Liu, Zhanwei
|
|
2010
|
48 |
11 |
p. 1067-1075
9 p.
|
artikel
|
| 4 |
Deformation measurement across crack using two-step extended digital image correlation method
|
Chen, Jinlong
|
|
2010
|
48 |
11 |
p. 1126-1131
6 p.
|
artikel
|
| 5 |
Editorial Board
|
|
|
2010
|
48 |
11 |
p. IFC-
1 p.
|
artikel
|
| 6 |
Fractionized calibration of the sample stage used in an AFM-probe mechanical testing system
|
Su, Dongchuan
|
|
2010
|
48 |
11 |
p. 1076-1081
6 p.
|
artikel
|
| 7 |
High-efficiency cell–substrate displacement acquisition via digital image correlation method using basis functions
|
Huang, Jianyong
|
|
2010
|
48 |
11 |
p. 1058-1066
9 p.
|
artikel
|
| 8 |
In situ investigation of ceramic sintering by synchrotron radiation X-ray computed tomography
|
Xu, Feng
|
|
2010
|
48 |
11 |
p. 1082-1088
7 p.
|
artikel
|
| 9 |
Micro and nano metrology in experimental mechanics
|
Kang, Yilan
|
|
2010
|
48 |
11 |
p. 1045-
1 p.
|
artikel
|
| 10 |
Micro-Raman spectroscopy stress measurement method for porous silicon film
|
Li, Qiu
|
|
2010
|
48 |
11 |
p. 1119-1125
7 p.
|
artikel
|
| 11 |
Nanoscale deformation analysis of a crack-tip in silicon by geometric phase analysis and numerical moiré method
|
Zhao, C.W.
|
|
2010
|
48 |
11 |
p. 1104-1107
4 p.
|
artikel
|
| 12 |
Recent applications of optical and computer-vision methods to research for microelectronics assembly reliability
|
Lu, Hua
|
|
2010
|
48 |
11 |
p. 1046-1057
12 p.
|
artikel
|
| 13 |
Residual stress assessment of interconnects by slot milling with FIB and geometric phase analysis
|
Wang, Qinghua
|
|
2010
|
48 |
11 |
p. 1113-1118
6 p.
|
artikel
|
| 14 |
Stress transfer in microdroplet tensile test: PVC-coated and uncoated Kevlar-29 single fiber
|
Zhenkun, Lei
|
|
2010
|
48 |
11 |
p. 1089-1095
7 p.
|
artikel
|
| 15 |
Subsurface defect of the SiO x film imaged by atomic force acoustic microscopy
|
Cunfu, He
|
|
2010
|
48 |
11 |
p. 1108-1112
5 p.
|
artikel
|
| 16 |
Three-dimensional shape measurement of micro-lens arrays using full-field swept-source optical coherence tomography
|
Anna, Tulsi
|
|
2010
|
48 |
11 |
p. 1145-1151
7 p.
|
artikel
|
| 17 |
Window size selection in windowed Fourier transform for phase retrieval
|
Yang, Chong
|
|
2010
|
48 |
11 |
p. 1096-1103
8 p.
|
artikel
|
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