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Journal description
All volumes of the corresponding journal
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All articles of the corresponding issues
Details for article 6 of 11 found articles
| Title: |
Quantitative strain analysis of flip-chip electronic packages using phase-shifting moiré interferometry |
| Author: |
Miller, Mikel R. Mohammed, Ilyas Ho, Paul S. |
| Appeared in: |
Optics and lasers in engineering |
| Paging: | Volume 36 (2001) nr. 2 pages 13 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 11 found articles
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