| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
Analysis of the effects of reflectance and refraction generated by wafers made from fused silica, ALOxNy and TiSixNy under different light sources on pattern length and best focus
|
Kuo, Yang-Kuao
|
|
|
36 |
1 |
p. 35-39
|
article
|
| 2 |
An investigation on the relation between digital circuitry characteristics and power supply noise spectrum in mixed-signal CMOS integrated circuits
|
Méndez, Miguel A.
|
|
|
36 |
1 |
p. 77-84
|
article
|
| 3 |
A novel compact circuit for 4-PAM energy-efficient high speed interconnect data transmission and reception
|
Avci, Uygar
|
|
|
36 |
1 |
p. 67-75
|
article
|
| 4 |
Approximate process-parameter-dependent study of the logarithmic domain lossy integrator harmonic distortion levels
|
Drakakis, E.M.
|
|
|
36 |
1 |
p. 5-23
|
article
|
| 5 |
Corrigendum to: Design and analysis of planar printed microwave and PBG filters using an FDTD method
|
Tong, Ming-Sze
|
|
|
36 |
1 |
p. 97
|
article
|
| 6 |
Dependence of GaAs:Si persistent photoconductivity on temperature and α-particle irradiation
|
Zardas, G.E.
|
|
|
36 |
1 |
p. 1-4
|
article
|
| 7 |
Dielectric breakdown characteristics and interface trapping of hafnium oxide films
|
Zhan, N.
|
|
|
36 |
1 |
p. 29-33
|
article
|
| 8 |
Editorial board
|
|
|
|
36 |
1 |
p. i
|
article
|
| 9 |
Effects of extended dislocations on charge distribution in GaN epilayer
|
Choi, H.
|
|
|
36 |
1 |
p. 25-28
|
article
|
| 10 |
Electrical overstress due to ESD induced displacement currents
|
Kaschani, K.T.
|
|
|
36 |
1 |
p. 85-90
|
article
|
| 11 |
Electrical properties of vacuum annealed La2O3 thin films grown by E-beam evaporation
|
Kim, Yongshik
|
|
|
36 |
1 |
p. 41-49
|
article
|
| 12 |
Fabrication of 128×128 element optical switch array by micromachining technology
|
Wang, S.B.
|
|
|
36 |
1 |
p. 91-95
|
article
|
| 13 |
Fabrication of sharp silicon tips employing anisotropic wet etching and reactive ion etching
|
Alves, M.A.R.
|
|
|
36 |
1 |
p. 51-54
|
article
|
| 14 |
Full-band Monte Carlo simulation of thin InP p+–i–n+ diodes
|
You, A.H.
|
|
|
36 |
1 |
p. 61-65
|
article
|
| 15 |
Nanomechanical characterization of polymer using atomic force microscopy and nanoindentation
|
Fang, Te-Hua
|
|
|
36 |
1 |
p. 55-59
|
article
|
Journal description