nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
3D measurement of micromechanical devices vibration mode shapes with a stroboscopic interferometric microscope
|
Petitgrand, S. |
|
2001 |
36 |
2 |
p. 77-101 25 p. |
artikel |
2 |
3D micro-inspection goes DMD
|
Bitte, F. |
|
2001 |
36 |
2 |
p. 155-167 13 p. |
artikel |
3 |
MicroDAC strain measurement for electronics packaging structures
|
Vogel, D |
|
2001 |
36 |
2 |
p. 195-211 17 p. |
artikel |
4 |
Optical characterization methods for solid-state image sensors
|
Willemin, M. |
|
2001 |
36 |
2 |
p. 185-194 10 p. |
artikel |
5 |
Optical microsystems metrology
|
Osten, W. |
|
2001 |
36 |
2 |
p. 75-76 2 p. |
artikel |
6 |
Quantitative strain analysis of flip-chip electronic packages using phase-shifting moiré interferometry
|
Miller, Mikel R. |
|
2001 |
36 |
2 |
p. 127-139 13 p. |
artikel |
7 |
Testing micro devices with fringe projection and white-light interferometry
|
Windecker, Robert |
|
2001 |
36 |
2 |
p. 141-154 14 p. |
artikel |
8 |
The determination of material parameters of microcomponents using digital holography
|
Seebacher, S |
|
2001 |
36 |
2 |
p. 103-126 24 p. |
artikel |
9 |
The investigation of microsystems using Raman spectroscopy
|
De Wolf, Ingrid |
|
2001 |
36 |
2 |
p. 213-223 11 p. |
artikel |
10 |
The optical measurement station for complex testing of microelements
|
Sałbut, Leszek |
|
2001 |
36 |
2 |
p. 225-240 16 p. |
artikel |
11 |
Verification of 2-D MEMS model using optical profiling techniques
|
Hill, M. |
|
2001 |
36 |
2 |
p. 169-183 15 p. |
artikel |