| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
3D measurement of micromechanical devices vibration mode shapes with a stroboscopic interferometric microscope
|
Petitgrand, S.
|
|
2001
|
36 |
2 |
p. 77-101
25 p.
|
artikel
|
| 2 |
3D micro-inspection goes DMD
|
Bitte, F.
|
|
2001
|
36 |
2 |
p. 155-167
13 p.
|
artikel
|
| 3 |
MicroDAC strain measurement for electronics packaging structures
|
Vogel, D
|
|
2001
|
36 |
2 |
p. 195-211
17 p.
|
artikel
|
| 4 |
Optical characterization methods for solid-state image sensors
|
Willemin, M.
|
|
2001
|
36 |
2 |
p. 185-194
10 p.
|
artikel
|
| 5 |
Optical microsystems metrology
|
Osten, W.
|
|
2001
|
36 |
2 |
p. 75-76
2 p.
|
artikel
|
| 6 |
Quantitative strain analysis of flip-chip electronic packages using phase-shifting moiré interferometry
|
Miller, Mikel R.
|
|
2001
|
36 |
2 |
p. 127-139
13 p.
|
artikel
|
| 7 |
Testing micro devices with fringe projection and white-light interferometry
|
Windecker, Robert
|
|
2001
|
36 |
2 |
p. 141-154
14 p.
|
artikel
|
| 8 |
The determination of material parameters of microcomponents using digital holography
|
Seebacher, S
|
|
2001
|
36 |
2 |
p. 103-126
24 p.
|
artikel
|
| 9 |
The investigation of microsystems using Raman spectroscopy
|
De Wolf, Ingrid
|
|
2001
|
36 |
2 |
p. 213-223
11 p.
|
artikel
|
| 10 |
The optical measurement station for complex testing of microelements
|
Sałbut, Leszek
|
|
2001
|
36 |
2 |
p. 225-240
16 p.
|
artikel
|
| 11 |
Verification of 2-D MEMS model using optical profiling techniques
|
Hill, M.
|
|
2001
|
36 |
2 |
p. 169-183
15 p.
|
artikel
|
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